Search Results for - Narrowed by: Pattern Recognition. - Performance and Reliability.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dSUBJECT$002509Subject$002509Pattern$002bRecognition.$002509Pattern$002bRecognition.$0026qf$003dSUBJECT$002509Subject$002509Performance$002band$002bReliability.$002509Performance$002band$002bReliability.$0026ps$003d300$0026isd$003dtrue?2024-09-25T06:28:25ZModelling, Computation and Optimization in Information Systems and Management Sciences Second International Conference MCO 2008, Metz, France - Luxembourg, September 8-10, 2008. Proceedingsent://SD_ILS/0/SD_ILS:5036922024-09-25T06:28:25Z2024-09-25T06:28:25Zby Le Thi, Hoai An. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-87477-5">http://dx.doi.org/10.1007/978-3-540-87477-5</a><br/>Format: Electronic Resources<br/>Computational Intelligence in Fault Diagnosisent://SD_ILS/0/SD_ILS:5086132024-09-25T06:28:25Z2024-09-25T06:28:25Zby Palade, Vasile. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-84628-631-5">http://dx.doi.org/10.1007/978-1-84628-631-5</a><br/>Format: Electronic Resources<br/>Formal Aspects in Security and Trust IFIP TC1 WG1.7 Workshop on Formal Aspects in Security and Trust (FAST), World Computer Congress, August 22–27, 2004, Toulouse, Franceent://SD_ILS/0/SD_ILS:5042642024-09-25T06:28:25Z2024-09-25T06:28:25Zby Dimitrakos, Theo. editor.<br/><a href="http://dx.doi.org/10.1007/b104303">http://dx.doi.org/10.1007/b104303</a><br/>Format: Electronic Resources<br/>