Search Results for - Narrowed by: 2005 - Electronics.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dPUBDATE$002509Publication$002bDate$0025092005$0025092005$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026ps$003d300?2024-06-19T18:13:45ZElectronic Noise and Interfering Signals Principles and Applicationsent://SD_ILS/0/SD_ILS:5089012024-06-19T18:13:45Z2024-06-19T18:13:45Zby Vasilescu, Gabriel. author.<br/><a href="http://dx.doi.org/10.1007/b137720">http://dx.doi.org/10.1007/b137720</a><br/>Format: Electronic Resources<br/>Force Sensors for Microelectronic Packaging Applicationsent://SD_ILS/0/SD_ILS:5090482024-06-19T18:13:45Z2024-06-19T18:13:45Zby Schwizer, Jürg. author.<br/><a href="http://dx.doi.org/10.1007/b138345">http://dx.doi.org/10.1007/b138345</a><br/>Format: Electronic Resources<br/>Ferroelectric Thin Films Basic Properties and Device Physics for Memory Applicationsent://SD_ILS/0/SD_ILS:5099632024-06-19T18:13:45Z2024-06-19T18:13:45Zby Okuyama, Masanori. editor.<br/><a href="http://dx.doi.org/10.1007/b99517">http://dx.doi.org/10.1007/b99517</a><br/>Format: Electronic Resources<br/>Introducing Molecular Electronicsent://SD_ILS/0/SD_ILS:5099942024-06-19T18:13:45Z2024-06-19T18:13:45Zby Cuniberti, Gianaurelio. editor.<br/><a href="http://dx.doi.org/10.1007/b101525">http://dx.doi.org/10.1007/b101525</a><br/>Format: Electronic Resources<br/>CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanismsent://SD_ILS/0/SD_ILS:5092272024-06-19T18:13:45Z2024-06-19T18:13:45Zby Li, Flora M. author.<br/><a href="http://dx.doi.org/10.1007/b139047">http://dx.doi.org/10.1007/b139047</a><br/>Format: Electronic Resources<br/>Intense Electron and Ion Beamsent://SD_ILS/0/SD_ILS:5094972024-06-19T18:13:45Z2024-06-19T18:13:45Zby Molokovsky, Sergey Ivanovich. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28812-0">http://dx.doi.org/10.1007/3-540-28812-0</a><br/>Format: Electronic Resources<br/>Introduction to Advanced System-on-Chip Test Design and Optimizationent://SD_ILS/0/SD_ILS:5044222024-06-19T18:13:45Z2024-06-19T18:13:45Zby Larsson, Erik. author.<br/><a href="http://dx.doi.org/10.1007/b135763">http://dx.doi.org/10.1007/b135763</a><br/>Format: Electronic Resources<br/>Modeling and Simulation for RF System Designent://SD_ILS/0/SD_ILS:5046582024-06-19T18:13:45Z2024-06-19T18:13:45Zby Frevert, Ronny. author.<br/><a href="http://dx.doi.org/10.1007/0-387-27585-1">http://dx.doi.org/10.1007/0-387-27585-1</a><br/>Format: Electronic Resources<br/>Integrated Chemical Microsensor Systems in CMOS Technologyent://SD_ILS/0/SD_ILS:5092162024-06-19T18:13:45Z2024-06-19T18:13:45Zby Hierlemann, Andreas. author.<br/><a href="http://dx.doi.org/10.1007/b138987">http://dx.doi.org/10.1007/b138987</a><br/>Format: Electronic Resources<br/>System-level Test and Validation of Hardware/Software Systemsent://SD_ILS/0/SD_ILS:5084002024-06-19T18:13:45Z2024-06-19T18:13:45Zby Sonza Reorda, Matteo. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-145-8">http://dx.doi.org/10.1007/1-84628-145-8</a><br/>Format: Electronic Resources<br/>Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UKent://SD_ILS/0/SD_ILS:5102922024-06-19T18:13:45Z2024-06-19T18:13:45Zby Cullis, A. G. editor.<br/><a href="http://dx.doi.org/10.1007/3-540-31915-8">http://dx.doi.org/10.1007/3-540-31915-8</a><br/>Format: Electronic Resources<br/>Fault Diagnosis of Analog Integrated Circuitsent://SD_ILS/0/SD_ILS:5044342024-06-19T18:13:45Z2024-06-19T18:13:45Zby Kabisatpathy, Prithviraj. author.<br/><a href="http://dx.doi.org/10.1007/b135977">http://dx.doi.org/10.1007/b135977</a><br/>Format: Electronic Resources<br/>Multilayered Low Temperature Cofired Ceramics (LTCC) Technologyent://SD_ILS/0/SD_ILS:5041382024-06-19T18:13:45Z2024-06-19T18:13:45Zby Imanaka, Yoshihiko. author.<br/><a href="http://dx.doi.org/10.1007/b101196">http://dx.doi.org/10.1007/b101196</a><br/>Format: Electronic Resources<br/>CPU Design: Answers to Frequently Asked Questionsent://SD_ILS/0/SD_ILS:5042232024-06-19T18:13:45Z2024-06-19T18:13:45Zby Thimmannagari, Chandra M. R. author.<br/><a href="http://dx.doi.org/10.1007/b102502">http://dx.doi.org/10.1007/b102502</a><br/>Format: Electronic Resources<br/>Modern Techniques for Characterizing Magnetic Materialsent://SD_ILS/0/SD_ILS:5041642024-06-19T18:13:45Z2024-06-19T18:13:45Zby Zhu, Yimei. editor.<br/><a href="http://dx.doi.org/10.1007/b101202">http://dx.doi.org/10.1007/b101202</a><br/>Format: Electronic Resources<br/>Silicon Quantum Integrated Circuits Silicon-Germanium Heterostructure Devices: Basics and Realisationsent://SD_ILS/0/SD_ILS:5088582024-06-19T18:13:45Z2024-06-19T18:13:45Zby Kasper, Erich. author.<br/><a href="http://dx.doi.org/10.1007/b137494">http://dx.doi.org/10.1007/b137494</a><br/>Format: Electronic Resources<br/>The Quintessential PIC® Microcontrollerent://SD_ILS/0/SD_ILS:5084392024-06-19T18:13:45Z2024-06-19T18:13:45Zby Katzen, Sid. author.<br/><a href="http://dx.doi.org/10.1007/1-84628-202-0">http://dx.doi.org/10.1007/1-84628-202-0</a><br/>Format: Electronic Resources<br/>Scalable Infrastructure for Distributed Sensor Networksent://SD_ILS/0/SD_ILS:5084492024-06-19T18:13:45Z2024-06-19T18:13:45Zby Chakrabarty, Krishnendu. author.<br/><a href="http://dx.doi.org/10.1007/1-84628-213-6">http://dx.doi.org/10.1007/1-84628-213-6</a><br/>Format: Electronic Resources<br/>VLSI-Design of Non-Volatile Memoriesent://SD_ILS/0/SD_ILS:5088972024-06-19T18:13:45Z2024-06-19T18:13:45Zby Campardo, Giovanni. author.<br/><a href="http://dx.doi.org/10.1007/b137712">http://dx.doi.org/10.1007/b137712</a><br/>Format: Electronic Resources<br/>Mechatronic Systems Fundamentalsent://SD_ILS/0/SD_ILS:5084812024-06-19T18:13:45Z2024-06-19T18:13:45Zby Isermann, Rolf. author.<br/><a href="http://dx.doi.org/10.1007/1-84628-259-4">http://dx.doi.org/10.1007/1-84628-259-4</a><br/>Format: Electronic Resources<br/>Circuits, Signals, and Systems for Bioengineers : A MATLAB-Based Introduction.ent://SD_ILS/0/SD_ILS:11837592024-06-19T18:13:45Z2024-06-19T18:13:45Zby Semmlow, John.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=232141">Click to View</a><br/>Format: Electronic Resources<br/>Circuits, signals, and systems for bioengineers a MATLAB-based introductionent://SD_ILS/0/SD_ILS:648192024-06-19T18:13:45Z2024-06-19T18:13:45Zby Semmlow, John L.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120884933">An electronic book accessible through the World Wide Web; click for information</a>
Publisher description <a href="http://www.loc.gov/catdir/enhancements/fy0626/2005276723-d.html">http://www.loc.gov/catdir/enhancements/fy0626/2005276723-d.html</a>
Table of contents <a href="http://www.loc.gov/catdir/enhancements/fy0626/2005276723-t.html">http://www.loc.gov/catdir/enhancements/fy0626/2005276723-t.html</a><br/>Format: Electronic Resources<br/>Nanotechnology and Nanoelectronics Materials, Devices, Measurement Techniquesent://SD_ILS/0/SD_ILS:5089372024-06-19T18:13:45Z2024-06-19T18:13:45Zby Fahrner, W. R. editor.<br/><a href="http://dx.doi.org/10.1007/b137771">http://dx.doi.org/10.1007/b137771</a><br/>Format: Electronic Resources<br/>Shape and Functional Elements of the Bulk Silicon Microtechnique A Manual of Wet-Etched Silicon Structuresent://SD_ILS/0/SD_ILS:5090222024-06-19T18:13:45Z2024-06-19T18:13:45Zby Frühauf, Joachim. author.<br/><a href="http://dx.doi.org/10.1007/b138230">http://dx.doi.org/10.1007/b138230</a><br/>Format: Electronic Resources<br/>Materials for Information Technology Devices, Interconnects and Packagingent://SD_ILS/0/SD_ILS:5084652024-06-19T18:13:45Z2024-06-19T18:13:45Zby Zschech, Ehrenfried. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-235-7">http://dx.doi.org/10.1007/1-84628-235-7</a><br/>Format: Electronic Resources<br/>Circuits and Systems Based on Delta Modulation Linear, Nonlinear, and Mixed Mode Processingent://SD_ILS/0/SD_ILS:5091632024-06-19T18:13:45Z2024-06-19T18:13:45Zby Zrilic, Djuro G. author.<br/><a href="http://dx.doi.org/10.1007/b138813">http://dx.doi.org/10.1007/b138813</a><br/>Format: Electronic Resources<br/>New Algorithms, Architectures and Applications for Reconfigurable Computingent://SD_ILS/0/SD_ILS:5063662024-06-19T18:13:45Z2024-06-19T18:13:45Zby Lysaght, Patrick. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-3128-9">http://dx.doi.org/10.1007/1-4020-3128-9</a><br/>Format: Electronic Resources<br/>Design of Wireless Autonomous Datalogger IC’sent://SD_ILS/0/SD_ILS:5063932024-06-19T18:13:45Z2024-06-19T18:13:45Zby Claes, Wim. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-3209-9">http://dx.doi.org/10.1007/1-4020-3209-9</a><br/>Format: Electronic Resources<br/>Microscale Diagnostic Techniquesent://SD_ILS/0/SD_ILS:5088782024-06-19T18:13:45Z2024-06-19T18:13:45Zby Breuer, Kenneth S. editor.<br/><a href="http://dx.doi.org/10.1007/b137604">http://dx.doi.org/10.1007/b137604</a><br/>Format: Electronic Resources<br/>Advanced Microsystems for Automotive Applications 2005ent://SD_ILS/0/SD_ILS:5092372024-06-19T18:13:45Z2024-06-19T18:13:45Zby Valldorf, Jürgen. editor.<br/><a href="http://dx.doi.org/10.1007/b139105">http://dx.doi.org/10.1007/b139105</a><br/>Format: Electronic Resources<br/>Diffusion Processes in Advanced Technological Materialsent://SD_ILS/0/SD_ILS:5092392024-06-19T18:13:45Z2024-06-19T18:13:45Zby Gupta, Devendra. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-27470-4">http://dx.doi.org/10.1007/978-3-540-27470-4</a><br/>Format: Electronic Resources<br/>Model and Design of Bipolar and MOS Current-Mode Logic CML, ECL and SCL Digital Circuitsent://SD_ILS/0/SD_ILS:5062972024-06-19T18:13:45Z2024-06-19T18:13:45Zby Alioto, Massimo. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-2888-1">http://dx.doi.org/10.1007/1-4020-2888-1</a><br/>Format: Electronic Resources<br/>H∞-Control and Estimation of State-multiplicative Linear Systemsent://SD_ILS/0/SD_ILS:5085222024-06-19T18:13:45Z2024-06-19T18:13:45Zby Gershon, Eli. author.<br/><a href="http://dx.doi.org/10.1007/b103068">http://dx.doi.org/10.1007/b103068</a><br/>Format: Electronic Resources<br/>Electroceramic-Based MEMS Fabrication-Technology and Applicationsent://SD_ILS/0/SD_ILS:5041402024-06-19T18:13:45Z2024-06-19T18:13:45Zby Setter, Nava. editor.<br/><a href="http://dx.doi.org/10.1007/b101200">http://dx.doi.org/10.1007/b101200</a><br/>Format: Electronic Resources<br/>RF System Design of Transceivers for Wireless Communicationsent://SD_ILS/0/SD_ILS:5042742024-06-19T18:13:45Z2024-06-19T18:13:45Zby Gu, Qizheng. author.<br/><a href="http://dx.doi.org/10.1007/b104642">http://dx.doi.org/10.1007/b104642</a><br/>Format: Electronic Resources<br/>Statistical Analysis and Optimization for VLSI: Timing and Powerent://SD_ILS/0/SD_ILS:5045402024-06-19T18:13:45Z2024-06-19T18:13:45Zby Srivastava, Ashish. author.<br/><a href="http://dx.doi.org/10.1007/b137645">http://dx.doi.org/10.1007/b137645</a><br/>Format: Electronic Resources<br/>Dynamic Characterisation of Analogue-to-Digital Convertersent://SD_ILS/0/SD_ILS:5044652024-06-19T18:13:45Z2024-06-19T18:13:45Zby Dallet, Dominique. author.<br/><a href="http://dx.doi.org/10.1007/b136458">http://dx.doi.org/10.1007/b136458</a><br/>Format: Electronic Resources<br/>Microflows and Nanoflows Fundamentals and Simulationent://SD_ILS/0/SD_ILS:5048062024-06-19T18:13:45Z2024-06-19T18:13:45Zby Karniadakis, George. author.<br/><a href="http://dx.doi.org/10.1007/0-387-28676-4">http://dx.doi.org/10.1007/0-387-28676-4</a><br/>Format: Electronic Resources<br/>Microcontrollers in Practiceent://SD_ILS/0/SD_ILS:5094082024-06-19T18:13:45Z2024-06-19T18:13:45Zby Mitescu, Marian. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28308-0">http://dx.doi.org/10.1007/3-540-28308-0</a><br/>Format: Electronic Resources<br/>Ambient Intelligenceent://SD_ILS/0/SD_ILS:5091282024-06-19T18:13:45Z2024-06-19T18:13:45Zby Weber, Werner. editor.<br/><a href="http://dx.doi.org/10.1007/b138670">http://dx.doi.org/10.1007/b138670</a><br/>Format: Electronic Resources<br/>Nanotribology and Nanomechanics An Introductionent://SD_ILS/0/SD_ILS:5093982024-06-19T18:13:45Z2024-06-19T18:13:45Zby Bhushan, Bharat. editor.<br/><a href="http://dx.doi.org/10.1007/3-540-28248-3">http://dx.doi.org/10.1007/3-540-28248-3</a><br/>Format: Electronic Resources<br/>Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Kiev, Ukraine 26–30 April 2004ent://SD_ILS/0/SD_ILS:5063222024-06-19T18:13:45Z2024-06-19T18:13:45Zby Flandre, Denis. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-3013-4">http://dx.doi.org/10.1007/1-4020-3013-4</a><br/>Format: Electronic Resources<br/>Taxonomies for the Development and Verification of Digital Systemsent://SD_ILS/0/SD_ILS:5042532024-06-19T18:13:45Z2024-06-19T18:13:45Zby Bailey, Brian. editor.<br/><a href="http://dx.doi.org/10.1007/b104217">http://dx.doi.org/10.1007/b104217</a><br/>Format: Electronic Resources<br/>Data Mining and Diagnosing IC Failsent://SD_ILS/0/SD_ILS:5045272024-06-19T18:13:45Z2024-06-19T18:13:45Zby Huisman, Leendert M. author.<br/><a href="http://dx.doi.org/10.1007/b137446">http://dx.doi.org/10.1007/b137446</a><br/>Format: Electronic Resources<br/>Transient Analysis of Electric Power Circuits Handbookent://SD_ILS/0/SD_ILS:5048222024-06-19T18:13:45Z2024-06-19T18:13:45Zby Shenkman, Arieh L. author.<br/><a href="http://dx.doi.org/10.1007/0-387-28799-X">http://dx.doi.org/10.1007/0-387-28799-X</a><br/>Format: Electronic Resources<br/>Matching Properties of Deep Sub-Micron MOS Transistorsent://SD_ILS/0/SD_ILS:5042992024-06-19T18:13:45Z2024-06-19T18:13:45Zby Croon, Jeroen A. author.<br/><a href="http://dx.doi.org/10.1007/b105122">http://dx.doi.org/10.1007/b105122</a><br/>Format: Electronic Resources<br/>Advanced BDD Optimizationent://SD_ILS/0/SD_ILS:5043972024-06-19T18:13:45Z2024-06-19T18:13:45Zby Ebendt, Rüdiger. author.<br/><a href="http://dx.doi.org/10.1007/b107399">http://dx.doi.org/10.1007/b107399</a><br/>Format: Electronic Resources<br/>Systematic Modeling and Analysis of Telecom Frontends and Their Building Blocksent://SD_ILS/0/SD_ILS:5063802024-06-19T18:13:45Z2024-06-19T18:13:45Zby Vanassche, Piet. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-3174-2">http://dx.doi.org/10.1007/1-4020-3174-2</a><br/>Format: Electronic Resources<br/>Wideband Low Noise Amplifiers Exploiting Thermal Noise Cancellationent://SD_ILS/0/SD_ILS:5063842024-06-19T18:13:45Z2024-06-19T18:13:45Zby Bruccoleri, Federico. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-3188-2">http://dx.doi.org/10.1007/1-4020-3188-2</a><br/>Format: Electronic Resources<br/>LNA-ESD Co-Design for Fully Integrated CMOS Wireless Receiversent://SD_ILS/0/SD_ILS:5063852024-06-19T18:13:45Z2024-06-19T18:13:45Zby Leroux, Paul. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-3191-2">http://dx.doi.org/10.1007/1-4020-3191-2</a><br/>Format: Electronic Resources<br/>Digital Synthesizers and Transmitters for Software Radioent://SD_ILS/0/SD_ILS:5063862024-06-19T18:13:45Z2024-06-19T18:13:45Zby Vankka, Jouko. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-3195-5">http://dx.doi.org/10.1007/1-4020-3195-5</a><br/>Format: Electronic Resources<br/>Transaction Level Modeling with SystemC TLM Concepts and Applications for Embedded Systemsent://SD_ILS/0/SD_ILS:5045032024-06-19T18:13:45Z2024-06-19T18:13:45Zby Ghenassia, Frank. editor.<br/><a href="http://dx.doi.org/10.1007/b137175">http://dx.doi.org/10.1007/b137175</a><br/>Format: Electronic Resources<br/>Thin Films and Heterostructures for Oxide Electronicsent://SD_ILS/0/SD_ILS:5044812024-06-19T18:13:45Z2024-06-19T18:13:45Zby Ogale, Satischandra B. author.<br/><a href="http://dx.doi.org/10.1007/b136780">http://dx.doi.org/10.1007/b136780</a><br/>Format: Electronic Resources<br/>System Level Design of Reconfigurable Systems-on-Chipent://SD_ILS/0/SD_ILS:5044832024-06-19T18:13:45Z2024-06-19T18:13:45Zby Voros, Nikolaos S. editor.<br/><a href="http://dx.doi.org/10.1007/b136832">http://dx.doi.org/10.1007/b136832</a><br/>Format: Electronic Resources<br/>Advances in Design and Specification Languages for SoCs Selected Contributions from FDL’04ent://SD_ILS/0/SD_ILS:5044942024-06-19T18:13:45Z2024-06-19T18:13:45Zby Boulet, Pierre. editor.<br/><a href="http://dx.doi.org/10.1007/b136935">http://dx.doi.org/10.1007/b136935</a><br/>Format: Electronic Resources<br/>A Practical Guide for SystemVerilog Assertionsent://SD_ILS/0/SD_ILS:5044982024-06-19T18:13:45Z2024-06-19T18:13:45Zby Vijayaraghavan, Srikanth. author.<br/><a href="http://dx.doi.org/10.1007/b137011">http://dx.doi.org/10.1007/b137011</a><br/>Format: Electronic Resources<br/>Make : Technology on Your Time Volume 04ent://SD_ILS/0/SD_ILS:23231182024-06-19T18:13:45Z2024-06-19T18:13:45Zby Frauenfelder, Mark, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781680456042/?ar">https://go.oreilly.com/library-access/library/view/-/9781680456042/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781680456042/?ar">https://learning.oreilly.com/library/view/~/9781680456042/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781680456042">https://learning.oreilly.com/library/view/~/9781680456042</a><br/>Format: Electronic Resources<br/>