Search Results for - Narrowed by: Electronics. - Weights and measures.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026qf$003dSUBJECT$002509Subject$002509Weights$002band$002bmeasures.$002509Weights$002band$002bmeasures.$0026ps$003d300?2024-06-03T18:01:41ZMicroscopy of Semiconducting Materials 2007ent://SD_ILS/0/SD_ILS:5023172024-06-03T18:01:41Z2024-06-03T18:01:41Zby Cullis, A. G. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-8615-1">http://dx.doi.org/10.1007/978-1-4020-8615-1</a><br/>Format: Electronic Resources<br/>Particle Detection with Drift Chambersent://SD_ILS/0/SD_ILS:5031802024-06-03T18:01:41Z2024-06-03T18:01:41Zby Rolandi, Luigi. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-76684-1">http://dx.doi.org/10.1007/978-3-540-76684-1</a><br/>Format: Electronic Resources<br/>Measurement Uncertainty An Approach via the Mathematical Theory of Evidenceent://SD_ILS/0/SD_ILS:5056162024-06-03T18:01:41Z2024-06-03T18:01:41Zby Salicone, Simona. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-46328-5">http://dx.doi.org/10.1007/978-0-387-46328-5</a><br/>Format: Electronic Resources<br/>Geomagnetics for Aeronautical Safety A Case Study in and around the Balkansent://SD_ILS/0/SD_ILS:5071062024-06-03T18:01:41Z2024-06-03T18:01:41Zby Rasson, Jean L. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-5025-1">http://dx.doi.org/10.1007/978-1-4020-5025-1</a><br/>Format: Electronic Resources<br/>Beam Instrumentation and Diagnosticsent://SD_ILS/0/SD_ILS:5088672024-06-03T18:01:41Z2024-06-03T18:01:41Zby Strehl, Peter. author.<br/><a href="http://dx.doi.org/10.1007/3-540-26404-3">http://dx.doi.org/10.1007/3-540-26404-3</a><br/>Format: Electronic Resources<br/>PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGYent://SD_ILS/0/SD_ILS:5072002024-06-03T18:01:41Z2024-06-03T18:01:41Zby Pertijs, Michiel A.P. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-5258-8">http://dx.doi.org/10.1007/1-4020-5258-8</a><br/>Format: Electronic Resources<br/>Pixel Detectors From Fundamentals to Applicationsent://SD_ILS/0/SD_ILS:5094102024-06-03T18:01:41Z2024-06-03T18:01:41Zby Rossi, Leonardo. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28333-1">http://dx.doi.org/10.1007/3-540-28333-1</a><br/>Format: Electronic Resources<br/>Microscale Diagnostic Techniquesent://SD_ILS/0/SD_ILS:5088782024-06-03T18:01:41Z2024-06-03T18:01:41Zby Breuer, Kenneth S. editor.<br/><a href="http://dx.doi.org/10.1007/b137604">http://dx.doi.org/10.1007/b137604</a><br/>Format: Electronic Resources<br/>Intense Electron and Ion Beamsent://SD_ILS/0/SD_ILS:5094972024-06-03T18:01:41Z2024-06-03T18:01:41Zby Molokovsky, Sergey Ivanovich. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28812-0">http://dx.doi.org/10.1007/3-540-28812-0</a><br/>Format: Electronic Resources<br/>Electronic Noise and Interfering Signals Principles and Applicationsent://SD_ILS/0/SD_ILS:5089012024-06-03T18:01:41Z2024-06-03T18:01:41Zby Vasilescu, Gabriel. author.<br/><a href="http://dx.doi.org/10.1007/b137720">http://dx.doi.org/10.1007/b137720</a><br/>Format: Electronic Resources<br/>Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UKent://SD_ILS/0/SD_ILS:5102922024-06-03T18:01:41Z2024-06-03T18:01:41Zby Cullis, A. G. editor.<br/><a href="http://dx.doi.org/10.1007/3-540-31915-8">http://dx.doi.org/10.1007/3-540-31915-8</a><br/>Format: Electronic Resources<br/>Integrated Chemical Microsensor Systems in CMOS Technologyent://SD_ILS/0/SD_ILS:5092162024-06-03T18:01:41Z2024-06-03T18:01:41Zby Hierlemann, Andreas. author.<br/><a href="http://dx.doi.org/10.1007/b138987">http://dx.doi.org/10.1007/b138987</a><br/>Format: Electronic Resources<br/>Dynamic Characterisation of Analogue-to-Digital Convertersent://SD_ILS/0/SD_ILS:5044652024-06-03T18:01:41Z2024-06-03T18:01:41Zby Dallet, Dominique. author.<br/><a href="http://dx.doi.org/10.1007/b136458">http://dx.doi.org/10.1007/b136458</a><br/>Format: Electronic Resources<br/>