Search Results for - Narrowed by: Nanotechnology. - Measurement Science, Instrumentation. SirsiDynix Enterprise https://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026qf$003dSUBJECT$002509Subject$002509Measurement$002bScience$00252C$002bInstrumentation.$002509Measurement$002bScience$00252C$002bInstrumentation.$0026ps$003d300? 2024-05-28T23:26:01Z Vacuum Technology Practice for Scientific Instruments ent://SD_ILS/0/SD_ILS:503031 2024-05-28T23:26:01Z 2024-05-28T23:26:01Z by&#160;Yoshimura, Nagamitsu. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-74433-7">http://dx.doi.org/10.1007/978-3-540-74433-7</a><br/>Format:&#160;Electronic Resources<br/> Nanoscale Devices - Fundamentals and Applications ent://SD_ILS/0/SD_ILS:507141 2024-05-28T23:26:01Z 2024-05-28T23:26:01Z by&#160;Gross, Rudolf. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-5107-4">http://dx.doi.org/10.1007/978-1-4020-5107-4</a><br/>Format:&#160;Electronic Resources<br/> PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY ent://SD_ILS/0/SD_ILS:507200 2024-05-28T23:26:01Z 2024-05-28T23:26:01Z by&#160;Pertijs, Michiel A.P. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-5258-8">http://dx.doi.org/10.1007/1-4020-5258-8</a><br/>Format:&#160;Electronic Resources<br/> Integrated Chemical Microsensor Systems in CMOS Technology ent://SD_ILS/0/SD_ILS:509216 2024-05-28T23:26:01Z 2024-05-28T23:26:01Z by&#160;Hierlemann, Andreas. author.<br/><a href="http://dx.doi.org/10.1007/b138987">http://dx.doi.org/10.1007/b138987</a><br/>Format:&#160;Electronic Resources<br/> Microscale Diagnostic Techniques ent://SD_ILS/0/SD_ILS:508878 2024-05-28T23:26:01Z 2024-05-28T23:26:01Z by&#160;Breuer, Kenneth S. editor.<br/><a href="http://dx.doi.org/10.1007/b137604">http://dx.doi.org/10.1007/b137604</a><br/>Format:&#160;Electronic Resources<br/>