Search Results for - Narrowed by: Electronics. - Physics and Applied Physics in Engineering. SirsiDynix Enterprise https://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026qf$003dSUBJECT$002509Subject$002509Physics$002band$002bApplied$002bPhysics$002bin$002bEngineering.$002509Physics$002band$002bApplied$002bPhysics$002bin$002bEngineering.$0026ps$003d300? 2024-05-30T15:25:11Z Vacuum Electronics Components and Devices ent://SD_ILS/0/SD_ILS:502878 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Eichmeier, Joseph A. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-71929-8">http://dx.doi.org/10.1007/978-3-540-71929-8</a><br/>Format:&#160;Electronic Resources<br/> Piezoelectricity Evolution and Future of a Technology ent://SD_ILS/0/SD_ILS:502668 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Heywang, Walter. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-68683-5">http://dx.doi.org/10.1007/978-3-540-68683-5</a><br/>Format:&#160;Electronic Resources<br/> FinFETs and Other Multi-Gate Transistors ent://SD_ILS/0/SD_ILS:501677 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Colinge, Jean-Pierre. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-71752-4">http://dx.doi.org/10.1007/978-0-387-71752-4</a><br/>Format:&#160;Electronic Resources<br/> Gallium Nitride Electronics ent://SD_ILS/0/SD_ILS:502874 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Quay, R&uuml;diger. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-71892-5">http://dx.doi.org/10.1007/978-3-540-71892-5</a><br/>Format:&#160;Electronic Resources<br/> Automotive Lighting and Human Vision ent://SD_ILS/0/SD_ILS:511402 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;W&ouml;rdenweber, Burkard. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-36697-3">http://dx.doi.org/10.1007/978-3-540-36697-3</a><br/>Format:&#160;Electronic Resources<br/> Fast Simulation of Electro-Thermal MEMS Efficient Dynamic Compact Models ent://SD_ILS/0/SD_ILS:511174 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Bechtold, Tamara. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-34613-5">http://dx.doi.org/10.1007/978-3-540-34613-5</a><br/>Format:&#160;Electronic Resources<br/> Low-Frequency Noise In Advanced Mos Devices ent://SD_ILS/0/SD_ILS:507456 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Haartman, Martin von. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-5910-0">http://dx.doi.org/10.1007/978-1-4020-5910-0</a><br/>Format:&#160;Electronic Resources<br/> The Physics of Semiconductors An Introduction Including Devices and Nanophysics ent://SD_ILS/0/SD_ILS:511188 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Grundmann, Marius. author.<br/><a href="http://dx.doi.org/10.1007/3-540-34661-9">http://dx.doi.org/10.1007/3-540-34661-9</a><br/>Format:&#160;Electronic Resources<br/> Pulsed Power Systems Principles and Applications ent://SD_ILS/0/SD_ILS:511189 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Bluhm, Hansjoachim. author.<br/><a href="http://dx.doi.org/10.1007/3-540-34662-7">http://dx.doi.org/10.1007/3-540-34662-7</a><br/>Format:&#160;Electronic Resources<br/> Optical Interconnects The Silicon Approach ent://SD_ILS/0/SD_ILS:509522 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Pavesi, Lorenzo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-28912-8">http://dx.doi.org/10.1007/978-3-540-28912-8</a><br/>Format:&#160;Electronic Resources<br/> Carbon The Future Material for Advanced Technology Applications ent://SD_ILS/0/SD_ILS:511314 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Messina, Giacomo. editor.<br/><a href="http://dx.doi.org/10.1007/b105262">http://dx.doi.org/10.1007/b105262</a><br/>Format:&#160;Electronic Resources<br/> Micromachined Thin-Film Sensors for SOI-CMOS Co-Integration ent://SD_ILS/0/SD_ILS:504838 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Laconte, J. author.<br/><a href="http://dx.doi.org/10.1007/0-387-28843-0">http://dx.doi.org/10.1007/0-387-28843-0</a><br/>Format:&#160;Electronic Resources<br/> Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices ent://SD_ILS/0/SD_ILS:506849 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Gusev, Evgeni. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-4367-8">http://dx.doi.org/10.1007/1-4020-4367-8</a><br/>Format:&#160;Electronic Resources<br/> Bonding in Microsystem Technology ent://SD_ILS/0/SD_ILS:506934 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Dziuban, Jan A. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4589-1">http://dx.doi.org/10.1007/1-4020-4589-1</a><br/>Format:&#160;Electronic Resources<br/> Detection and Signal Processing Technical Realization ent://SD_ILS/0/SD_ILS:509607 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Witteman, Wilhelmus Jacobus. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-29600-3">http://dx.doi.org/10.1007/978-3-540-29600-3</a><br/>Format:&#160;Electronic Resources<br/> Mid-infrared Semiconductor Optoelectronics ent://SD_ILS/0/SD_ILS:508445 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Krier, Anthony. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-209-8">http://dx.doi.org/10.1007/1-84628-209-8</a><br/>Format:&#160;Electronic Resources<br/> Continuous-Time Sigma-Delta A/D Conversion Fundamentals, Performance Limits and Robust Implementations ent://SD_ILS/0/SD_ILS:509431 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Ortmanns, Maurits. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28473-7">http://dx.doi.org/10.1007/3-540-28473-7</a><br/>Format:&#160;Electronic Resources<br/> Matching Properties of Deep Sub-Micron MOS Transistors ent://SD_ILS/0/SD_ILS:504299 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Croon, Jeroen A. author.<br/><a href="http://dx.doi.org/10.1007/b105122">http://dx.doi.org/10.1007/b105122</a><br/>Format:&#160;Electronic Resources<br/> Ferroelectric Thin Films Basic Properties and Device Physics for Memory Applications ent://SD_ILS/0/SD_ILS:509963 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Okuyama, Masanori. editor.<br/><a href="http://dx.doi.org/10.1007/b99517">http://dx.doi.org/10.1007/b99517</a><br/>Format:&#160;Electronic Resources<br/> Force Sensors for Microelectronic Packaging Applications ent://SD_ILS/0/SD_ILS:509048 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Schwizer, J&uuml;rg. author.<br/><a href="http://dx.doi.org/10.1007/b138345">http://dx.doi.org/10.1007/b138345</a><br/>Format:&#160;Electronic Resources<br/> Intense Electron and Ion Beams ent://SD_ILS/0/SD_ILS:509497 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Molokovsky, Sergey Ivanovich. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28812-0">http://dx.doi.org/10.1007/3-540-28812-0</a><br/>Format:&#160;Electronic Resources<br/> CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms ent://SD_ILS/0/SD_ILS:509227 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Li, Flora M. author.<br/><a href="http://dx.doi.org/10.1007/b139047">http://dx.doi.org/10.1007/b139047</a><br/>Format:&#160;Electronic Resources<br/> Materials for Information Technology Devices, Interconnects and Packaging ent://SD_ILS/0/SD_ILS:508465 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Zschech, Ehrenfried. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-235-7">http://dx.doi.org/10.1007/1-84628-235-7</a><br/>Format:&#160;Electronic Resources<br/> Microcontrollers in Practice ent://SD_ILS/0/SD_ILS:509408 2024-05-30T15:25:11Z 2024-05-30T15:25:11Z by&#160;Mitescu, Marian. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28308-0">http://dx.doi.org/10.1007/3-540-28308-0</a><br/>Format:&#160;Electronic Resources<br/>