Search Results for - Narrowed by: Chemistry. - Microscopy.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dSUBJECT$002509Subject$002509Chemistry.$002509Chemistry.$0026qf$003dSUBJECT$002509Subject$002509Microscopy.$002509Microscopy.$0026ps$003d300?2024-06-18T06:37:23ZScanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscaleent://SD_ILS/0/SD_ILS:5048002024-06-18T06:37:23Z2024-06-18T06:37:23Zby Kalinin, Sergei. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Electronic Resources<br/>Science of Microscopyent://SD_ILS/0/SD_ILS:5057492024-06-18T06:37:23Z2024-06-18T06:37:23Zby Hawkes, Peter W. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format: Electronic Resources<br/>Principles of Fluorescence Spectroscopyent://SD_ILS/0/SD_ILS:5056142024-06-18T06:37:23Z2024-06-18T06:37:23Zby Lakowicz, Joseph R. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-46312-4">http://dx.doi.org/10.1007/978-0-387-46312-4</a><br/>Format: Electronic Resources<br/>Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currentsent://SD_ILS/0/SD_ILS:5054712024-06-18T06:37:23Z2024-06-18T06:37:23Zby Foster, Adam. author.<br/><a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:5044752024-06-18T06:37:23Z2024-06-18T06:37:23Zby Egerton, Ray F. author.<br/><a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Electronic Resources<br/>Radiative Decay Engineeringent://SD_ILS/0/SD_ILS:5046742024-06-18T06:37:23Z2024-06-18T06:37:23Zby Geddes, Chris D. editor.<br/><a href="http://dx.doi.org/10.1007/0-387-27617-3">http://dx.doi.org/10.1007/0-387-27617-3</a><br/>Format: Electronic Resources<br/>Microscopy Techniques -/-ent://SD_ILS/0/SD_ILS:5100232024-06-18T06:37:23Z2024-06-18T06:37:23Zby Rietdorf, Jens. editor.<br/><a href="http://dx.doi.org/10.1007/b14097">http://dx.doi.org/10.1007/b14097</a><br/>Format: Electronic Resources<br/>