Search Results for - Narrowed by: Computer science. - Electronics and Microelectronics, Instrumentation. SirsiDynix Enterprise https://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dSUBJECT$002509Subject$002509Computer$002bscience.$002509Computer$002bscience.$0026qf$003dSUBJECT$002509Subject$002509Electronics$002band$002bMicroelectronics$00252C$002bInstrumentation.$002509Electronics$002band$002bMicroelectronics$00252C$002bInstrumentation.$0026ps$003d300? 2024-06-14T14:08:25Z Timing Performance of Nanometer Digital Circuits Under Process Variations ent://SD_ILS/0/SD_ILS:2086718 2024-06-14T14:08:25Z 2024-06-14T14:08:25Z by&#160;Champac, Victor. author.<br/><a href="https://doi.org/10.1007/978-3-319-75465-9">https://doi.org/10.1007/978-3-319-75465-9</a><br/>Format:&#160;Electronic Resources<br/> Automated Validation &amp; Verification of UML/OCL Models Using Satisfiability Solvers ent://SD_ILS/0/SD_ILS:2087238 2024-06-14T14:08:25Z 2024-06-14T14:08:25Z by&#160;Przigoda, Nils. author.<br/><a href="https://doi.org/10.1007/978-3-319-72814-8">https://doi.org/10.1007/978-3-319-72814-8</a><br/>Format:&#160;Electronic Resources<br/> Contactless VLSI Measurement and Testing Techniques ent://SD_ILS/0/SD_ILS:2087109 2024-06-14T14:08:25Z 2024-06-14T14:08:25Z by&#160;Sayil, Selahattin. author.<br/><a href="https://doi.org/10.1007/978-3-319-69673-7">https://doi.org/10.1007/978-3-319-69673-7</a><br/>Format:&#160;Electronic Resources<br/> Digital Storage in Consumer Electronics The Essential Guide ent://SD_ILS/0/SD_ILS:2087119 2024-06-14T14:08:25Z 2024-06-14T14:08:25Z by&#160;Coughlin, Thomas M. author.<br/><a href="https://doi.org/10.1007/978-3-319-69907-3">https://doi.org/10.1007/978-3-319-69907-3</a><br/>Format:&#160;Electronic Resources<br/> Formal System Verification State-of the-Art and Future Trends ent://SD_ILS/0/SD_ILS:2088042 2024-06-14T14:08:25Z 2024-06-14T14:08:25Z by&#160;Drechsler, Rolf. editor.<br/><a href="https://doi.org/10.1007/978-3-319-57685-5">https://doi.org/10.1007/978-3-319-57685-5</a><br/>Format:&#160;Electronic Resources<br/> Symbolic Parallelization of Nested Loop Programs ent://SD_ILS/0/SD_ILS:2087940 2024-06-14T14:08:25Z 2024-06-14T14:08:25Z by&#160;Tanase, Alexandru-Petru. author.<br/><a href="https://doi.org/10.1007/978-3-319-73909-0">https://doi.org/10.1007/978-3-319-73909-0</a><br/>Format:&#160;Electronic Resources<br/> Embedded System Design Embedded Systems Foundations of Cyber-Physical Systems, and the Internet of Things ent://SD_ILS/0/SD_ILS:2087985 2024-06-14T14:08:25Z 2024-06-14T14:08:25Z by&#160;Marwedel, Peter. author.<br/><a href="https://doi.org/10.1007/978-3-319-56045-8">https://doi.org/10.1007/978-3-319-56045-8</a><br/>Format:&#160;Electronic Resources<br/> Dependable Multicore Architectures at Nanoscale ent://SD_ILS/0/SD_ILS:2087995 2024-06-14T14:08:25Z 2024-06-14T14:08:25Z by&#160;Ottavi, Marco. editor.<br/><a href="https://doi.org/10.1007/978-3-319-54422-9">https://doi.org/10.1007/978-3-319-54422-9</a><br/>Format:&#160;Electronic Resources<br/> Fundamentals of Electromigration-Aware Integrated Circuit Design ent://SD_ILS/0/SD_ILS:2087817 2024-06-14T14:08:25Z 2024-06-14T14:08:25Z by&#160;Lienig, Jens. author.<br/><a href="https://doi.org/10.1007/978-3-319-73558-0">https://doi.org/10.1007/978-3-319-73558-0</a><br/>Format:&#160;Electronic Resources<br/> Machine Learning for Model Order Reduction ent://SD_ILS/0/SD_ILS:2087824 2024-06-14T14:08:25Z 2024-06-14T14:08:25Z by&#160;Mohamed, Khaled Salah. author.<br/><a href="https://doi.org/10.1007/978-3-319-75714-8">https://doi.org/10.1007/978-3-319-75714-8</a><br/>Format:&#160;Electronic Resources<br/> Advanced Techniques for Power, Energy, and Thermal Management for Clustered Manycores ent://SD_ILS/0/SD_ILS:2086900 2024-06-14T14:08:25Z 2024-06-14T14:08:25Z by&#160;Pagani, Santiago. author.<br/><a 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