Search Results for - Narrowed by: Microscopy. - Nanotechnology. - Surfaces (Physics).SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dSUBJECT$002509Subject$002509Microscopy.$002509Microscopy.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026ps$003d300?2024-06-21T04:05:03ZA Beginners' Guide to Scanning Electron Microscopyent://SD_ILS/0/SD_ILS:20833782024-06-21T04:05:03Z2024-06-21T04:05:03Zby Ul-Hamid, Anwar. author.<br/><a href="https://doi.org/10.1007/978-3-319-98482-7">https://doi.org/10.1007/978-3-319-98482-7</a><br/>Format: Electronic Resources<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:20838412024-06-21T04:05:03Z2024-06-21T04:05:03Zby Egerton, R.F. author.<br/><a href="https://doi.org/10.1007/978-3-319-39877-8">https://doi.org/10.1007/978-3-319-39877-8</a><br/>Format: Electronic Resources<br/>Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscaleent://SD_ILS/0/SD_ILS:5048002024-06-21T04:05:03Z2024-06-21T04:05:03Zby Kalinin, Sergei. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Electronic Resources<br/>Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currentsent://SD_ILS/0/SD_ILS:5054712024-06-21T04:05:03Z2024-06-21T04:05:03Zby Foster, Adam. author.<br/><a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:5044752024-06-21T04:05:03Z2024-06-21T04:05:03Zby Egerton, Ray F. author.<br/><a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Electronic Resources<br/>