Search Results for - Narrowed by: Materials. - Electronics and Microelectronics, Instrumentation.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dSUBJECT$002509Subject$002509Materials.$002509Materials.$0026qf$003dSUBJECT$002509Subject$002509Electronics$002band$002bMicroelectronics$00252C$002bInstrumentation.$002509Electronics$002band$002bMicroelectronics$00252C$002bInstrumentation.$0026ps$003d300?2024-05-30T02:10:49ZAdvanced Semiconducting Materials and Devicesent://SD_ILS/0/SD_ILS:20837802024-05-30T02:10:49Z2024-05-30T02:10:49Zby Gupta, K.M. author.<br/><a href="https://doi.org/10.1007/978-3-319-19758-6">https://doi.org/10.1007/978-3-319-19758-6</a><br/>Format: Electronic Resources<br/>Nanotribology and Nanomechanics An Introductionent://SD_ILS/0/SD_ILS:5032752024-05-30T02:10:49Z2024-05-30T02:10:49Zby Bhushan, Bharat. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-77608-6">http://dx.doi.org/10.1007/978-3-540-77608-6</a><br/>Format: Electronic Resources<br/>Functional Nanostructures Processing, Characterization, and Applicationsent://SD_ILS/0/SD_ILS:5015852024-05-30T02:10:49Z2024-05-30T02:10:49Zby Seal, Sudipta. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-48805-9">http://dx.doi.org/10.1007/978-0-387-48805-9</a><br/>Format: Electronic Resources<br/>Piezoelectricity Evolution and Future of a Technologyent://SD_ILS/0/SD_ILS:5026682024-05-30T02:10:49Z2024-05-30T02:10:49Zby Heywang, Walter. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-68683-5">http://dx.doi.org/10.1007/978-3-540-68683-5</a><br/>Format: Electronic Resources<br/>Microscopy of Semiconducting Materials 2007ent://SD_ILS/0/SD_ILS:5023172024-05-30T02:10:49Z2024-05-30T02:10:49Zby Cullis, A. G. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-8615-1">http://dx.doi.org/10.1007/978-1-4020-8615-1</a><br/>Format: Electronic Resources<br/>Springer Handbook of Nanotechnologyent://SD_ILS/0/SD_ILS:5096382024-05-30T02:10:49Z2024-05-30T02:10:49Zby Bhushan, Bharat. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-29857-1">http://dx.doi.org/10.1007/978-3-540-29857-1</a><br/>Format: Electronic Resources<br/>Physics of Ferroelectrics A Modern Perspectiveent://SD_ILS/0/SD_ILS:5111682024-05-30T02:10:49Z2024-05-30T02:10:49Zby Rabe, Karin M. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-34591-6">http://dx.doi.org/10.1007/978-3-540-34591-6</a><br/>Format: Electronic Resources<br/>Numerical Simulation of Mechatronic Sensors and Actuatorsent://SD_ILS/0/SD_ILS:5123292024-05-30T02:10:49Z2024-05-30T02:10:49Zby Kaltenbacher, Manfred. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-71360-9">http://dx.doi.org/10.1007/978-3-540-71360-9</a><br/>Format: Electronic Resources<br/>Lead-Free Electronic Solders A Special Issue of the Journal of Materials Science: Materials in Electronicsent://SD_ILS/0/SD_ILS:5056722024-05-30T02:10:49Z2024-05-30T02:10:49Zby Subramanian, K. N. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-48433-4">http://dx.doi.org/10.1007/978-0-387-48433-4</a><br/>Format: Electronic Resources<br/>A Guide to Lead-free Solders Physical Metallurgy and Reliabilityent://SD_ILS/0/SD_ILS:5085082024-05-30T02:10:49Z2024-05-30T02:10:49Zby Evans, John W. author.<br/><a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format: Electronic Resources<br/>Lead-Free Solderingent://SD_ILS/0/SD_ILS:5058042024-05-30T02:10:49Z2024-05-30T02:10:49Zby Bath, Jasbir. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68422-2">http://dx.doi.org/10.1007/978-0-387-68422-2</a><br/>Format: Electronic Resources<br/>Solder Joint Technology Materials, Properties, and Reliabilityent://SD_ILS/0/SD_ILS:5055272024-05-30T02:10:49Z2024-05-30T02:10:49Zby Tu, King-Ning. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format: Electronic Resources<br/>Advanced Magnetic Nanostructuresent://SD_ILS/0/SD_ILS:5041392024-05-30T02:10:49Z2024-05-30T02:10:49Zby Sellmyer, David. editor.<br/><a href="http://dx.doi.org/10.1007/b101199">http://dx.doi.org/10.1007/b101199</a><br/>Format: Electronic Resources<br/>Handbook of Advanced Magnetic Materialsent://SD_ILS/0/SD_ILS:5076872024-05-30T02:10:49Z2024-05-30T02:10:49Zby Liu, Yi. editor.<br/><a href="http://dx.doi.org/10.1007/b115335">http://dx.doi.org/10.1007/b115335</a><br/>Format: Electronic Resources<br/>Nanotechnology Assessment and Perspectivesent://SD_ILS/0/SD_ILS:5107632024-05-30T02:10:49Z2024-05-30T02:10:49Zby Brune, H. author.<br/><a href="http://dx.doi.org/10.1007/3-540-32820-3">http://dx.doi.org/10.1007/3-540-32820-3</a><br/>Format: Electronic Resources<br/>Bonding in Microsystem Technologyent://SD_ILS/0/SD_ILS:5069342024-05-30T02:10:49Z2024-05-30T02:10:49Zby Dziuban, Jan A. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4589-1">http://dx.doi.org/10.1007/1-4020-4589-1</a><br/>Format: Electronic Resources<br/>Nanotribology and Nanomechanics An Introductionent://SD_ILS/0/SD_ILS:5093982024-05-30T02:10:49Z2024-05-30T02:10:49Zby Bhushan, Bharat. editor.<br/><a href="http://dx.doi.org/10.1007/3-540-28248-3">http://dx.doi.org/10.1007/3-540-28248-3</a><br/>Format: Electronic Resources<br/>Ferroelectric Thin Films Basic Properties and Device Physics for Memory Applicationsent://SD_ILS/0/SD_ILS:5099632024-05-30T02:10:49Z2024-05-30T02:10:49Zby Okuyama, Masanori. editor.<br/><a href="http://dx.doi.org/10.1007/b99517">http://dx.doi.org/10.1007/b99517</a><br/>Format: Electronic Resources<br/>Materials for Information Technology Devices, Interconnects and Packagingent://SD_ILS/0/SD_ILS:5084652024-05-30T02:10:49Z2024-05-30T02:10:49Zby Zschech, Ehrenfried. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-235-7">http://dx.doi.org/10.1007/1-84628-235-7</a><br/>Format: Electronic Resources<br/>