Search Results for - Narrowed by: Statistics. - Distribution (Probability theory). SirsiDynix Enterprise https://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dSUBJECT$002509Subject$002509Statistics.$002509Statistics.$0026qf$003dSUBJECT$002509Subject$002509Distribution$002b$002528Probability$002btheory$002529.$002509Distribution$002b$002528Probability$002btheory$002529.$0026ps$003d300? 2024-06-06T20:03:39Z Functional and Operatorial Statistics ent://SD_ILS/0/SD_ILS:503946 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Dabo-Niang, Sophie. author.<br/><a href="http://dx.doi.org/10.1007/978-3-7908-2062-1">http://dx.doi.org/10.1007/978-3-7908-2062-1</a><br/>Format:&#160;Electronic Resources<br/> Recent Advances in Linear Models and Related Areas Essays in Honour of Helge Toutenburg ent://SD_ILS/0/SD_ILS:503947 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Shalabh. author.<br/><a href="http://dx.doi.org/10.1007/978-3-7908-2064-5">http://dx.doi.org/10.1007/978-3-7908-2064-5</a><br/>Format:&#160;Electronic Resources<br/> Linear Models and Generalizations Least Squares and Alternatives ent://SD_ILS/0/SD_ILS:502999 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Rao, C. Radhakrishna. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-74227-2">http://dx.doi.org/10.1007/978-3-540-74227-2</a><br/>Format:&#160;Electronic Resources<br/> Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysis ent://SD_ILS/0/SD_ILS:501735 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Limnios, Nikolaos. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format:&#160;Electronic Resources<br/> An Introduction to Queueing Theory Modeling and Analysis in Applications ent://SD_ILS/0/SD_ILS:502035 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Bhat, U. Narayan. author.<br/><a href="http://dx.doi.org/10.1007/978-0-8176-4725-4">http://dx.doi.org/10.1007/978-0-8176-4725-4</a><br/>Format:&#160;Electronic Resources<br/> Probability Models for DNA Sequence Evolution ent://SD_ILS/0/SD_ILS:501944 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Durrett, Richard. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-78168-6">http://dx.doi.org/10.1007/978-0-387-78168-6</a><br/>Format:&#160;Electronic Resources<br/> Mod&eacute;lisation et statistique spatiales ent://SD_ILS/0/SD_ILS:503494 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Gaetan, Carlo. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-79226-0">http://dx.doi.org/10.1007/978-3-540-79226-0</a><br/>Format:&#160;Electronic Resources<br/> Analysis of Integrated and Cointegrated Time Series with R ent://SD_ILS/0/SD_ILS:501859 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Pfaff, Bernhard. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-75967-8">http://dx.doi.org/10.1007/978-0-387-75967-8</a><br/>Format:&#160;Electronic Resources<br/> Survival and Event History Analysis A Process Point of View ent://SD_ILS/0/SD_ILS:501615 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Aalen, Odd O. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68560-1">http://dx.doi.org/10.1007/978-0-387-68560-1</a><br/>Format:&#160;Electronic Resources<br/> Statistical Models and Methods for Biomedical and Technical Systems ent://SD_ILS/0/SD_ILS:502020 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Vonta, Filia. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-8176-4619-6">http://dx.doi.org/10.1007/978-0-8176-4619-6</a><br/>Format:&#160;Electronic Resources<br/> Chance Rules an informal guide to probability, risk and statistics ent://SD_ILS/0/SD_ILS:501921 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Everitt, Brian. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-77415-2">http://dx.doi.org/10.1007/978-0-387-77415-2</a><br/>Format:&#160;Electronic Resources<br/> Bayesian Networks and Influence Diagrams A Guide to Construction and Analysis ent://SD_ILS/0/SD_ILS:501775 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Kj&aelig;rulff, Uffe B. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-74101-7">http://dx.doi.org/10.1007/978-0-387-74101-7</a><br/>Format:&#160;Electronic Resources<br/> Uncertainty Forecasting in Engineering ent://SD_ILS/0/SD_ILS:511460 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;M&ouml;ller, Bernd. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-37176-2">http://dx.doi.org/10.1007/978-3-540-37176-2</a><br/>Format:&#160;Electronic Resources<br/> Advances in Statistical Methods for the Health Sciences Applications to Cancer and AIDS Studies, Genome Sequence Analysis, and Survival Analysis ent://SD_ILS/0/SD_ILS:506150 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Auget, Jean-Louis. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-8176-4542-7">http://dx.doi.org/10.1007/978-0-8176-4542-7</a><br/>Format:&#160;Electronic Resources<br/> Reliability, Life Testing and the Prediction of Service Lives For Engineers and Scientists ent://SD_ILS/0/SD_ILS:505675 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Saunders, Sam C. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-48538-6">http://dx.doi.org/10.1007/978-0-387-48538-6</a><br/>Format:&#160;Electronic Resources<br/> Random Fields and Geometry ent://SD_ILS/0/SD_ILS:505662 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Adler, Robert J. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-48116-6">http://dx.doi.org/10.1007/978-0-387-48116-6</a><br/>Format:&#160;Electronic Resources<br/> Shock and Damage Models in Reliability Theory ent://SD_ILS/0/SD_ILS:508551 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Nakagawa, Toshio. author.<br/><a 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Resources<br/> Theory of Random Sets ent://SD_ILS/0/SD_ILS:508405 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Molchanov, Ilya. author.<br/><a href="http://dx.doi.org/10.1007/1-84628-150-4">http://dx.doi.org/10.1007/1-84628-150-4</a><br/>Format:&#160;Electronic Resources<br/> Statistical Modeling and Analysis for Complex Data Problems ent://SD_ILS/0/SD_ILS:504321 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Duchesne, Pierre. editor.<br/><a href="http://dx.doi.org/10.1007/b105993">http://dx.doi.org/10.1007/b105993</a><br/>Format:&#160;Electronic Resources<br/> Modeling Uncertainty An Examination of Stochastic Theory, Methods, and Applications ent://SD_ILS/0/SD_ILS:504015 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z by&#160;Dror, Moshe. editor.<br/><a href="http://dx.doi.org/10.1007/b106473">http://dx.doi.org/10.1007/b106473</a><br/>Format:&#160;Electronic Resources<br/> Probability: A Graduate Course ent://SD_ILS/0/SD_ILS:504620 2024-06-06T20:03:39Z 2024-06-06T20:03:39Z 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