Search Results for - Narrowed by: 2007 - Engineering.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dPUBDATE$002509Publication$002bDate$0025092007$0025092007$0026qf$003dSUBJECT$002509Subject$002509Engineering.$002509Engineering.$0026ps$003d300$0026isd$003dtrue?2024-06-18T18:29:45ZComputer-Based Design and Manufacturing An Information-Based Approachent://SD_ILS/0/SD_ILS:5041432024-06-18T18:29:45Z2024-06-18T18:29:45Zby Nasr, Emad Abouel. author.<br/><a href="http://dx.doi.org/10.1007/b101244">http://dx.doi.org/10.1007/b101244</a><br/>Format: Electronic Resources<br/>Industrial Robots Programming Building Applications for the Factories of the Futureent://SD_ILS/0/SD_ILS:5041442024-06-18T18:29:45Z2024-06-18T18:29:45Zby Pires, J. Norberto. author.<br/><a href="http://dx.doi.org/10.1007/b101252">http://dx.doi.org/10.1007/b101252</a><br/>Format: Electronic Resources<br/>Ultrasonic Nondestructive Evaluation Systems Models and Measurementsent://SD_ILS/0/SD_ILS:5057122024-06-18T18:29:45Z2024-06-18T18:29:45Zby Schmerr, Lester W. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-49063-2">http://dx.doi.org/10.1007/978-0-387-49063-2</a><br/>Format: Electronic Resources<br/>CDMA Radio with Repeatersent://SD_ILS/0/SD_ILS:5057132024-06-18T18:29:45Z2024-06-18T18:29:45Zby Shapira, Joseph. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-49064-9">http://dx.doi.org/10.1007/978-0-387-49064-9</a><br/>Format: Electronic Resources<br/>Ultra-Low Power Wireless Technologies for Sensor Networksent://SD_ILS/0/SD_ILS:5057192024-06-18T18:29:45Z2024-06-18T18:29:45Zby Otis, Brian. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-49313-8">http://dx.doi.org/10.1007/978-0-387-49313-8</a><br/>Format: Electronic Resources<br/>Micromehcanics of Heterogenous Materialsent://SD_ILS/0/SD_ILS:5058102024-06-18T18:29:45Z2024-06-18T18:29:45Zby Buryachenko, Valeriy A. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68485-7">http://dx.doi.org/10.1007/978-0-387-68485-7</a><br/>Format: Electronic Resources<br/>Residual Stress Measurement and the Slitting Methodent://SD_ILS/0/SD_ILS:5055342024-06-18T18:29:45Z2024-06-18T18:29:45Zby Cheng, Weili. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-39030-7">http://dx.doi.org/10.1007/978-0-387-39030-7</a><br/>Format: Electronic Resources<br/>Vorticity, Statistical Mechanics, and Monte Carlo Simulationent://SD_ILS/0/SD_ILS:5057302024-06-18T18:29:45Z2024-06-18T18:29:45Zby Lim, Chjan. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-49431-9">http://dx.doi.org/10.1007/978-0-387-49431-9</a><br/>Format: Electronic Resources<br/>Adaptive Nonlinear System Identification The Volterra and Wiener Model Approachesent://SD_ILS/0/SD_ILS:5058202024-06-18T18:29:45Z2024-06-18T18:29:45Zby Ogunfunmi, Tokunbo. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68630-1">http://dx.doi.org/10.1007/978-0-387-68630-1</a><br/>Format: Electronic Resources<br/>Ordinal Optimization Soft Optimization for Hard Problemsent://SD_ILS/0/SD_ILS:5058212024-06-18T18:29:45Z2024-06-18T18:29:45Zby Ho, Yu-Chi. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68692-9">http://dx.doi.org/10.1007/978-0-387-68692-9</a><br/>Format: Electronic Resources<br/>Modern Circuit Placement Best Practices and Resultsent://SD_ILS/0/SD_ILS:5058252024-06-18T18:29:45Z2024-06-18T18:29:45Zby Nam, Gi-Joon. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68739-1">http://dx.doi.org/10.1007/978-0-387-68739-1</a><br/>Format: Electronic Resources<br/>Digital Satellite Communicationsent://SD_ILS/0/SD_ILS:5053302024-06-18T18:29:45Z2024-06-18T18:29:45Zby Corazza, Giovanni. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-34649-6">http://dx.doi.org/10.1007/978-0-387-34649-6</a><br/>Format: Electronic Resources<br/>Closing the Power Gap Between ASIC & Custom Tools and Techniques for Low Power Designent://SD_ILS/0/SD_ILS:5058472024-06-18T18:29:45Z2024-06-18T18:29:45Zby Chinnery, David. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68953-1">http://dx.doi.org/10.1007/978-0-387-68953-1</a><br/>Format: Electronic Resources<br/>Tissue Engineeringent://SD_ILS/0/SD_ILS:5052782024-06-18T18:29:45Z2024-06-18T18:29:45Zby Fisher, John P. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-34133-0">http://dx.doi.org/10.1007/978-0-387-34133-0</a><br/>Format: Electronic Resources<br/>Computational Neurogenetic Modelingent://SD_ILS/0/SD_ILS:5056702024-06-18T18:29:45Z2024-06-18T18:29:45Zby Benuskova, Lubica. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-48355-9">http://dx.doi.org/10.1007/978-0-387-48355-9</a><br/>Format: Electronic Resources<br/>Analog Circuit Design Techniques at 0.5 Vent://SD_ILS/0/SD_ILS:5059002024-06-18T18:29:45Z2024-06-18T18:29:45Zby Chatterjee, Shouri. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-69954-7">http://dx.doi.org/10.1007/978-0-387-69954-7</a><br/>Format: Electronic Resources<br/>Compiling Esterelent://SD_ILS/0/SD_ILS:5059012024-06-18T18:29:45Z2024-06-18T18:29:45Zby Potop-Butucaru, Dumitru. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-70628-3">http://dx.doi.org/10.1007/978-0-387-70628-3</a><br/>Format: Electronic Resources<br/>Artificial Gravityent://SD_ILS/0/SD_ILS:5059042024-06-18T18:29:45Z2024-06-18T18:29:45Zby Clément, Gilles. editor.<br/><a href="http://dx.doi.org/10.1007/0-387-70714-X">http://dx.doi.org/10.1007/0-387-70714-X</a><br/>Format: Electronic Resources<br/>LMI Approach to Analysis and Control of Takagi-Sugeno Fuzzy Systems with Time Delayent://SD_ILS/0/SD_ILS:5119762024-06-18T18:29:45Z2024-06-18T18:29:45Zby Lin, Chong. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-49554-3">http://dx.doi.org/10.1007/978-3-540-49554-3</a><br/>Format: Electronic Resources<br/>Applications of Time Delay Systemsent://SD_ILS/0/SD_ILS:5119772024-06-18T18:29:45Z2024-06-18T18:29:45Zby Chiasson, John. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-49556-7">http://dx.doi.org/10.1007/978-3-540-49556-7</a><br/>Format: Electronic Resources<br/>Advances in Medical Engineeringent://SD_ILS/0/SD_ILS:5121012024-06-18T18:29:45Z2024-06-18T18:29:45Zby Buzug, Thorsten M. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-68764-1">http://dx.doi.org/10.1007/978-3-540-68764-1</a><br/>Format: Electronic Resources<br/>Fuel Oxygenatesent://SD_ILS/0/SD_ILS:5125092024-06-18T18:29:45Z2024-06-18T18:29:45Zby Barceló, Damià. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-72641-8">http://dx.doi.org/10.1007/978-3-540-72641-8</a><br/>Format: Electronic Resources<br/>Advanced Microsystems for Automotive Applications 2007ent://SD_ILS/0/SD_ILS:5123212024-06-18T18:29:45Z2024-06-18T18:29:45Zby Valldorf, Jürgen. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-71325-8">http://dx.doi.org/10.1007/978-3-540-71325-8</a><br/>Format: Electronic Resources<br/>Nonlinear Dynamics of Chaotic and Stochastic Systems Tutorial and Modern Developmentsent://SD_ILS/0/SD_ILS:5115912024-06-18T18:29:45Z2024-06-18T18:29:45Zby Anishchenko, Vadim S. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-38168-6">http://dx.doi.org/10.1007/978-3-540-38168-6</a><br/>Format: Electronic Resources<br/>Understanding Autonomous Cooperation and Control in Logistics The Impact of Autonomy on Management, Information, Communication and Material Flowent://SD_ILS/0/SD_ILS:5118392024-06-18T18:29:45Z2024-06-18T18:29:45Zby Hülsmann, Michael. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-47450-0">http://dx.doi.org/10.1007/978-3-540-47450-0</a><br/>Format: Electronic Resources<br/>Artificial Intelligence in Recognition and Classification of Astrophysical and Medical Imagesent://SD_ILS/0/SD_ILS:5118412024-06-18T18:29:45Z2024-06-18T18:29:45Zby Zharkova, Valentina. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-47518-7">http://dx.doi.org/10.1007/978-3-540-47518-7</a><br/>Format: Electronic Resources<br/>Advanced Computational Intelligence Paradigms in Healthcare – 1ent://SD_ILS/0/SD_ILS:5118422024-06-18T18:29:45Z2024-06-18T18:29:45Zby Yoshida, Hiro. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-47527-9">http://dx.doi.org/10.1007/978-3-540-47527-9</a><br/>Format: Electronic Resources<br/>Boundary Element Analysis Mathematical Aspects and Applicationsent://SD_ILS/0/SD_ILS:5118432024-06-18T18:29:45Z2024-06-18T18:29:45Zby Schanz, Martin. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-47533-0">http://dx.doi.org/10.1007/978-3-540-47533-0</a><br/>Format: Electronic Resources<br/>Econophysics of Markets and Business Networks Proceedings of the Econophys-Kolkata IIIent://SD_ILS/0/SD_ILS:5136472024-06-18T18:29:45Z2024-06-18T18:29:45Zby Chatterjee, Arnab. editor.<br/><a href="http://dx.doi.org/10.1007/978-88-470-0665-2">http://dx.doi.org/10.1007/978-88-470-0665-2</a><br/>Format: Electronic Resources<br/>Neuroeconomia, Neuromarketing e Processi Decisionali Le evidenze di un test di memorizzazione condotto per la prima volta in Italiaent://SD_ILS/0/SD_ILS:5136572024-06-18T18:29:45Z2024-06-18T18:29:45Zby Babiloni, Fabio. author.<br/><a href="http://dx.doi.org/10.1007/978-88-470-0716-1">http://dx.doi.org/10.1007/978-88-470-0716-1</a><br/>Format: Electronic Resources<br/>BioMEMS and Biomedical Nanotechnology Volume II: Micro/Nano Technologies for Genomics and Proteomicsent://SD_ILS/0/SD_ILS:5044522024-06-18T18:29:45Z2024-06-18T18:29:45Zby Ferrari, Mauro. editor.<br/><a href="http://dx.doi.org/10.1007/b136238">http://dx.doi.org/10.1007/b136238</a><br/>Format: Electronic Resources<br/>BioMEMS and Biomedical Nanotechnology Volume III Therapeutic Micro/Nanotechnologyent://SD_ILS/0/SD_ILS:5044532024-06-18T18:29:45Z2024-06-18T18:29:45Zby Ferrari, Mauro. editor.<br/><a href="http://dx.doi.org/10.1007/b136240">http://dx.doi.org/10.1007/b136240</a><br/>Format: Electronic Resources<br/>BioMEMS and Biomedical Nanotechnology Volume IV: Biomolecular Sensing, Processing and Analysisent://SD_ILS/0/SD_ILS:5044542024-06-18T18:29:45Z2024-06-18T18:29:45Zby Ferrari, Mauro. editor.<br/><a href="http://dx.doi.org/10.1007/b136241">http://dx.doi.org/10.1007/b136241</a><br/>Format: Electronic Resources<br/>Data Convertersent://SD_ILS/0/SD_ILS:5051252024-06-18T18:29:45Z2024-06-18T18:29:45Zby Maloberti, Franco. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-32486-9">http://dx.doi.org/10.1007/978-0-387-32486-9</a><br/>Format: Electronic Resources<br/>Life Distributions Structure of Nonparametric, Semiparametric, and Parametric Familiesent://SD_ILS/0/SD_ILS:5058082024-06-18T18:29:45Z2024-06-18T18:29:45Zby Marshall, Albert W. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68477-2">http://dx.doi.org/10.1007/978-0-387-68477-2</a><br/>Format: Electronic Resources<br/>Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Editionent://SD_ILS/0/SD_ILS:5056272024-06-18T18:29:45Z2024-06-18T18:29:45Zby Sachdev, Manoj. editor.<br/><a href="http://dx.doi.org/10.1007/0-387-46547-2">http://dx.doi.org/10.1007/0-387-46547-2</a><br/>Format: Electronic Resources<br/>Cognitive Wireless Communication Networksent://SD_ILS/0/SD_ILS:5058312024-06-18T18:29:45Z2024-06-18T18:29:45Zby Hossain, Ekram. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68832-9">http://dx.doi.org/10.1007/978-0-387-68832-9</a><br/>Format: Electronic Resources<br/>Optical Scanning Holography with MATLAB®ent://SD_ILS/0/SD_ILS:5058332024-06-18T18:29:45Z2024-06-18T18:29:45Zby Poon, Ting-Chung. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68851-0">http://dx.doi.org/10.1007/978-0-387-68851-0</a><br/>Format: Electronic Resources<br/>Ultra-Low Voltage Nano-Scale Memoriesent://SD_ILS/0/SD_ILS:5058352024-06-18T18:29:45Z2024-06-18T18:29:45Zby Itoh, Kiyoo. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68853-4">http://dx.doi.org/10.1007/978-0-387-68853-4</a><br/>Format: Electronic Resources<br/>Mobile and Wireless Network Security and Privacyent://SD_ILS/0/SD_ILS:5059302024-06-18T18:29:45Z2024-06-18T18:29:45Zby Makki, S. Kami. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-71058-7">http://dx.doi.org/10.1007/978-0-387-71058-7</a><br/>Format: Electronic Resources<br/>Integrated Circuit Packaging, Assembly and Interconnectionsent://SD_ILS/0/SD_ILS:5052562024-06-18T18:29:45Z2024-06-18T18:29:45Zby Greig, William J. author.<br/><a href="http://dx.doi.org/10.1007/0-387-33913-2">http://dx.doi.org/10.1007/0-387-33913-2</a><br/>Format: Electronic Resources<br/>Quality of Service in Optical Burst Switched Networksent://SD_ILS/0/SD_ILS:5056452024-06-18T18:29:45Z2024-06-18T18:29:45Zby Chua, Kee Chiang. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-47647-6">http://dx.doi.org/10.1007/978-0-387-47647-6</a><br/>Format: Electronic Resources<br/>The Fast Solution of Boundary Integral Equationsent://SD_ILS/0/SD_ILS:5052672024-06-18T18:29:45Z2024-06-18T18:29:45Zby Rjasanow, Sergej. author.<br/><a href="http://dx.doi.org/10.1007/0-387-34042-4">http://dx.doi.org/10.1007/0-387-34042-4</a><br/>Format: Electronic Resources<br/>Computational Techniques for Voltage Stability Assessment and Controlent://SD_ILS/0/SD_ILS:5051602024-06-18T18:29:45Z2024-06-18T18:29:45Zby Ajjarapu, Venkataramana. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-32935-2">http://dx.doi.org/10.1007/978-0-387-32935-2</a><br/>Format: Electronic Resources<br/>Three-Phase Diode Bridge Rectifier With Low Harmonics Current Injection Methodsent://SD_ILS/0/SD_ILS:5051612024-06-18T18:29:45Z2024-06-18T18:29:45Zby Pejovic, Predrag. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-32936-9">http://dx.doi.org/10.1007/978-0-387-32936-9</a><br/>Format: Electronic Resources<br/>Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packagingent://SD_ILS/0/SD_ILS:5051722024-06-18T18:29:45Z2024-06-18T18:29:45Zby Suhir, E. editor.<br/><a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Electronic Resources<br/>Wireless Network Securityent://SD_ILS/0/SD_ILS:5051842024-06-18T18:29:45Z2024-06-18T18:29:45Zby Xiao, Yang. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-33112-6">http://dx.doi.org/10.1007/978-0-387-33112-6</a><br/>Format: Electronic Resources<br/>Filtering Theory With Applications to Fault Detection, Isolation, and Estimationent://SD_ILS/0/SD_ILS:5061612024-06-18T18:29:45Z2024-06-18T18:29:45Zby Saberi, Ali. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-8176-4564-9">http://dx.doi.org/10.1007/978-0-8176-4564-9</a><br/>Format: Electronic Resources<br/>Algebra and Analysis for Engineers and Scientistsent://SD_ILS/0/SD_ILS:5061792024-06-18T18:29:45Z2024-06-18T18:29:45Zby Michel, Anthony N. author.<br/><a href="http://dx.doi.org/10.1007/978-0-8176-4707-0">http://dx.doi.org/10.1007/978-0-8176-4707-0</a><br/>Format: Electronic Resources<br/>Model Predictive controlent://SD_ILS/0/SD_ILS:5061812024-06-18T18:29:45Z2024-06-18T18:29:45Zby Camacho, E. F. author.<br/><a href="http://dx.doi.org/10.1007/978-0-85729-398-5">http://dx.doi.org/10.1007/978-0-85729-398-5</a><br/>Format: Electronic Resources<br/>Algebraic Methods for Nonlinear Control Systemsent://SD_ILS/0/SD_ILS:5085922024-06-18T18:29:45Z2024-06-18T18:29:45Zby Conte, Giuseppe. author.<br/><a href="http://dx.doi.org/10.1007/978-1-84628-595-0">http://dx.doi.org/10.1007/978-1-84628-595-0</a><br/>Format: Electronic Resources<br/>Charging the Internal Combustion Engineent://SD_ILS/0/SD_ILS:5087882024-06-18T18:29:45Z2024-06-18T18:29:45Zby Hiereth, Hermann. author.<br/><a href="http://dx.doi.org/10.1007/978-3-211-47113-5">http://dx.doi.org/10.1007/978-3-211-47113-5</a><br/>Format: Electronic Resources<br/>Quality Measures in Data Miningent://SD_ILS/0/SD_ILS:5117032024-06-18T18:29:45Z2024-06-18T18:29:45Zby Guillet, Fabrice J. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-44918-8">http://dx.doi.org/10.1007/978-3-540-44918-8</a><br/>Format: Electronic Resources<br/>Intelligent Educational Machines Methodologies and Experiencesent://SD_ILS/0/SD_ILS:5117042024-06-18T18:29:45Z2024-06-18T18:29:45Zby Nedjah, Nadia. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-44921-8">http://dx.doi.org/10.1007/978-3-540-44921-8</a><br/>Format: Electronic Resources<br/>Thin Films of Soft Matterent://SD_ILS/0/SD_ILS:5088002024-06-18T18:29:45Z2024-06-18T18:29:45Zby Kalliadasis, Serafim. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-211-69808-2">http://dx.doi.org/10.1007/978-3-211-69808-2</a><br/>Format: Electronic Resources<br/>Mechanical Vibration: Where do we Stand?ent://SD_ILS/0/SD_ILS:5088012024-06-18T18:29:45Z2024-06-18T18:29:45Zby Elishakoff, Isaac. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-211-70963-4">http://dx.doi.org/10.1007/978-3-211-70963-4</a><br/>Format: Electronic Resources<br/>Multiphase Reacting Flows: Modelling and Simulationent://SD_ILS/0/SD_ILS:5088022024-06-18T18:29:45Z2024-06-18T18:29:45Zby Marchisio, Daniele L. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-211-72464-4">http://dx.doi.org/10.1007/978-3-211-72464-4</a><br/>Format: Electronic Resources<br/>Simulation of Semiconductor Processes and Devices 2007 SISPAD 2007ent://SD_ILS/0/SD_ILS:5088032024-06-18T18:29:45Z2024-06-18T18:29:45Zby Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-211-72861-1">http://dx.doi.org/10.1007/978-3-211-72861-1</a><br/>Format: Electronic Resources<br/>Nanocatalysisent://SD_ILS/0/SD_ILS:5107252024-06-18T18:29:45Z2024-06-18T18:29:45Zby Heiz, Ulrich. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-32646-5">http://dx.doi.org/10.1007/978-3-540-32646-5</a><br/>Format: Electronic Resources<br/>Shock Wave Science and Technology Reference Library Multiphase Flows Ient://SD_ILS/0/SD_ILS:5113262024-06-18T18:29:45Z2024-06-18T18:29:45Zby Dongen, Marinus E. H. van. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-35846-6">http://dx.doi.org/10.1007/978-3-540-35846-6</a><br/>Format: Electronic Resources<br/>Ultrasonic Processes and Machines Dynamics, Control and Applicationsent://SD_ILS/0/SD_ILS:5124332024-06-18T18:29:45Z2024-06-18T18:29:45Zby Astashev, Vladimir K. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-72061-4">http://dx.doi.org/10.1007/978-3-540-72061-4</a><br/>Format: Electronic Resources<br/>Biopacemakingent://SD_ILS/0/SD_ILS:5124362024-06-18T18:29:45Z2024-06-18T18:29:45Zby Spaan, J. A. E. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-72110-9">http://dx.doi.org/10.1007/978-3-540-72110-9</a><br/>Format: Electronic Resources<br/>Handbook of Mathematicsent://SD_ILS/0/SD_ILS:5124372024-06-18T18:29:45Z2024-06-18T18:29:45Zby Bronshtein, Ilja N. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-72122-2">http://dx.doi.org/10.1007/978-3-540-72122-2</a><br/>Format: Electronic Resources<br/>Physics of Negative Refraction and Negative Index Materials Optical and Electronic Aspects and Diversified Approachesent://SD_ILS/0/SD_ILS:5124392024-06-18T18:29:45Z2024-06-18T18:29:45Zby Krowne, Clifford M. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-72132-1">http://dx.doi.org/10.1007/978-3-540-72132-1</a><br/>Format: Electronic Resources<br/>Parameter Setting in Evolutionary Algorithmsent://SD_ILS/0/SD_ILS:5121612024-06-18T18:29:45Z2024-06-18T18:29:45Zby Lobo, Fernando G. editor.<br/><a 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H. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-48260-4">http://dx.doi.org/10.1007/978-3-540-48260-4</a><br/>Format: Electronic Resources<br/>Experimental Unsaturated Soil Mechanicsent://SD_ILS/0/SD_ILS:5121972024-06-18T18:29:45Z2024-06-18T18:29:45Zby Schanz, T. editor.<br/><a href="http://dx.doi.org/10.1007/3-540-69873-6">http://dx.doi.org/10.1007/3-540-69873-6</a><br/>Format: Electronic Resources<br/>Theoretical and Numerical Unsaturated Soil Mechanicsent://SD_ILS/0/SD_ILS:5121982024-06-18T18:29:45Z2024-06-18T18:29:45Zby Schanz, T. editor.<br/><a href="http://dx.doi.org/10.1007/3-540-69876-0">http://dx.doi.org/10.1007/3-540-69876-0</a><br/>Format: Electronic Resources<br/>Control Systems Theory and Applications for Linear Repetitive Processesent://SD_ILS/0/SD_ILS:5123582024-06-18T18:29:45Z2024-06-18T18:29:45Zby Rogers, Eric. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-71537-5">http://dx.doi.org/10.1007/978-3-540-71537-5</a><br/>Format: Electronic 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Resources<br/>Proceedings of the 35th International MATADOR Conference Formerly The International Machine Tool Design and Research Conferenceent://SD_ILS/0/SD_ILS:5087242024-06-18T18:29:45Z2024-06-18T18:29:45Zby Hinduja, Srichand. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-84628-988-0">http://dx.doi.org/10.1007/978-1-84628-988-0</a><br/>Format: Electronic Resources<br/>Mechanics of Structural Elements Theory and Applicationsent://SD_ILS/0/SD_ILS:5116932024-06-18T18:29:45Z2024-06-18T18:29:45Zby Slivker, Vladimir. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-44721-4">http://dx.doi.org/10.1007/978-3-540-44721-4</a><br/>Format: Electronic Resources<br/>Springer Handbook of Experimental Fluid Mechanicsent://SD_ILS/0/SD_ILS:5096952024-06-18T18:29:45Z2024-06-18T18:29:45Zby Tropea, Cameron. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-30299-5">http://dx.doi.org/10.1007/978-3-540-30299-5</a><br/>Format: Electronic Resources<br/>Wind Effects on Buildings and 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Resources<br/>Nonlinear Dynamics in Geosciencesent://SD_ILS/0/SD_ILS:5053532024-06-18T18:29:45Z2024-06-18T18:29:45Zby Tsonis, Anastasios A. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-34918-3">http://dx.doi.org/10.1007/978-0-387-34918-3</a><br/>Format: Electronic Resources<br/>Energiya—Buran The Soviet Space Shuttleent://SD_ILS/0/SD_ILS:5060392024-06-18T18:29:45Z2024-06-18T18:29:45Zby Hendrickx, Bart. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-73984-7">http://dx.doi.org/10.1007/978-0-387-73984-7</a><br/>Format: Electronic Resources<br/>Advanced Motion Control and Sensing for Intelligent Vehiclesent://SD_ILS/0/SD_ILS:5055652024-06-18T18:29:45Z2024-06-18T18:29:45Zby Li, Li. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-44409-3">http://dx.doi.org/10.1007/978-0-387-44409-3</a><br/>Format: Electronic Resources<br/>Tissue Mechanicsent://SD_ILS/0/SD_ILS:5057702024-06-18T18:29:45Z2024-06-18T18:29:45Zby Cowin, Stephen C. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-49985-7">http://dx.doi.org/10.1007/978-0-387-49985-7</a><br/>Format: Electronic Resources<br/>Resource Management in Satellite Networks Optimization and Cross-Layer Designent://SD_ILS/0/SD_ILS:5057712024-06-18T18:29:45Z2024-06-18T18:29:45Zby Giambene, Giovanni. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-53991-1">http://dx.doi.org/10.1007/978-0-387-53991-1</a><br/>Format: Electronic Resources<br/>Routing Congestion in VLSI Circuits: Estimation and Optimizationent://SD_ILS/0/SD_ILS:5056772024-06-18T18:29:45Z2024-06-18T18:29:45Zby Saxena, Prashant. author.<br/><a href="http://dx.doi.org/10.1007/0-387-48550-3">http://dx.doi.org/10.1007/0-387-48550-3</a><br/>Format: Electronic Resources<br/>Design and Optimization of Passive UHF RFID Systemsent://SD_ILS/0/SD_ILS:5055742024-06-18T18:29:45Z2024-06-18T18:29:45Zby Curty, Jari-Pascal. author.<br/><a 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