Search Results for - Narrowed by: Electronics. - Physics and Applied Physics in Engineering.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026qf$003dSUBJECT$002509Subject$002509Physics$002band$002bApplied$002bPhysics$002bin$002bEngineering.$002509Physics$002band$002bApplied$002bPhysics$002bin$002bEngineering.$0026ps$003d300$0026isd$003dtrue?2024-06-16T09:48:38ZFinFETs and Other Multi-Gate Transistorsent://SD_ILS/0/SD_ILS:5016772024-06-16T09:48:38Z2024-06-16T09:48:38Zby Colinge, Jean-Pierre. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-71752-4">http://dx.doi.org/10.1007/978-0-387-71752-4</a><br/>Format: Electronic Resources<br/>Gallium Nitride Electronicsent://SD_ILS/0/SD_ILS:5028742024-06-16T09:48:38Z2024-06-16T09:48:38Zby Quay, Rüdiger. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-71892-5">http://dx.doi.org/10.1007/978-3-540-71892-5</a><br/>Format: Electronic Resources<br/>Vacuum Electronics Components and Devicesent://SD_ILS/0/SD_ILS:5028782024-06-16T09:48:38Z2024-06-16T09:48:38Zby Eichmeier, Joseph A. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-71929-8">http://dx.doi.org/10.1007/978-3-540-71929-8</a><br/>Format: Electronic Resources<br/>Piezoelectricity Evolution and Future of a Technologyent://SD_ILS/0/SD_ILS:5026682024-06-16T09:48:38Z2024-06-16T09:48:38Zby Heywang, Walter. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-68683-5">http://dx.doi.org/10.1007/978-3-540-68683-5</a><br/>Format: Electronic Resources<br/>Low-Frequency Noise In Advanced Mos Devicesent://SD_ILS/0/SD_ILS:5074562024-06-16T09:48:38Z2024-06-16T09:48:38Zby Haartman, Martin von. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-5910-0">http://dx.doi.org/10.1007/978-1-4020-5910-0</a><br/>Format: Electronic Resources<br/>Fast Simulation of Electro-Thermal MEMS Efficient Dynamic Compact Modelsent://SD_ILS/0/SD_ILS:5111742024-06-16T09:48:38Z2024-06-16T09:48:38Zby Bechtold, Tamara. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-34613-5">http://dx.doi.org/10.1007/978-3-540-34613-5</a><br/>Format: Electronic Resources<br/>Automotive Lighting and Human Visionent://SD_ILS/0/SD_ILS:5114022024-06-16T09:48:38Z2024-06-16T09:48:38Zby Wördenweber, Burkard. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-36697-3">http://dx.doi.org/10.1007/978-3-540-36697-3</a><br/>Format: Electronic Resources<br/>Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devicesent://SD_ILS/0/SD_ILS:5068492024-06-16T09:48:38Z2024-06-16T09:48:38Zby Gusev, Evgeni. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-4367-8">http://dx.doi.org/10.1007/1-4020-4367-8</a><br/>Format: Electronic Resources<br/>Bonding in Microsystem Technologyent://SD_ILS/0/SD_ILS:5069342024-06-16T09:48:38Z2024-06-16T09:48:38Zby Dziuban, Jan A. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4589-1">http://dx.doi.org/10.1007/1-4020-4589-1</a><br/>Format: Electronic Resources<br/>Micromachined Thin-Film Sensors for SOI-CMOS Co-Integrationent://SD_ILS/0/SD_ILS:5048382024-06-16T09:48:38Z2024-06-16T09:48:38Zby Laconte, J. author.<br/><a href="http://dx.doi.org/10.1007/0-387-28843-0">http://dx.doi.org/10.1007/0-387-28843-0</a><br/>Format: Electronic Resources<br/>Carbon The Future Material for Advanced Technology Applicationsent://SD_ILS/0/SD_ILS:5113142024-06-16T09:48:38Z2024-06-16T09:48:38Zby Messina, Giacomo. editor.<br/><a href="http://dx.doi.org/10.1007/b105262">http://dx.doi.org/10.1007/b105262</a><br/>Format: Electronic Resources<br/>Detection and Signal Processing Technical Realizationent://SD_ILS/0/SD_ILS:5096072024-06-16T09:48:38Z2024-06-16T09:48:38Zby Witteman, Wilhelmus Jacobus. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-29600-3">http://dx.doi.org/10.1007/978-3-540-29600-3</a><br/>Format: Electronic Resources<br/>Continuous-Time Sigma-Delta A/D Conversion Fundamentals, Performance Limits and Robust Implementationsent://SD_ILS/0/SD_ILS:5094312024-06-16T09:48:38Z2024-06-16T09:48:38Zby Ortmanns, Maurits. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28473-7">http://dx.doi.org/10.1007/3-540-28473-7</a><br/>Format: Electronic Resources<br/>Optical Interconnects The Silicon Approachent://SD_ILS/0/SD_ILS:5095222024-06-16T09:48:38Z2024-06-16T09:48:38Zby Pavesi, Lorenzo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-28912-8">http://dx.doi.org/10.1007/978-3-540-28912-8</a><br/>Format: Electronic Resources<br/>The Physics of Semiconductors An Introduction Including Devices and Nanophysicsent://SD_ILS/0/SD_ILS:5111882024-06-16T09:48:38Z2024-06-16T09:48:38Zby Grundmann, Marius. author.<br/><a href="http://dx.doi.org/10.1007/3-540-34661-9">http://dx.doi.org/10.1007/3-540-34661-9</a><br/>Format: Electronic Resources<br/>Pulsed Power Systems Principles and Applicationsent://SD_ILS/0/SD_ILS:5111892024-06-16T09:48:38Z2024-06-16T09:48:38Zby Bluhm, Hansjoachim. author.<br/><a href="http://dx.doi.org/10.1007/3-540-34662-7">http://dx.doi.org/10.1007/3-540-34662-7</a><br/>Format: Electronic Resources<br/>Mid-infrared Semiconductor Optoelectronicsent://SD_ILS/0/SD_ILS:5084452024-06-16T09:48:38Z2024-06-16T09:48:38Zby Krier, Anthony. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-209-8">http://dx.doi.org/10.1007/1-84628-209-8</a><br/>Format: Electronic Resources<br/>Matching Properties of Deep Sub-Micron MOS Transistorsent://SD_ILS/0/SD_ILS:5042992024-06-16T09:48:38Z2024-06-16T09:48:38Zby Croon, Jeroen A. author.<br/><a href="http://dx.doi.org/10.1007/b105122">http://dx.doi.org/10.1007/b105122</a><br/>Format: Electronic Resources<br/>Materials for Information Technology Devices, Interconnects and Packagingent://SD_ILS/0/SD_ILS:5084652024-06-16T09:48:38Z2024-06-16T09:48:38Zby Zschech, Ehrenfried. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-235-7">http://dx.doi.org/10.1007/1-84628-235-7</a><br/>Format: Electronic Resources<br/>Force Sensors for Microelectronic Packaging Applicationsent://SD_ILS/0/SD_ILS:5090482024-06-16T09:48:38Z2024-06-16T09:48:38Zby Schwizer, Jürg. author.<br/><a href="http://dx.doi.org/10.1007/b138345">http://dx.doi.org/10.1007/b138345</a><br/>Format: Electronic Resources<br/>CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanismsent://SD_ILS/0/SD_ILS:5092272024-06-16T09:48:38Z2024-06-16T09:48:38Zby Li, Flora M. author.<br/><a href="http://dx.doi.org/10.1007/b139047">http://dx.doi.org/10.1007/b139047</a><br/>Format: Electronic Resources<br/>Microcontrollers in Practiceent://SD_ILS/0/SD_ILS:5094082024-06-16T09:48:38Z2024-06-16T09:48:38Zby Mitescu, Marian. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28308-0">http://dx.doi.org/10.1007/3-540-28308-0</a><br/>Format: Electronic Resources<br/>Ferroelectric Thin Films Basic Properties and Device Physics for Memory Applicationsent://SD_ILS/0/SD_ILS:5099632024-06-16T09:48:38Z2024-06-16T09:48:38Zby Okuyama, Masanori. editor.<br/><a href="http://dx.doi.org/10.1007/b99517">http://dx.doi.org/10.1007/b99517</a><br/>Format: Electronic Resources<br/>Intense Electron and Ion Beamsent://SD_ILS/0/SD_ILS:5094972024-06-16T09:48:38Z2024-06-16T09:48:38Zby Molokovsky, Sergey Ivanovich. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28812-0">http://dx.doi.org/10.1007/3-540-28812-0</a><br/>Format: Electronic Resources<br/>