Search Results for - Narrowed by: Characterization and Evaluation of Materials. - Nanotechnology.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dSUBJECT$002509Subject$002509Characterization$002band$002bEvaluation$002bof$002bMaterials.$002509Characterization$002band$002bEvaluation$002bof$002bMaterials.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026ps$003d300$0026isd$003dtrue?2024-09-26T07:35:09ZAdvances in Nanomaterials Fundamentals, Properties and Applicationsent://SD_ILS/0/SD_ILS:20835122024-09-26T07:35:09Z2024-09-26T07:35:09Zby Balasubramanian, Ganesh. editor.<br/><a href="https://doi.org/10.1007/978-3-319-64717-3">https://doi.org/10.1007/978-3-319-64717-3</a><br/>Format: Electronic Resources<br/>Materials Chemistryent://SD_ILS/0/SD_ILS:20834252024-09-26T07:35:09Z2024-09-26T07:35:09Zby Fahlman, Bradley D. author.<br/><a href="https://doi.org/10.1007/978-94-024-1255-0">https://doi.org/10.1007/978-94-024-1255-0</a><br/>Format: Electronic Resources<br/>A Beginners' Guide to Scanning Electron Microscopyent://SD_ILS/0/SD_ILS:20833782024-09-26T07:35:09Z2024-09-26T07:35:09Zby Ul-Hamid, Anwar. author.<br/><a href="https://doi.org/10.1007/978-3-319-98482-7">https://doi.org/10.1007/978-3-319-98482-7</a><br/>Format: Electronic Resources<br/>Controlled Synthesis and Scanning Tunneling Microscopy Study of Graphene and Graphene-Based Heterostructuresent://SD_ILS/0/SD_ILS:20835722024-09-26T07:35:09Z2024-09-26T07:35:09Zby Liu, Mengxi. author.<br/><a href="https://doi.org/10.1007/978-981-10-5181-4">https://doi.org/10.1007/978-981-10-5181-4</a><br/>Format: Electronic Resources<br/>Advanced Packaging and Manufacturing Technology Based on Adhesion Engineering Wafer-Level Transfer Packaging and Fabrication Techniques Using Interface Energy Control Methodent://SD_ILS/0/SD_ILS:20869132024-09-26T07:35:09Z2024-09-26T07:35:09Zby Seok, Seonho. author.<br/><a href="https://doi.org/10.1007/978-3-319-77872-3">https://doi.org/10.1007/978-3-319-77872-3</a><br/>Format: Electronic Resources<br/>Photocatalysis Fundamentals, Materials and Applicationsent://SD_ILS/0/SD_ILS:20833372024-09-26T07:35:09Z2024-09-26T07:35:09Zby Zhang, Jinlong. author.<br/><a href="https://doi.org/10.1007/978-981-13-2113-9">https://doi.org/10.1007/978-981-13-2113-9</a><br/>Format: Electronic Resources<br/>Residual Stresses and Nanoindentation Testing of Films and Coatingsent://SD_ILS/0/SD_ILS:20837742024-09-26T07:35:09Z2024-09-26T07:35:09Zby Wang, Haidou. author.<br/><a href="https://doi.org/10.1007/978-981-10-7841-5">https://doi.org/10.1007/978-981-10-7841-5</a><br/>Format: Electronic Resources<br/>Nanoinformaticsent://SD_ILS/0/SD_ILS:20839972024-09-26T07:35:09Z2024-09-26T07:35:09Zby Tanaka, Isao. editor.<br/><a href="https://doi.org/10.1007/978-981-10-7617-6">https://doi.org/10.1007/978-981-10-7617-6</a><br/>Format: Electronic Resources<br/>Assemblies of Gold Nanoparticles at Liquid-Liquid Interfaces From Liquid Optics to Electrocatalysisent://SD_ILS/0/SD_ILS:20835652024-09-26T07:35:09Z2024-09-26T07:35:09Zby Smirnov, Evgeny. author.<br/><a href="https://doi.org/10.1007/978-3-319-77914-0">https://doi.org/10.1007/978-3-319-77914-0</a><br/>Format: Electronic Resources<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:20838412024-09-26T07:35:09Z2024-09-26T07:35:09Zby Egerton, R.F. author.<br/><a href="https://doi.org/10.1007/978-3-319-39877-8">https://doi.org/10.1007/978-3-319-39877-8</a><br/>Format: Electronic Resources<br/>Multiscale Materials Modeling for Nanomechanicsent://SD_ILS/0/SD_ILS:20839492024-09-26T07:35:09Z2024-09-26T07:35:09Zby Weinberger, Christopher R. editor.<br/><a href="https://doi.org/10.1007/978-3-319-33480-6">https://doi.org/10.1007/978-3-319-33480-6</a><br/>Format: Electronic Resources<br/>Liquid Crystalline Polymers Volume 1–Structure and Chemistryent://SD_ILS/0/SD_ILS:20837522024-09-26T07:35:09Z2024-09-26T07:35:09Zby Thakur, Vijay Kumar. editor.<br/><a href="https://doi.org/10.1007/978-3-319-22894-5">https://doi.org/10.1007/978-3-319-22894-5</a><br/>Format: Electronic Resources<br/>Advances in Nanocomposites Modeling, Characterization and Applicationsent://SD_ILS/0/SD_ILS:20836482024-09-26T07:35:09Z2024-09-26T07:35:09Zby Meguid, Shaker A. editor.<br/><a href="https://doi.org/10.1007/978-3-319-31662-8">https://doi.org/10.1007/978-3-319-31662-8</a><br/>Format: Electronic Resources<br/>Functionalizing Graphene and Carbon Nanotubes A Reviewent://SD_ILS/0/SD_ILS:20837712024-09-26T07:35:09Z2024-09-26T07:35:09Zby Ferreira, Filipe Vargas. author.<br/><a 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Chemistryent://SD_ILS/0/SD_ILS:5075422024-09-26T07:35:09Z2024-09-26T07:35:09Zby Fahlman, Bradley D. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-6120-2">http://dx.doi.org/10.1007/978-1-4020-6120-2</a><br/>Format: Electronic Resources<br/>Micromehcanics of Heterogenous Materialsent://SD_ILS/0/SD_ILS:5058102024-09-26T07:35:09Z2024-09-26T07:35:09Zby Buryachenko, Valeriy A. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68485-7">http://dx.doi.org/10.1007/978-0-387-68485-7</a><br/>Format: Electronic Resources<br/>Fundamentals of Nanoscale Film Analysisent://SD_ILS/0/SD_ILS:5048922024-09-26T07:35:09Z2024-09-26T07:35:09Zby Alford, Terry L. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format: Electronic Resources<br/>Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscaleent://SD_ILS/0/SD_ILS:5048002024-09-26T07:35:09Z2024-09-26T07:35:09Zby Kalinin, Sergei. 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R. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-68752-8">http://dx.doi.org/10.1007/978-3-540-68752-8</a><br/>Format: Electronic Resources<br/>Low-Dimensional Molecular Metalsent://SD_ILS/0/SD_ILS:5119782024-09-26T07:35:09Z2024-09-26T07:35:09Zby Toyota, Naoki. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-49576-5">http://dx.doi.org/10.1007/978-3-540-49576-5</a><br/>Format: Electronic Resources<br/>Handbook of Advanced Magnetic Materialsent://SD_ILS/0/SD_ILS:5076872024-09-26T07:35:09Z2024-09-26T07:35:09Zby Liu, Yi. editor.<br/><a href="http://dx.doi.org/10.1007/b115335">http://dx.doi.org/10.1007/b115335</a><br/>Format: Electronic Resources<br/>Micromanufacturing and Nanotechnologyent://SD_ILS/0/SD_ILS:5095772024-09-26T07:35:09Z2024-09-26T07:35:09Zby Mahalik, Nitaigour Premchand. author.<br/><a href="http://dx.doi.org/10.1007/3-540-29339-6">http://dx.doi.org/10.1007/3-540-29339-6</a><br/>Format: Electronic Resources<br/>Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currentsent://SD_ILS/0/SD_ILS:5054712024-09-26T07:35:09Z2024-09-26T07:35:09Zby Foster, Adam. author.<br/><a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Surface-Enhanced Raman Scattering Physics and Applicationsent://SD_ILS/0/SD_ILS:5109612024-09-26T07:35:09Z2024-09-26T07:35:09Zby Kneipp, Katrin. editor.<br/><a href="http://dx.doi.org/10.1007/3-540-33567-6">http://dx.doi.org/10.1007/3-540-33567-6</a><br/>Format: Electronic Resources<br/>Understanding Carbon Nanotubes From Basics to Applicationsent://SD_ILS/0/SD_ILS:5115082024-09-26T07:35:09Z2024-09-26T07:35:09Zby Loiseau, Annick. editor.<br/><a href="http://dx.doi.org/10.1007/b10971390">http://dx.doi.org/10.1007/b10971390</a><br/>Format: Electronic Resources<br/>Handbook of Microscopy for Nanotechnologyent://SD_ILS/0/SD_ILS:5076892024-09-26T07:35:09Z2024-09-26T07:35:09Zby Yao, Nan. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-8006-9">http://dx.doi.org/10.1007/1-4020-8006-9</a><br/>Format: Electronic Resources<br/>Metallopolymer Nanocompositesent://SD_ILS/0/SD_ILS:5089072024-09-26T07:35:09Z2024-09-26T07:35:09Zby Pomogailo, Anatolii D. author.<br/><a href="http://dx.doi.org/10.1007/b137740">http://dx.doi.org/10.1007/b137740</a><br/>Format: Electronic Resources<br/>Electroceramic-Based MEMS Fabrication-Technology and Applicationsent://SD_ILS/0/SD_ILS:5041402024-09-26T07:35:09Z2024-09-26T07:35:09Zby Setter, Nava. editor.<br/><a href="http://dx.doi.org/10.1007/b101200">http://dx.doi.org/10.1007/b101200</a><br/>Format: Electronic Resources<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:5044752024-09-26T07:35:09Z2024-09-26T07:35:09Zby Egerton, Ray F. author.<br/><a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Electronic Resources<br/>Semiconductor Nanocrystals and Silicate Nanoparticlesent://SD_ILS/0/SD_ILS:5099782024-09-26T07:35:09Z2024-09-26T07:35:09Zby Peng, X. editor.<br/><a href="http://dx.doi.org/10.1007/b11020">http://dx.doi.org/10.1007/b11020</a><br/>Format: Electronic Resources<br/>