Search Results for - Narrowed by: Pattern Recognition. - Kwok, James T. editor.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dSUBJECT$002509Subject$002509Pattern$002bRecognition.$002509Pattern$002bRecognition.$0026qf$003dAUTHOR$002509Author$002509Kwok$00252C$002bJames$002bT.$002beditor.$002509Kwok$00252C$002bJames$002bT.$002beditor.$0026ps$003d300?2024-05-30T02:35:42ZStructural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, SSPR & SPR 2008, Orlando, USA, December 4-6, 2008. Proceedingsent://SD_ILS/0/SD_ILS:5038262024-05-30T02:35:42Z2024-05-30T02:35:42Zby Vitoria Lobo, Niels. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-89689-0">http://dx.doi.org/10.1007/978-3-540-89689-0</a><br/>Format: Electronic Resources<br/>Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedingsent://SD_ILS/0/SD_ILS:5114702024-05-30T02:35:42Z2024-05-30T02:35:42Zby Yeung, Dit-Yan. editor.<br/><a href="http://dx.doi.org/10.1007/11815921">http://dx.doi.org/10.1007/11815921</a><br/>Format: Electronic Resources<br/>