Arama Sonuçları Computer software testing.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qu$003dComputer$002bsoftware$002btesting.$0026ps$003d300?dt=list2025-06-16T03:02:49ZMobile testing : an ASTQB-BCS foundation guideent://SD_ILS/0/SD_ILS:23175372025-06-16T03:02:49Z2025-06-16T03:02:49Zby Black, Rex, 1964- author.<br/><a href="https://learning.oreilly.com/library/view/~/9781780174044/?ar">https://learning.oreilly.com/library/view/~/9781780174044/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781780174044/?ar">https://go.oreilly.com/library-access/library/view/-/9781780174044/?ar</a><br/>Format: Electronic Resources<br/>Software testing : an ISTQB-BCS certified tester foundation guideent://SD_ILS/0/SD_ILS:23216092025-06-16T03:02:49Z2025-06-16T03:02:49Zby Hambling, Brian, 1946- editor.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781780174921/?ar">https://go.oreilly.com/library-access/library/view/-/9781780174921/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781780174921/?ar">https://learning.oreilly.com/library/view/~/9781780174921/?ar</a><br/>Format: Electronic Resources<br/>Software testing : an ISTQB-BCS certified tester foundation guideent://SD_ILS/0/SD_ILS:23077652025-06-16T03:02:49Z2025-06-16T03:02:49Zby Hambling, Brian, 1946- editor.<br/><a href="https://learning.oreilly.com/library/view/~/9781780172996">https://learning.oreilly.com/library/view/~/9781780172996</a>
<a href="https://learning.oreilly.com/library/view/~/9781780172996/?ar">https://learning.oreilly.com/library/view/~/9781780172996/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781780172996/?ar">https://go.oreilly.com/library-access/library/view/-/9781780172996/?ar</a><br/>Format: Electronic Resources<br/>Fundamentals of Software Testing.ent://SD_ILS/0/SD_ILS:12539472025-06-16T03:02:49Z2025-06-16T03:02:49Zby HomÃs̈, Bernard.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1120766">Click to View</a><br/>Format: Electronic Resources<br/>Practical model-based testing a tools approachent://SD_ILS/0/SD_ILS:641612025-06-16T03:02:49Z2025-06-16T03:02:49Zby Utting, Mark.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123725011">An electronic book accessible through the World Wide Web; click for information</a>
Table of contents only <a href="http://www.loc.gov/catdir/toc/ecip073/2006034511.html">http://www.loc.gov/catdir/toc/ecip073/2006034511.html</a>
Publisher description <a href="http://www.loc.gov/catdir/enhancements/fy0702/2006034511-d.html">http://www.loc.gov/catdir/enhancements/fy0702/2006034511-d.html</a><br/>Format: Electronic Resources<br/>Penetration Testing with Perl.ent://SD_ILS/0/SD_ILS:12810462025-06-16T03:02:49Z2025-06-16T03:02:49Zby Berdeaux, Douglas.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1912005">Click to View</a><br/>Format: Electronic Resources<br/>Implementing automated software testing : how to lower costs while raising qualityent://SD_ILS/0/SD_ILS:22860912025-06-16T03:02:49Z2025-06-16T03:02:49Zby Dustin, Elfriede.<br/><a href="https://learning.oreilly.com/library/view/~/9780321619600/?ar">https://learning.oreilly.com/library/view/~/9780321619600/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780321619600/?ar">https://go.oreilly.com/library-access/library/view/-/9780321619600/?ar</a><br/>Format: Electronic Resources<br/>Practical Model-Based Testing : A Tools Approach.ent://SD_ILS/0/SD_ILS:11900882025-06-16T03:02:49Z2025-06-16T03:02:49Zby Utting, Mark.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=282069">Click to View</a><br/>Format: Electronic Resources<br/>Designing and Implementing Test Automation Frameworks with QTP.ent://SD_ILS/0/SD_ILS:12634202025-06-16T03:02:49Z2025-06-16T03:02:49Zby Bhargava, Ashish.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1477488">Click to View</a><br/>Format: Electronic Resources<br/>Pragmatic software testing : becoming an effective and efficient test professionalent://SD_ILS/0/SD_ILS:22847602025-06-16T03:02:49Z2025-06-16T03:02:49Zby Black, Rex, 1964-<br/><a href="https://learning.oreilly.com/library/view/~/9780470127902">https://learning.oreilly.com/library/view/~/9780470127902</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780470127902/?ar">https://go.oreilly.com/library-access/library/view/-/9780470127902/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9780470127902/?ar">https://learning.oreilly.com/library/view/~/9780470127902/?ar</a><br/>Format: Electronic Resources<br/>Learn API testing : norms, practices, and guidelines for building effective test automationent://SD_ILS/0/SD_ILS:23338182025-06-16T03:02:49Z2025-06-16T03:02:49Zby Jain, Jagdeep, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781484281420">https://learning.oreilly.com/library/view/~/9781484281420</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781484281420/?ar">https://go.oreilly.com/library-access/library/view/-/9781484281420/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781484281420/?ar">https://learning.oreilly.com/library/view/~/9781484281420/?ar</a><br/>Format: Electronic Resources<br/>How we test software at Microsoftent://SD_ILS/0/SD_ILS:22858082025-06-16T03:02:49Z2025-06-16T03:02:49Zby Page, Alan.<br/><a href="https://learning.oreilly.com/library/view/~/9780735624252/?ar">https://learning.oreilly.com/library/view/~/9780735624252/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780735624252/?ar">https://go.oreilly.com/library-access/library/view/-/9780735624252/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9780735624252">https://learning.oreilly.com/library/view/~/9780735624252</a><br/>Format: Electronic Resources<br/>Testing object oriented systems: models patterns and toolsent://SD_ILS/0/SD_ILS:114012025-06-16T03:02:49Z2025-06-16T03:02:49Zby Binder, Robert V.<br/>Format: Books<br/>Software reliability: measurement, prediction, applicationent://SD_ILS/0/SD_ILS:21452025-06-16T03:02:49Z2025-06-16T03:02:49Zby Musa, John D.<br/>Format: Books<br/>Practical test design : selection of traditional and automated test design techniquesent://SD_ILS/0/SD_ILS:22736972025-06-16T03:02:49Z2025-06-16T03:02:49Zby Forgács, I., author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5892550">Click to View</a><br/>Format: Electronic Resources<br/>Agile testing foundations : an ISTQB Foundation level Agile tester guideent://SD_ILS/0/SD_ILS:22720952025-06-16T03:02:49Z2025-06-16T03:02:49Zby Black, Rex, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4836286">Click to View</a><br/>Format: Electronic Resources<br/>Test driven development in Ruby : a practical introduction to TDD using problem and solution domain analysisent://SD_ILS/0/SD_ILS:23463092025-06-16T03:02:49Z2025-06-16T03:02:49Zby Paranj, Bala, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4822971">Click to View</a><br/>Format: Electronic Resources<br/>Testing with JUnit : master high-quality software development driven by unit testsent://SD_ILS/0/SD_ILS:22712862025-06-16T03:02:49Z2025-06-16T03:02:49Zby Appel, Frank, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3564809">Click to View</a><br/>Format: Electronic Resources<br/>Software testing : principles and practicesent://SD_ILS/0/SD_ILS:4788112025-06-16T03:02:49Z2025-06-16T03:02:49Zby Chauhan, Naresh, author.<br/>Knovel <a href="http://app.knovel.com/hotlink/toc/id:kpSTPP0002/software-testing-principles">http://app.knovel.com/hotlink/toc/id:kpSTPP0002/software-testing-principles</a><br/>Format: Electronic Resources<br/>Software testing : concepts and operationsent://SD_ILS/0/SD_ILS:22799642025-06-16T03:02:49Z2025-06-16T03:02:49Zby Mili, Ali, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=7104400">Click to View</a><br/>Format: Electronic Resources<br/>Basiswissen modellbasierter Test : Aus- und Weiterbildung zum ISTQB Foundation Level - Certified Model-Based Testerent://SD_ILS/0/SD_ILS:23126982025-06-16T03:02:49Z2025-06-16T03:02:49Zby Winter, Mario, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781492019275/?ar">https://learning.oreilly.com/library/view/~/9781492019275/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781492019275/?ar">https://go.oreilly.com/library-access/library/view/-/9781492019275/?ar</a><br/>Format: Electronic Resources<br/>Mastering mobile test automation : master the full range of mobile automation and testing techniques to develop customized mobile automation solutionsent://SD_ILS/0/SD_ILS:22383572025-06-16T03:02:49Z2025-06-16T03:02:49Zby Louis, Feroz Pearl, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=2050743">Click to View</a><br/>Format: Electronic Resources<br/>Software testing : a craftsman's approachent://SD_ILS/0/SD_ILS:23057032025-06-16T03:02:49Z2025-06-16T03:02:49Zby Jorgensen, Paul, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781466560680/?ar">https://go.oreilly.com/library-access/library/view/-/9781466560680/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781466560680/?ar">https://learning.oreilly.com/library/view/~/9781466560680/?ar</a><br/>Format: Electronic Resources<br/>Advances in computers. Volume 89ent://SD_ILS/0/SD_ILS:23014312025-06-16T03:02:49Z2025-06-16T03:02:49Zby Memon, Atif M.<br/><a href="https://learning.oreilly.com/library/view/~/9780124080942/?ar">https://learning.oreilly.com/library/view/~/9780124080942/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780124080942/?ar">https://go.oreilly.com/library-access/library/view/-/9780124080942/?ar</a><br/>Format: Electronic Resources<br/>Praxiswissen Softwaretest : Testmanagement : Aus- und Weiterbildung zum Certified Testerent://SD_ILS/0/SD_ILS:22978702025-06-16T03:02:49Z2025-06-16T03:02:49Zby Spillner, Andreas.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781457170935/?ar">https://go.oreilly.com/library-access/library/view/-/9781457170935/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781457170935/?ar">https://learning.oreilly.com/library/view/~/9781457170935/?ar</a><br/>Format: Electronic Resources<br/>Exploratory software testingent://SD_ILS/0/SD_ILS:22882472025-06-16T03:02:49Z2025-06-16T03:02:49Zby Whittaker, James A., 1965-<br/><a href="https://learning.oreilly.com/library/view/~/9780321647863/?ar">https://learning.oreilly.com/library/view/~/9780321647863/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780321647863/?ar">https://go.oreilly.com/library-access/library/view/-/9780321647863/?ar</a><br/>Format: Electronic Resources<br/>Basiswissen Testautomatisierung : Konzepte, Methoden und Techniken.ent://SD_ILS/0/SD_ILS:22951172025-06-16T03:02:49Z2025-06-16T03:02:49Zby Seidl, Richard.<br/><a href="https://learning.oreilly.com/library/view/~/9781457170652/?ar">https://learning.oreilly.com/library/view/~/9781457170652/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781457170652/?ar">https://go.oreilly.com/library-access/library/view/-/9781457170652/?ar</a><br/>Format: Electronic Resources<br/>The art of software testingent://SD_ILS/0/SD_ILS:23434772025-06-16T03:02:49Z2025-06-16T03:02:49Zby Myers, Glenford J., 1946-<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=697721">Click to View</a><br/>Format: Electronic Resources<br/>Software testing : principles and practicesent://SD_ILS/0/SD_ILS:22878382025-06-16T03:02:49Z2025-06-16T03:02:49Zby Desikan, Srinivasan.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9788177581218/?ar">https://go.oreilly.com/library-access/library/view/-/9788177581218/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9788177581218/?ar">https://learning.oreilly.com/library/view/~/9788177581218/?ar</a><br/>Format: Electronic Resources<br/>Agile testing essentials : LiveLessonsent://SD_ILS/0/SD_ILS:23132282025-06-16T03:02:49Z2025-06-16T03:02:49Zby Crispin, Lisa, on-screen presenter.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780134683287/?ar">https://go.oreilly.com/library-access/library/view/-/9780134683287/?ar</a>
<a href="https://learning.oreilly.com/videos/~/9780134683287/?ar">https://learning.oreilly.com/videos/~/9780134683287/?ar</a><br/>Format: Electronic Resources<br/>Mockito for spring : learn all you need to know about the spring framework and how to unit test your projects with mockitoent://SD_ILS/0/SD_ILS:13866932025-06-16T03:02:49Z2025-06-16T03:02:49Zby Acharya, Sujoy, author.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1969464">Click to View</a><br/>Format: Electronic Resources<br/>Open source fuzzing toolsent://SD_ILS/0/SD_ILS:22850852025-06-16T03:02:49Z2025-06-16T03:02:49Zby Evron, Gadi.<br/><a href="https://learning.oreilly.com/library/view/~/9781597491952/?ar">https://learning.oreilly.com/library/view/~/9781597491952/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781597491952/?ar">https://go.oreilly.com/library-access/library/view/-/9781597491952/?ar</a><br/>Format: Electronic Resources<br/>UAT defined : a guide to practical user acceptance testing as a silver bulletent://SD_ILS/0/SD_ILS:22829002025-06-16T03:02:49Z2025-06-16T03:02:49Zby Cimperman, Rob.<br/><a href="https://learning.oreilly.com/library/view/~/0321498143/?ar">https://learning.oreilly.com/library/view/~/0321498143/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/0321498143/?ar">https://go.oreilly.com/library-access/library/view/-/0321498143/?ar</a><br/>Format: Electronic Resources<br/>Full stack testing : a practical guide for delivering high quality softwareent://SD_ILS/0/SD_ILS:23323872025-06-16T03:02:49Z2025-06-16T03:02:49Zby Mohan, Gayathri, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781098108120">https://learning.oreilly.com/library/view/~/9781098108120</a>
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<a href="https://learning.oreilly.com/library/view/~/9781098108120/?ar">https://learning.oreilly.com/library/view/~/9781098108120/?ar</a><br/>Format: Electronic Resources<br/>Testdaten und Testdatenmanagement : Vorgehen, Methoden und Praxisent://SD_ILS/0/SD_ILS:23156952025-06-16T03:02:49Z2025-06-16T03:02:49Zby Albrecht-Zölch, Janet, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781492066057">https://learning.oreilly.com/library/view/~/9781492066057</a>
<a href="https://learning.oreilly.com/library/view/~/9781492066057/?ar">https://learning.oreilly.com/library/view/~/9781492066057/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781492066057/?ar">https://go.oreilly.com/library-access/library/view/-/9781492066057/?ar</a><br/>Format: Electronic Resources<br/>Test-driven development for iOS : using continuous integration and continuous deliveryent://SD_ILS/0/SD_ILS:23123312025-06-16T03:02:49Z2025-06-16T03:02:49Zby Shum, Cassie, speaker.<br/><a href="https://learning.oreilly.com/videos/~/9780134675619/?ar">https://learning.oreilly.com/videos/~/9780134675619/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780134675619/?ar">https://go.oreilly.com/library-access/library/view/-/9780134675619/?ar</a><br/>Format: Electronic Resources<br/>More agile testing : learning journeys for the whole teament://SD_ILS/0/SD_ILS:23047842025-06-16T03:02:49Z2025-06-16T03:02:49Zby Gregory, Janet, 1953-<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780133749571/?ar">https://go.oreilly.com/library-access/library/view/-/9780133749571/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9780133749571/?ar">https://learning.oreilly.com/library/view/~/9780133749571/?ar</a><br/>Format: Electronic Resources<br/>Software testing foundations : a study guide for the certified tester exament://SD_ILS/0/SD_ILS:23029202025-06-16T03:02:49Z2025-06-16T03:02:49Zby Spillner, Andreas.<br/><a href="https://learning.oreilly.com/library/view/~/9781492001454/?ar">https://learning.oreilly.com/library/view/~/9781492001454/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781492001454/?ar">https://go.oreilly.com/library-access/library/view/-/9781492001454/?ar</a><br/>Format: Electronic Resources<br/>Foundations of software testing : fundamental algorithms and techniquesent://SD_ILS/0/SD_ILS:23041622025-06-16T03:02:49Z2025-06-16T03:02:49Zby Mathur, Aditya.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9788131794760/?ar">https://go.oreilly.com/library-access/library/view/-/9788131794760/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9788131794760/?ar">https://learning.oreilly.com/library/view/~/9788131794760/?ar</a><br/>Format: Electronic Resources<br/>Managing the testing process : practical tools and techniques for managing software and hardware testingent://SD_ILS/0/SD_ILS:22894552025-06-16T03:02:49Z2025-06-16T03:02:49Zby Black, Rex, 1964-<br/><a href="https://learning.oreilly.com/library/view/~/9781118074015/?ar">https://learning.oreilly.com/library/view/~/9781118074015/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781118074015/?ar">https://go.oreilly.com/library-access/library/view/-/9781118074015/?ar</a><br/>Format: Electronic Resources<br/>Software testingent://SD_ILS/0/SD_ILS:22833682025-06-16T03:02:49Z2025-06-16T03:02:49Zby Patton, Ron.<br/><a href="https://go.oreilly.com/library-access/library/view/-/0672327988/?ar">https://go.oreilly.com/library-access/library/view/-/0672327988/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/0672327988">https://learning.oreilly.com/library/view/~/0672327988</a>
<a href="https://learning.oreilly.com/library/view/~/0672327988/?ar">https://learning.oreilly.com/library/view/~/0672327988/?ar</a><br/>Format: Electronic Resources<br/>Automated unit testing with ABAP : a practical approachent://SD_ILS/0/SD_ILS:23285732025-06-16T03:02:49Z2025-06-16T03:02:49Zby McDonough, James E.<br/><a href="https://learning.oreilly.com/library/view/~/9781484269510/?ar">https://learning.oreilly.com/library/view/~/9781484269510/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781484269510">https://learning.oreilly.com/library/view/~/9781484269510</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781484269510/?ar">https://go.oreilly.com/library-access/library/view/-/9781484269510/?ar</a><br/>Format: Electronic Resources<br/>Test-driven development in Swift : compile better code with XCTest and TDDent://SD_ILS/0/SD_ILS:23293092025-06-16T03:02:49Z2025-06-16T03:02:49Zby Lodi, Gio.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781484270028/?ar">https://go.oreilly.com/library-access/library/view/-/9781484270028/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781484270028/?ar">https://learning.oreilly.com/library/view/~/9781484270028/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781484270028">https://learning.oreilly.com/library/view/~/9781484270028</a><br/>Format: Electronic Resources<br/>Hands-on test management with Jira : end-to-end test management with Zephyr, synapseRT, and Jenkins in Jiraent://SD_ILS/0/SD_ILS:23192022025-06-16T03:02:49Z2025-06-16T03:02:49Zby Atar, Afsana, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781789954524/?ar">https://learning.oreilly.com/library/view/~/9781789954524/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781789954524">https://learning.oreilly.com/library/view/~/9781789954524</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781789954524/?ar">https://go.oreilly.com/library-access/library/view/-/9781789954524/?ar</a><br/>Format: Electronic Resources<br/>Complete guide to test automation : techniques, practices, and patterns for building and maintaining effective software projectsent://SD_ILS/0/SD_ILS:23174522025-06-16T03:02:49Z2025-06-16T03:02:49Zby Axelrod, Arnon, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781484238325">https://learning.oreilly.com/library/view/~/9781484238325</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781484238325/?ar">https://go.oreilly.com/library-access/library/view/-/9781484238325/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781430229438">https://learning.oreilly.com/library/view/~/9781430229438</a><br/>Format: Electronic Resources<br/>Beautiful testingent://SD_ILS/0/SD_ILS:22895782025-06-16T03:02:49Z2025-06-16T03:02:49Zby Riley, Tim, 1962-<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780596806934/?ar">https://go.oreilly.com/library-access/library/view/-/9780596806934/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9780596806934">https://learning.oreilly.com/library/view/~/9780596806934</a><br/>Format: Electronic Resources<br/>Software testing as a serviceent://SD_ILS/0/SD_ILS:20775002025-06-16T03:02:49Z2025-06-16T03:02:49Zby Ahmed, Ashfaque., author.<br/><a href="https://www.taylorfrancis.com/books/9781420099577">Click here to view.</a><br/>Format: Books<br/>Introduction to software testingent://SD_ILS/0/SD_ILS:1074052025-06-16T03:02:49Z2025-06-16T03:02:49Zby Ammann, Paul, 1961- author.<br/>Table of contents only <a href="http://www.loc.gov/catdir/enhancements/fy0803/2007035077-t.html">http://www.loc.gov/catdir/enhancements/fy0803/2007035077-t.html</a>
Publisher description <a href="http://www.loc.gov/catdir/enhancements/fy0803/2007035077-d.html">http://www.loc.gov/catdir/enhancements/fy0803/2007035077-d.html</a><br/>Format: Books<br/>How to break Web software : functional and security testing of Web applications and Web servicesent://SD_ILS/0/SD_ILS:22864322025-06-16T03:02:49Z2025-06-16T03:02:49Zby Andrews, Mike.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780321657497/?ar">https://go.oreilly.com/library-access/library/view/-/9780321657497/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9780321657497/?ar">https://learning.oreilly.com/library/view/~/9780321657497/?ar</a><br/>Format: Electronic Resources<br/>The art of software testingent://SD_ILS/0/SD_ILS:22822672025-06-16T03:02:49Z2025-06-16T03:02:49Zby Myers, Glenford J., 1946-<br/><a href="https://learning.oreilly.com/library/view/~/9780471469124/?ar">https://learning.oreilly.com/library/view/~/9780471469124/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9780471469124">https://learning.oreilly.com/library/view/~/9780471469124</a><br/>Format: Electronic Resources<br/>Unit test frameworksent://SD_ILS/0/SD_ILS:22890742025-06-16T03:02:49Z2025-06-16T03:02:49Zby Hamill, Paul, 1970-<br/><a href="https://go.oreilly.com/library-access/library/view/-/0596006896/?ar">https://go.oreilly.com/library-access/library/view/-/0596006896/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/0596006896">https://learning.oreilly.com/library/view/~/0596006896</a><br/>Format: Electronic Resources<br/>Managing the testing process : practical tools and techniques for managing hardware and software testingent://SD_ILS/0/SD_ILS:22809452025-06-16T03:02:49Z2025-06-16T03:02:49Zby Black, Rex, 1964-<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780471223986/?ar">https://go.oreilly.com/library-access/library/view/-/9780471223986/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9780471223986">https://learning.oreilly.com/library/view/~/9780471223986</a><br/>Format: Electronic Resources<br/>Lessons learned in software testing : a context-driven approachent://SD_ILS/0/SD_ILS:22928102025-06-16T03:02:49Z2025-06-16T03:02:49Zby Kaner, Cem.<br/><a href="https://learning.oreilly.com/library/view/~/9780471081128">https://learning.oreilly.com/library/view/~/9780471081128</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780471081128/?ar">https://go.oreilly.com/library-access/library/view/-/9780471081128/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781680506556/?ar">https://learning.oreilly.com/library/view/~/9781680506556/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781680506556/?ar">https://go.oreilly.com/library-access/library/view/-/9781680506556/?ar</a><br/>Format: Electronic Resources<br/>Test driven development in Ruby : a practical introduction to TDD using problem and solution domain analysisent://SD_ILS/0/SD_ILS:23128482025-06-16T03:02:49Z2025-06-16T03:02:49Zby Paranj, Bala, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781484226384">https://learning.oreilly.com/library/view/~/9781484226384</a>
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<a href="https://learning.oreilly.com/library/view/~/9781847194824">https://learning.oreilly.com/library/view/~/9781847194824</a><br/>Format: Electronic Resources<br/>A Practical Guide to Testing Object-Oriented Software.ent://SD_ILS/0/SD_ILS:23178992025-06-16T03:02:49Z2025-06-16T03:02:49Zby McGregor, John D., author.<br/><a href="https://learning.oreilly.com/library/view/~/0201325640/?ar">https://learning.oreilly.com/library/view/~/0201325640/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781558608689">https://learning.oreilly.com/library/view/~/9781558608689</a><br/>Format: Electronic Resources<br/>Practitioner's Guide to Software Test Design.ent://SD_ILS/0/SD_ILS:11833972025-06-16T03:02:49Z2025-06-16T03:02:49Zby Copeland, Lee.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=227688">Click to View</a><br/>Format: Electronic Resources<br/>Effectiveness of using clustering for test case prioritizationent://SD_ILS/0/SD_ILS:21338672025-06-16T03:02:49Z2025-06-16T03:02:49Zby Günel, Can, author.<br/><a href="https://hdl.handle.net/11147/7480">Access to Electronic Versiyon.</a><br/>Format: Manuscript<br/>Test case generation from cause effect graphsent://SD_ILS/0/SD_ILS:13522792025-06-16T03:02:49Z2025-06-16T03:02:49Zby Kavzak Ufuktepe, Deniz, author.<br/><a href="http://hdl.handle.net/11147/5704">Access to Electronic Versiyon.</a><br/>Format: Manuscript<br/>Software Testing for Conventional and Logic Programming.ent://SD_ILS/0/SD_ILS:12986252025-06-16T03:02:49Z2025-06-16T03:02:49Zby Jack, Oliver.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3040672">Click to View</a><br/>Format: Electronic Resources<br/>A model-based test generation approach for agile software product linesent://SD_ILS/0/SD_ILS:21464212025-06-16T03:02:49Z2025-06-16T03:02:49Zby Öztürk, Dilek, author.<br/><a href="https://hdl.handle.net/11147/10818">Access to Electronic Versiyon.</a><br/>Format: Manuscript<br/>Mutation analysis of specification-based contracts in software testingent://SD_ILS/0/SD_ILS:22048992025-06-16T03:02:49Z2025-06-16T03:02:49Zby Khalilov, Abbas, author.<br/><a href="https://hdl.handle.net/11147/11152">Access to Electronic Versiyon.</a><br/>Format: Manuscript<br/>Unit testing in Java how tests drive the codeent://SD_ILS/0/SD_ILS:659692025-06-16T03:02:49Z2025-06-16T03:02:49Zby Link, Johannes.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781558608689">An electronic book accessible through the World Wide Web; click for information</a>
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Table of contents <a href="http://www.loc.gov/catdir/toc/els031/2003044567.html">http://www.loc.gov/catdir/toc/els031/2003044567.html</a><br/>Format: Electronic Resources<br/>Jasmine JavaScript Testing.ent://SD_ILS/0/SD_ILS:12616272025-06-16T03:02:49Z2025-06-16T03:02:49Zby Ragonha, Paulo.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1362589">Click to View</a><br/>Format: Electronic Resources<br/>Open Source Fuzzing Tools.ent://SD_ILS/0/SD_ILS:11966992025-06-16T03:02:49Z2025-06-16T03:02:49Zby Rathaus, Noam.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=330152">Click to View</a><br/>Format: Electronic Resources<br/>Software Testing Fundamentals : Methods and Metrics.ent://SD_ILS/0/SD_ILS:11852552025-06-16T03:02:49Z2025-06-16T03:02:49Zby Hutcheson, Marnie L.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=243712">Click to View</a><br/>Format: Electronic Resources<br/>Arquillian Testing Guide.ent://SD_ILS/0/SD_ILS:12557442025-06-16T03:02:49Z2025-06-16T03:02:49Zby Ament, John.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1142884">Click to View</a><br/>Format: Electronic Resources<br/>Software Testing using Visual Studio 2012.ent://SD_ILS/0/SD_ILS:12598072025-06-16T03:02:49Z2025-06-16T03:02:49Zby Subashni, S.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1236050">Click to View</a><br/>Format: Electronic Resources<br/>Software Testing with Visual Studio Team System 2008.ent://SD_ILS/0/SD_ILS:12468542025-06-16T03:02:49Z2025-06-16T03:02:49Zby Kumar, N Satheesh.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=979958">Click to View</a><br/>Format: Electronic Resources<br/>Software Testing using Visual Studio 2010.ent://SD_ILS/0/SD_ILS:12459602025-06-16T03:02:49Z2025-06-16T03:02:49Zby Kumar, N. Satheesh.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=951152">Click to View</a><br/>Format: Electronic Resources<br/>Testing IT : An Off-the-Shelf Software Testing Process.ent://SD_ILS/0/SD_ILS:11779752025-06-16T03:02:49Z2025-06-16T03:02:49Zby Watkins, John.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=164738">Click to View</a><br/>Format: Electronic Resources<br/>Hands-on automation testing with Java for beginners : build automation testing frameworks from scratch with Javaent://SD_ILS/0/SD_ILS:22776072025-06-16T03:02:49Z2025-06-16T03:02:49Zby Shetty, Rahul, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5532294">Click to View</a><br/>Format: Electronic Resources<br/>Basiswissen Testautomatisierung : Konzepte, Methoden und Technikenent://SD_ILS/0/SD_ILS:23077122025-06-16T03:02:49Z2025-06-16T03:02:49Zby Bucsics, Thomas, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781457194924/?ar">https://go.oreilly.com/library-access/library/view/-/9781457194924/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781457194924/?ar">https://learning.oreilly.com/library/view/~/9781457194924/?ar</a><br/>Format: Electronic Resources<br/>Hands-on automation testing with Java for beginners : build automation testing frameworks from scratch with Javaent://SD_ILS/0/SD_ILS:23177992025-06-16T03:02:49Z2025-06-16T03:02:49Zby Shetty, Rahul, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781789534603/?ar">https://learning.oreilly.com/library/view/~/9781789534603/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781789534603/?ar">https://go.oreilly.com/library-access/library/view/-/9781789534603/?ar</a><br/>Format: Electronic Resources<br/>Common system and software testing pitfalls : how to prevent and mitigate them : descriptions, symptoms, consequences, causes, and recommendationsent://SD_ILS/0/SD_ILS:23023582025-06-16T03:02:49Z2025-06-16T03:02:49Zby Firesmith, Donald G., 1952-<br/><a href="https://learning.oreilly.com/library/view/~/9780133748703/?ar">https://learning.oreilly.com/library/view/~/9780133748703/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780133748703/?ar">https://go.oreilly.com/library-access/library/view/-/9780133748703/?ar</a><br/>Format: Electronic Resources<br/>Software testing with Visual studio 2010ent://SD_ILS/0/SD_ILS:22916372025-06-16T03:02:49Z2025-06-16T03:02:49Zby Levinson, Jeff.<br/><a href="https://learning.oreilly.com/library/view/~/9780132180634/?ar">https://learning.oreilly.com/library/view/~/9780132180634/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780132180634/?ar">https://go.oreilly.com/library-access/library/view/-/9780132180634/?ar</a><br/>Format: Electronic Resources<br/>Automated software testing : introduction, management, and performanceent://SD_ILS/0/SD_ILS:22900942025-06-16T03:02:49Z2025-06-16T03:02:49Zby Dustin, Elfriede.<br/><a href="https://learning.oreilly.com/library/view/~/0201432870/?ar">https://learning.oreilly.com/library/view/~/0201432870/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/0201432870/?ar">https://go.oreilly.com/library-access/library/view/-/0201432870/?ar</a><br/>Format: Electronic Resources<br/>Practical security automation and testing : tools and techniques for automated security scanning and testing in DevSecOpsent://SD_ILS/0/SD_ILS:23190962025-06-16T03:02:49Z2025-06-16T03:02:49Zby Hsu, Tony Hsiang-Chih, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781789802023/?ar">https://learning.oreilly.com/library/view/~/9781789802023/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781789802023/?ar">https://go.oreilly.com/library-access/library/view/-/9781789802023/?ar</a><br/>Format: Electronic Resources<br/>Boozang from the Trenches : Learn Test Automation with Boozang in an Enterprise Environmentent://SD_ILS/0/SD_ILS:23353822025-06-16T03:02:49Z2025-06-16T03:02:49Zby Pucciani, Gianni.<br/><a href="https://learning.oreilly.com/library/view/~/9781484290101">https://learning.oreilly.com/library/view/~/9781484290101</a>
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<a href="https://go.oreilly.com/library-access/library/view/-/9781484290101/?ar">https://go.oreilly.com/library-access/library/view/-/9781484290101/?ar</a><br/>Format: Electronic Resources<br/>Advanced software testing. Vol. 1 : guide to the ISTQB advanced certification as an advanced technical test analystent://SD_ILS/0/SD_ILS:23097972025-06-16T03:02:49Z2025-06-16T03:02:49Zby Black, Rex, 1964- author.<br/><a href="https://learning.oreilly.com/library/view/~/9781457189517/?ar">https://learning.oreilly.com/library/view/~/9781457189517/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781457189517/?ar">https://go.oreilly.com/library-access/library/view/-/9781457189517/?ar</a><br/>Format: Electronic Resources<br/>Robot Framework Test Automation.ent://SD_ILS/0/SD_ILS:23007432025-06-16T03:02:49Z2025-06-16T03:02:49Zby Bisht, Sumit.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781783283033/?ar">https://go.oreilly.com/library-access/library/view/-/9781783283033/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781484231623">https://learning.oreilly.com/library/view/~/9781484231623</a><br/>Format: Electronic Resources<br/>Test Automation Engineering Handbook Learn and Implement Techniques for Building Robust Test Automation Frameworksent://SD_ILS/0/SD_ILS:23354152025-06-16T03:02:49Z2025-06-16T03:02:49Zby Sambamurthy, Manikandan, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781804615492/?ar">https://learning.oreilly.com/library/view/~/9781804615492/?ar</a>
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<a href="https://go.oreilly.com/library-access/library/view/-/9781804615492/?ar">https://go.oreilly.com/library-access/library/view/-/9781804615492/?ar</a><br/>Format: Electronic Resources<br/>Software testing 2020 : preparing for new rolesent://SD_ILS/0/SD_ILS:20774582025-06-16T03:02:49Z2025-06-16T03:02:49Zby Sharma, Mukesh (Software testing engineer), author.<br/><a href="https://www.taylorfrancis.com/books/9781315378008">Click here to view.</a><br/>Format: Books<br/>Just Enough Software Test Automation.ent://SD_ILS/0/SD_ILS:23179322025-06-16T03:02:49Z2025-06-16T03:02:49Zby Mosley, Daniel J., author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/0130084689/?ar">https://go.oreilly.com/library-access/library/view/-/0130084689/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/0130084689/?ar">https://learning.oreilly.com/library/view/~/0130084689/?ar</a><br/>Format: Electronic Resources<br/>Selenium WebDriver recipes in C#ent://SD_ILS/0/SD_ILS:23097092025-06-16T03:02:49Z2025-06-16T03:02:49Zby Zhan, Zhimin, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781484217429/?ar">https://learning.oreilly.com/library/view/~/9781484217429/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781484217429/?ar">https://go.oreilly.com/library-access/library/view/-/9781484217429/?ar</a><br/>Format: Electronic Resources<br/>Advanced automated software testing frameworks for refined practiceent://SD_ILS/0/SD_ILS:4763532025-06-16T03:02:49Z2025-06-16T03:02:49Zby Alsmadi, Izzat, 1972-<br/>Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpAASTFRPF/viewerType:toc/">http://app.knovel.com/web/toc.v/cid:kpAASTFRPF/viewerType:toc/</a><br/>Format: Electronic Resources<br/>Automated Database Applications Testing : Specification Representation for Automated Reasoning.ent://SD_ILS/0/SD_ILS:12304462025-06-16T03:02:49Z2025-06-16T03:02:49Zby Mikhail, Rana Farid.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=731063">Click to View</a><br/>Format: Electronic Resources<br/>TestComplete Cookbook.ent://SD_ILS/0/SD_ILS:12641262025-06-16T03:02:49Z2025-06-16T03:02:49Zby Alpaev, Gennadiy.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1531992">Click to View</a><br/>Format: Electronic Resources<br/>Software-Test für Embedded Systems : ein Praxishandbuch für Entwickler, Tester und technische Projektleiterent://SD_ILS/0/SD_ILS:23145942025-06-16T03:02:49Z2025-06-16T03:02:49Zby Grünfelder, Stephan, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781492063902/?ar">https://learning.oreilly.com/library/view/~/9781492063902/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781492063902/?ar">https://go.oreilly.com/library-access/library/view/-/9781492063902/?ar</a><br/>Format: Electronic Resources<br/>Software testing as a serviceent://SD_ILS/0/SD_ILS:23236252025-06-16T03:02:49Z2025-06-16T03:02:49Zby Ahmed, Ashfaque, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781420099577">https://learning.oreilly.com/library/view/~/9781420099577</a>
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<a href="https://go.oreilly.com/library-access/library/view/-/9781420099577/?ar">https://go.oreilly.com/library-access/library/view/-/9781420099577/?ar</a><br/>Format: Electronic Resources<br/>Critical Testing Processes : Plan, Prepare, Perform, Perfectent://SD_ILS/0/SD_ILS:23197652025-06-16T03:02:49Z2025-06-16T03:02:49Zby Black, Rex, author.<br/><a href="https://learning.oreilly.com/library/view/~/0201748681">https://learning.oreilly.com/library/view/~/0201748681</a>
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<a href="https://learning.oreilly.com/videos/~/9781789616569/?ar">https://learning.oreilly.com/videos/~/9781789616569/?ar</a><br/>Format: Electronic Resources<br/>Basiswissen Softwaretest : Aus- und Weiterbildung zum Certified Tester Foundation Level nach ISTQB-Standardent://SD_ILS/0/SD_ILS:23211682025-06-16T03:02:49Z2025-06-16T03:02:49Zby Spillner, Andreas, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781492072164/?ar">https://go.oreilly.com/library-access/library/view/-/9781492072164/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781492072164/?ar">https://learning.oreilly.com/library/view/~/9781492072164/?ar</a><br/>Format: Electronic Resources<br/>Basiswissen Softwaretest : Aus- und Weiterbildung zum Certified Tester : Foundation Level nach ISTQB-Standardent://SD_ILS/0/SD_ILS:22978592025-06-16T03:02:49Z2025-06-16T03:02:49Zby Spillner, Andreas.<br/><a href="https://learning.oreilly.com/library/view/~/9781457170638/?ar">https://learning.oreilly.com/library/view/~/9781457170638/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781457170638/?ar">https://go.oreilly.com/library-access/library/view/-/9781457170638/?ar</a><br/>Format: Electronic Resources<br/>Software quality assurance : integrating testing, security, and auditent://SD_ILS/0/SD_ILS:23116742025-06-16T03:02:49Z2025-06-16T03:02:49Zby Mahfuz, Abu Sayed, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781498735551/?ar">https://learning.oreilly.com/library/view/~/9781498735551/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781498735551/?ar">https://go.oreilly.com/library-access/library/view/-/9781498735551/?ar</a><br/>Format: Electronic Resources<br/>Experiences of test automation : case studies of software test automationent://SD_ILS/0/SD_ILS:22937082025-06-16T03:02:49Z2025-06-16T03:02:49Zby Graham, Dorothy, 1944-<br/><a href="https://learning.oreilly.com/library/view/~/9780132776608/?ar">https://learning.oreilly.com/library/view/~/9780132776608/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780132776608/?ar">https://go.oreilly.com/library-access/library/view/-/9780132776608/?ar</a><br/>Format: Electronic Resources<br/>The expert test manager : guide to the ISTQB expert level certificationent://SD_ILS/0/SD_ILS:23159312025-06-16T03:02:49Z2025-06-16T03:02:49Zby Black, Rex, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781492018742/?ar">https://go.oreilly.com/library-access/library/view/-/9781492018742/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781492018742/?ar">https://learning.oreilly.com/library/view/~/9781492018742/?ar</a><br/>Format: Electronic Resources<br/>The software test engineer's handbook : a study guide for the ISTQB test analyst and technical test analyst advanced level certificates 2012ent://SD_ILS/0/SD_ILS:23038032025-06-16T03:02:49Z2025-06-16T03:02:49Zby Bath, Graham, 1954-<br/><a href="https://learning.oreilly.com/library/view/~/9781492014706/?ar">https://learning.oreilly.com/library/view/~/9781492014706/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781492014706/?ar">https://go.oreilly.com/library-access/library/view/-/9781492014706/?ar</a><br/>Format: Electronic Resources<br/>Software testing : an ISTQB-ISEB foundation guideent://SD_ILS/0/SD_ILS:22946142025-06-16T03:02:49Z2025-06-16T03:02:49Zby Hambling, Brian, 1946-<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781906124762/?ar">https://go.oreilly.com/library-access/library/view/-/9781906124762/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781484272558/?ar">https://learning.oreilly.com/library/view/~/9781484272558/?ar</a><br/>Format: Electronic Resources<br/>Improving the test process : implementing improvement and change--a study guide for the ISTQB expert level moduleent://SD_ILS/0/SD_ILS:23018582025-06-16T03:02:49Z2025-06-16T03:02:49Zby Bath, Graham, 1954-<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781492001300/?ar">https://go.oreilly.com/library-access/library/view/-/9781492001300/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781492001300/?ar">https://learning.oreilly.com/library/view/~/9781492001300/?ar</a><br/>Format: Electronic Resources<br/>Software testing : an ISEB intermediate certificateent://SD_ILS/0/SD_ILS:23176942025-06-16T03:02:49Z2025-06-16T03:02:49Zby Hambling, Brian.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781906124137/?ar">https://go.oreilly.com/library-access/library/view/-/9781906124137/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781906124137">https://learning.oreilly.com/library/view/~/9781906124137</a><br/>Format: Electronic Resources<br/>Basiswissen Sicherheitstests : Aus- und Weiterbildung zum ISTQB Advanced Level Specialist-Certified Security Testerent://SD_ILS/0/SD_ILS:23211692025-06-16T03:02:49Z2025-06-16T03:02:49Zby Simon, Frank, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781492072171">https://learning.oreilly.com/library/view/~/9781492072171</a>
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<a href="https://learning.oreilly.com/library/view/~/9781492072171/?ar">https://learning.oreilly.com/library/view/~/9781492072171/?ar</a><br/>Format: Electronic Resources<br/>Agile testing foundations : an ISTQB Foundation level agile tester guideent://SD_ILS/0/SD_ILS:23137752025-06-16T03:02:49Z2025-06-16T03:02:49Zby Black, Rex, 1964- editor.<br/><a href="https://learning.oreilly.com/library/view/~/9781780173368">https://learning.oreilly.com/library/view/~/9781780173368</a>
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<a href="https://go.oreilly.com/library-access/library/view/-/9781780173368/?ar">https://go.oreilly.com/library-access/library/view/-/9781780173368/?ar</a><br/>Format: Electronic Resources<br/>Model-based testing essentials : guide to the ISTQB certified model-based tester foundation levelent://SD_ILS/0/SD_ILS:23088042025-06-16T03:02:49Z2025-06-16T03:02:49Zby Kramer, Anne (Software engineer), author.<br/><a href="https://learning.oreilly.com/library/view/~/9781119130017/?ar">https://learning.oreilly.com/library/view/~/9781119130017/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781119130017">https://learning.oreilly.com/library/view/~/9781119130017</a><br/>Format: Electronic Resources<br/>Software testing an ISTQB-ISEB foundation guideent://SD_ILS/0/SD_ILS:4763442025-06-16T03:02:49Z2025-06-16T03:02:49Zby Hambling, Brian.<br/>Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpSTAISTQ1">http://app.knovel.com/web/toc.v/cid:kpSTAISTQ1</a><br/>Format: Electronic Resources<br/>Integrated approach to web performance testing a practitioner's guideent://SD_ILS/0/SD_ILS:22616352025-06-16T03:02:49Z2025-06-16T03:02:49Zby Subraya, B. M., 1954-<br/>Chapter PDFs via platform: <a href="http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-59140-785-0">http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-59140-785-0</a><br/>Format: Electronic Resources<br/>Verification, validation and testing in software engineeringent://SD_ILS/0/SD_ILS:22620222025-06-16T03:02:49Z2025-06-16T03:02:49Zby Dasso, Aristides, 1943-<br/>Chapter PDFs via platform: <a href="http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-59140-851-2">http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-59140-851-2</a><br/>Format: Electronic Resources<br/>Mobile testing : an ASTQB-BCS foundation guideent://SD_ILS/0/SD_ILS:23750892025-06-16T03:02:49Z2025-06-16T03:02:49Zby Black, Rex, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5614299">Click to View</a><br/>Format: Electronic Resources<br/>SDET/Test architect essentials : road to full stack QAent://SD_ILS/0/SD_ILS:23232502025-06-16T03:02:49Z2025-06-16T03:02:49Zby Shetty, Rahul, author.<br/><a href="https://learning.oreilly.com/videos/~/9781838987558/?ar">https://learning.oreilly.com/videos/~/9781838987558/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781838987558/?ar">https://go.oreilly.com/library-access/library/view/-/9781838987558/?ar</a><br/>Format: Electronic Resources<br/>Java testing with Spockent://SD_ILS/0/SD_ILS:23104322025-06-16T03:02:49Z2025-06-16T03:02:49Zby Kapelonis, Konstantinos, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781617292538">https://learning.oreilly.com/library/view/~/9781617292538</a>
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<a href="https://learning.oreilly.com/library/view/~/9781617292538/?ar">https://learning.oreilly.com/library/view/~/9781617292538/?ar</a><br/>Format: Electronic Resources<br/>Software testing practice : test management : a study guide for the certified tester exam : advanced level, ISTQB compliantent://SD_ILS/0/SD_ILS:22945572025-06-16T03:02:49Z2025-06-16T03:02:49Zby Spillner, Andreas.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781457165948/?ar">https://go.oreilly.com/library-access/library/view/-/9781457165948/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781457165948">https://learning.oreilly.com/library/view/~/9781457165948</a><br/>Format: Electronic Resources<br/>Performance testing with Jmeter : test web applications using Apache JMeter with practical, hands-on examplesent://SD_ILS/0/SD_ILS:22086212025-06-16T03:02:49Z2025-06-16T03:02:49Zby Erinle, Bayo, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=2037689">Click to View</a><br/>Format: Electronic Resources<br/>Jasmine JavaScript testing : test your JavaScript applications efficiently using Jasmine and React.jsent://SD_ILS/0/SD_ILS:22086222025-06-16T03:02:49Z2025-06-16T03:02:49Zby Ragonha, Paulo, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=2037691">Click to View</a><br/>Format: Electronic Resources<br/>Performance Testing With JMeter 2.9.ent://SD_ILS/0/SD_ILS:12598062025-06-16T03:02:49Z2025-06-16T03:02:49Zby Erinle, Bayo.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1236049">Click to View</a><br/>Format: Electronic Resources<br/>Observability engineering : achieving production excellenceent://SD_ILS/0/SD_ILS:23329972025-06-16T03:02:49Z2025-06-16T03:02:49Zby Majors, Charity, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781492076438">https://learning.oreilly.com/library/view/~/9781492076438</a>
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<a href="https://go.oreilly.com/library-access/library/view/-/9781492076438/?ar">https://go.oreilly.com/library-access/library/view/-/9781492076438/?ar</a><br/>Format: Electronic Resources<br/>TEST DRIVEN DEVELOPMENT WITH C++ a simple guide to writing bug-free agile codeent://SD_ILS/0/SD_ILS:23349172025-06-16T03:02:49Z2025-06-16T03:02:49Zby Tanner, Abdul Wahid, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781803242002">https://learning.oreilly.com/library/view/~/9781803242002</a>
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<a href="https://go.oreilly.com/library-access/library/view/-/9781803242002/?ar">https://go.oreilly.com/library-access/library/view/-/9781803242002/?ar</a><br/>Format: Electronic Resources<br/>Guide to Advanced Software Testing.ent://SD_ILS/0/SD_ILS:12077542025-06-16T03:02:49Z2025-06-16T03:02:49Zby Mette Jonassen Hass, Anne.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=456922">Click to View</a><br/>Format: Electronic Resources<br/>Solving software problemsent://SD_ILS/0/SD_ILS:22173042025-06-16T03:02:49Z2025-06-16T03:02:49Zby Faust, Daniel R., author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5851879">Click to View</a><br/>Format: Electronic Resources<br/>Pytest quick start guide : write better Python code with simple and maintainable testsent://SD_ILS/0/SD_ILS:22676102025-06-16T03:02:49Z2025-06-16T03:02:49Zby Oliveira, Bruno, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5504834">Click to View</a><br/>Format: Electronic Resources<br/>Embedded systems and software validationent://SD_ILS/0/SD_ILS:4763332025-06-16T03:02:49Z2025-06-16T03:02:49Zby Roychoudhury, Abhik.<br/>Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpESSV0009/viewerType:toc/">http://app.knovel.com/web/toc.v/cid:kpESSV0009/viewerType:toc/</a><br/>Format: Electronic Resources<br/>XUnit test patterns : refactoring test codeent://SD_ILS/0/SD_ILS:22834352025-06-16T03:02:49Z2025-06-16T03:02:49Zby Meszaros, Gerard.<br/><a href="https://learning.oreilly.com/library/view/~/9780131495050/?ar">https://learning.oreilly.com/library/view/~/9780131495050/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780131495050/?ar">https://go.oreilly.com/library-access/library/view/-/9780131495050/?ar</a><br/>Format: Electronic Resources<br/>Test-Driven Development with Mockito.ent://SD_ILS/0/SD_ILS:12649192025-06-16T03:02:49Z2025-06-16T03:02:49Zby Acharya, Sujoy.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1569496">Click to View</a><br/>Format: Electronic Resources<br/>Continuous enterprise development in Javaent://SD_ILS/0/SD_ILS:23027902025-06-16T03:02:49Z2025-06-16T03:02:49Zby Rubinger, Andrew Lee.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781449332082/?ar">https://go.oreilly.com/library-access/library/view/-/9781449332082/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/0321146530">https://learning.oreilly.com/library/view/~/0321146530</a><br/>Format: Electronic Resources<br/>Embedded systems and software validationent://SD_ILS/0/SD_ILS:23247642025-06-16T03:02:49Z2025-06-16T03:02:49Zby Roychoudhury, Abhik. (uri) http://id.loc.gov/authorities/names/n2009016159 (uri) http://viaf.org/viaf/sourceID/LC%7cn2009016159<br/><a href="https://learning.oreilly.com/library/view/~/9780080921259">https://learning.oreilly.com/library/view/~/9780080921259</a>
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<a href="https://learning.oreilly.com/library/view/~/9780080921259/?ar">https://learning.oreilly.com/library/view/~/9780080921259/?ar</a><br/>Format: Electronic Resources<br/>Testing and Quality Assurance for Component-Based Software.ent://SD_ILS/0/SD_ILS:11833482025-06-16T03:02:49Z2025-06-16T03:02:49Zby Gao, Jerry.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=227638">Click to View</a><br/>Format: Electronic Resources<br/>Jenkins Continuous Integration Cookbook.ent://SD_ILS/0/SD_ILS:12821782025-06-16T03:02:49Z2025-06-16T03:02:49Zby Berg, Alan Mark.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1953232">Click to View</a><br/>Format: Electronic Resources<br/>Developer testing : building quality into softwareent://SD_ILS/0/SD_ILS:23113912025-06-16T03:02:49Z2025-06-16T03:02:49Zby Tarlinder, Alexander, author.<br/><a href="https://learning.oreilly.com/library/view/~/9780134291109/?ar">https://learning.oreilly.com/library/view/~/9780134291109/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780134291109/?ar">https://go.oreilly.com/library-access/library/view/-/9780134291109/?ar</a><br/>Format: Electronic Resources<br/>Agile automation and unified funtional testingent://SD_ILS/0/SD_ILS:23143112025-06-16T03:02:49Z2025-06-16T03:02:49Zby Gupta Rajeev, author.<br/><a href="https://learning.oreilly.com/library/view/~/9789332578944/?ar">https://learning.oreilly.com/library/view/~/9789332578944/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9789332578944/?ar">https://go.oreilly.com/library-access/library/view/-/9789332578944/?ar</a><br/>Format: Electronic Resources<br/>JavaScript unit testing : a hands-on approach to JS testing and automationent://SD_ILS/0/SD_ILS:23093432025-06-16T03:02:49Z2025-06-16T03:02:49Zby Trostler, Mark Ethan, speaker.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781771374569/?ar">https://go.oreilly.com/library-access/library/view/-/9781771374569/?ar</a>
<a href="https://learning.oreilly.com/videos/~/9781771374569/?ar">https://learning.oreilly.com/videos/~/9781771374569/?ar</a><br/>Format: Electronic Resources<br/>Lean enterprise : adopting continous delivery, devops, and lean startup at scaleent://SD_ILS/0/SD_ILS:23053932025-06-16T03:02:49Z2025-06-16T03:02:49Zby Humble, Jez, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781491946527/?ar">https://go.oreilly.com/library-access/library/view/-/9781491946527/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781491946527">https://learning.oreilly.com/library/view/~/9781491946527</a><br/>Format: Electronic Resources<br/>Lean enterprise : Mit agilen Methoden zum innovativen Unternehmenent://SD_ILS/0/SD_ILS:23156792025-06-16T03:02:49Z2025-06-16T03:02:49Zby Humble, Jez, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781492066903/?ar">https://go.oreilly.com/library-access/library/view/-/9781492066903/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781492066903">https://learning.oreilly.com/library/view/~/9781492066903</a><br/>Format: Electronic Resources<br/>Software Error Detection through Testing and Analysis.ent://SD_ILS/0/SD_ILS:12076122025-06-16T03:02:49Z2025-06-16T03:02:49Zby Huang, J. C.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=456102">Click to View</a><br/>Format: Electronic Resources<br/>Jenkins bootcamp : quick introduction to the Jenkins Continuous Integration server for beginners and focusing on Windows systemsent://SD_ILS/0/SD_ILS:23126952025-06-16T03:02:49Z2025-06-16T03:02:49Zby Taylor, Jason, speaker.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781787124134/?ar">https://go.oreilly.com/library-access/library/view/-/9781787124134/?ar</a>
<a href="https://learning.oreilly.com/videos/~/9781787124134/?ar">https://learning.oreilly.com/videos/~/9781787124134/?ar</a><br/>Format: Electronic Resources<br/>Observability for developers : how to get from here to thereent://SD_ILS/0/SD_ILS:23226872025-06-16T03:02:49Z2025-06-16T03:02:49Zby Yen, Christine, on-screen presenter.<br/><a href="https://go.oreilly.com/library-access/library/view/-/0636920338420/?ar">https://go.oreilly.com/library-access/library/view/-/0636920338420/?ar</a>
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<a href="https://learning.oreilly.com/videos/~/0636920338420/?ar">https://learning.oreilly.com/videos/~/0636920338420/?ar</a><br/>Format: Electronic Resources<br/>Continuous Integration mit Hudson : Grundlagen und Praxiswissen für Einsteiger und Umsteigerent://SD_ILS/0/SD_ILS:22977622025-06-16T03:02:49Z2025-06-16T03:02:49Zby Wiest, Simon.<br/><a href="https://learning.oreilly.com/library/view/~/9781457169793/?ar">https://learning.oreilly.com/library/view/~/9781457169793/?ar</a>
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<a href="https://go.oreilly.com/library-access/library/view/-/9781457169793/?ar">https://go.oreilly.com/library-access/library/view/-/9781457169793/?ar</a><br/>Format: Electronic Resources<br/>Java testing for developers : from JUnit FindBugs and PMD, tools and techniques for Java testingent://SD_ILS/0/SD_ILS:23104342025-06-16T03:02:49Z2025-06-16T03:02:49Zby Darwin, Ian F., speaker.<br/><a href="https://learning.oreilly.com/videos/~/9781771374637/?ar">https://learning.oreilly.com/videos/~/9781771374637/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781771374637/?ar">https://go.oreilly.com/library-access/library/view/-/9781771374637/?ar</a><br/>Format: Electronic Resources<br/>Test driven : practical TDD and acceptance TDD for Java developersent://SD_ILS/0/SD_ILS:22846372025-06-16T03:02:49Z2025-06-16T03:02:49Zby Koskela, Lasse.<br/><a href="https://learning.oreilly.com/library/view/~/9781932394856/?ar">https://learning.oreilly.com/library/view/~/9781932394856/?ar</a>
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<a href="https://go.oreilly.com/library-access/library/view/-/9781932394856/?ar">https://go.oreilly.com/library-access/library/view/-/9781932394856/?ar</a><br/>Format: Electronic Resources<br/>Testing in Python video courseent://SD_ILS/0/SD_ILS:23259172025-06-16T03:02:49Z2025-06-16T03:02:49Zby Deza, Alfredo, on-screen presenter.<br/><a href="https://go.oreilly.com/library-access/library/view/-/60641VIDEOPAIML/?ar">https://go.oreilly.com/library-access/library/view/-/60641VIDEOPAIML/?ar</a>
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<a href="https://learning.oreilly.com/videos/~/60641VIDEOPAIML">https://learning.oreilly.com/videos/~/60641VIDEOPAIML</a><br/>Format: Electronic Resources<br/>Growing object-oriented software : guided by testsent://SD_ILS/0/SD_ILS:22860742025-06-16T03:02:49Z2025-06-16T03:02:49Zby Freeman, Steve.<br/><a href="https://learning.oreilly.com/library/view/~/9780321574442">https://learning.oreilly.com/library/view/~/9780321574442</a>
<a href="https://learning.oreilly.com/library/view/~/9780321574442/?ar">https://learning.oreilly.com/library/view/~/9780321574442/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780321574442/?ar">https://go.oreilly.com/library-access/library/view/-/9780321574442/?ar</a><br/>Format: Electronic Resources<br/>Test-driven development : a J2EE exampleent://SD_ILS/0/SD_ILS:476262025-06-16T03:02:49Z2025-06-16T03:02:49Zby Hammell, Thomas.<br/>Format: Books<br/>Jenkins 2.x continuous integration cookbook : over 90 recipes to produce great results using pro-level practices, techniques, and solutionsent://SD_ILS/0/SD_ILS:23147992025-06-16T03:02:49Z2025-06-16T03:02:49Zby Soni, Mitesh, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781788297943/?ar">https://go.oreilly.com/library-access/library/view/-/9781788297943/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781788297943/?ar">https://learning.oreilly.com/library/view/~/9781788297943/?ar</a><br/>Format: Electronic Resources<br/>Accessibility in the browser : accessible rich internet applications speficication (ARIA) enables dynamic, JavaScript-driven apps to work with a variety of desktop-based assistive technologiesent://SD_ILS/0/SD_ILS:23080912025-06-16T03:02:49Z2025-06-16T03:02:49Zby Williams, Cassidy, speaker.<br/><a href="https://learning.oreilly.com/videos/~/9781491936504/?ar">https://learning.oreilly.com/videos/~/9781491936504/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781491936504/?ar">https://go.oreilly.com/library-access/library/view/-/9781491936504/?ar</a><br/>Format: Electronic Resources<br/>Basiswissen Softwaretest : Aus- und Weiterbildung zum Certified Tester - Foundation Level nach ISTQB-Standard.ent://SD_ILS/0/SD_ILS:22951252025-06-16T03:02:49Z2025-06-16T03:02:49Zby Spillner, Andreas.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781457178917/?ar">https://go.oreilly.com/library-access/library/view/-/9781457178917/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781457178917/?ar">https://learning.oreilly.com/library/view/~/9781457178917/?ar</a><br/>Format: Electronic Resources<br/>The Basics of Hacking and Penetration Testing : Ethical Hacking and Penetration Testing Made Easy.ent://SD_ILS/0/SD_ILS:12598592025-06-16T03:02:49Z2025-06-16T03:02:49Zby Engebretson, Patrick.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1249222">Click to View</a><br/>Format: Electronic Resources<br/>Python unity test automation : automate, organize, and execute testing in Pythonent://SD_ILS/0/SD_ILS:23310442025-06-16T03:02:49Z2025-06-16T03:02:49Zby Pajankar, Ashwin, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781484278543/?ar">https://learning.oreilly.com/library/view/~/9781484278543/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9781484278543">https://learning.oreilly.com/library/view/~/9781484278543</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781484278543/?ar">https://go.oreilly.com/library-access/library/view/-/9781484278543/?ar</a><br/>Format: Electronic Resources<br/>Cloud native Pytest tips and tricks from ground zeroent://SD_ILS/0/SD_ILS:23334182025-06-16T03:02:49Z2025-06-16T03:02:49Zby Gift, Noah, presenter.<br/><a href="https://go.oreilly.com/library-access/library/view/-/05122022VIDEOPAIML/?ar">https://go.oreilly.com/library-access/library/view/-/05122022VIDEOPAIML/?ar</a>
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<a href="https://learning.oreilly.com/videos/~/05122022VIDEOPAIML">https://learning.oreilly.com/videos/~/05122022VIDEOPAIML</a><br/>Format: Video recording<br/>Continuous integration, delivery, and deployment : reliable and faster software releases with automating builds, tests, and deploymentent://SD_ILS/0/SD_ILS:22402082025-06-16T03:02:49Z2025-06-16T03:02:49Zby Rossel, Sander, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5117840">Click to View</a><br/>Format: Electronic Resources<br/>Advanced white hat hacking and penetration testingent://SD_ILS/0/SD_ILS:22998252025-06-16T03:02:49Z2025-06-16T03:02:49Zby Messier, Ric.<br/><a href="https://learning.oreilly.com/videos/~/9781771370998/?ar">https://learning.oreilly.com/videos/~/9781771370998/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781771370998/?ar">https://go.oreilly.com/library-access/library/view/-/9781771370998/?ar</a><br/>Format: Electronic Resources<br/>Introduction to penetration testing : finding and analyzing vulnerabilities in systems and networks with Kali Linuxent://SD_ILS/0/SD_ILS:23095322025-06-16T03:02:49Z2025-06-16T03:02:49Zby Messier, Ric, speaker.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781771375245/?ar">https://go.oreilly.com/library-access/library/view/-/9781771375245/?ar</a>
<a href="https://learning.oreilly.com/videos/~/9781771375245/?ar">https://learning.oreilly.com/videos/~/9781771375245/?ar</a><br/>Format: Electronic Resources<br/>Artificial Intelligence Methods in Software Testing.ent://SD_ILS/0/SD_ILS:12707892025-06-16T03:02:49Z2025-06-16T03:02:49Zby Last, Mark.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1679479">Click to View</a><br/>Format: Electronic Resources<br/>Software testing and continuous quality improvementent://SD_ILS/0/SD_ILS:22873502025-06-16T03:02:49Z2025-06-16T03:02:49Zby Lewis, William E.<br/><a href="https://learning.oreilly.com/library/view/~/9781351722209/?ar">https://learning.oreilly.com/library/view/~/9781351722209/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9781351722209/?ar">https://go.oreilly.com/library-access/library/view/-/9781351722209/?ar</a><br/>Format: Electronic Resources<br/>Python testing with Pytest : simple, rapid, effective, and scalableent://SD_ILS/0/SD_ILS:23147882025-06-16T03:02:49Z2025-06-16T03:02:49Zby Okken, Brian, author<br/><a href="https://learning.oreilly.com/library/view/~/9781680502848">https://learning.oreilly.com/library/view/~/9781680502848</a>
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<a href="https://go.oreilly.com/library-access/library/view/-/9781680502848/?ar">https://go.oreilly.com/library-access/library/view/-/9781680502848/?ar</a><br/>Format: Electronic Resources<br/>Python testing with Pytest : simple, rapid, effective, and scalableent://SD_ILS/0/SD_ILS:23325792025-06-16T03:02:49Z2025-06-16T03:02:49Zby Okken, Brian, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781680509427/?ar">https://go.oreilly.com/library-access/library/view/-/9781680509427/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781680509427">https://learning.oreilly.com/library/view/~/9781680509427</a><br/>Format: Electronic Resources<br/>JavaScript testing with Jasmineent://SD_ILS/0/SD_ILS:22983222025-06-16T03:02:49Z2025-06-16T03:02:49Zby Hahn, Evan.<br/><a href="https://learning.oreilly.com/library/view/~/9781449356729/?ar">https://learning.oreilly.com/library/view/~/9781449356729/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781449356729">https://learning.oreilly.com/library/view/~/9781449356729</a><br/>Format: Electronic Resources<br/>The moderator's survival guide : handling common, tricky, and sticky situations in user researchent://SD_ILS/0/SD_ILS:22144432025-06-16T03:02:49Z2025-06-16T03:02:49Zby Tedesco, Donna, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5380894">Click to View</a><br/>Format: Electronic Resources<br/>Security testing and ethical hacking with Kali Linuxent://SD_ILS/0/SD_ILS:23156092025-06-16T03:02:49Z2025-06-16T03:02:49Zby Messier, Ric, on-screen presenter.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781492029328/?ar">https://go.oreilly.com/library-access/library/view/-/9781492029328/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781780175782/?ar">https://learning.oreilly.com/library/view/~/9781780175782/?ar</a><br/>Format: Electronic Resources<br/>Composite Filament Winding.ent://SD_ILS/0/SD_ILS:12879652025-06-16T03:02:49Z2025-06-16T03:02:49Zby Peters, S.T.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3002455">Click to View</a><br/>Format: Electronic Resources<br/>Placement Preparation.ent://SD_ILS/0/SD_ILS:11990212025-06-16T03:02:49Z2025-06-16T03:02:49Zby Parthasarathy, S.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=358036">Click to View</a><br/>Format: Electronic Resources<br/>Information Technology: New Generations 13th International Conference on Information Technologyent://SD_ILS/0/SD_ILS:20868842025-06-16T03:02:49Z2025-06-16T03:02:49Zby Latifi, Shahram. editor.<br/><a href="https://doi.org/10.1007/978-3-319-32467-8">https://doi.org/10.1007/978-3-319-32467-8</a><br/>Format: Electronic Resources<br/>Placement preparation more than 1000 questionsent://SD_ILS/0/SD_ILS:2899662025-06-16T03:02:49Z2025-06-16T03:02:49Zby Parthasarathy, S.<br/>EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=258330">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=258330</a><br/>Format: Electronic Resources<br/>Traffic generator for firewall testingent://SD_ILS/0/SD_ILS:412352025-06-16T03:02:49Z2025-06-16T03:02:49Zby Kaya, Özgür.<br/><a href="http://hdl.handle.net/11147/3631">Access to Electronic Version.</a><br/>Format: Manuscript<br/>Constructing Correct Softwareent://SD_ILS/0/SD_ILS:5083412025-06-16T03:02:49Z2025-06-16T03:02:49Zby Cooke, John. author.<br/><a href="http://dx.doi.org/10.1007/b138515">http://dx.doi.org/10.1007/b138515</a><br/>Format: Electronic Resources<br/>Technology-Based Inquiry for Middle School : An NSTA Press Journals Collection.ent://SD_ILS/0/SD_ILS:11865822025-06-16T03:02:49Z2025-06-16T03:02:49Zby Christmann, Edwin.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=259701">Click to View</a><br/>Format: Electronic Resources<br/>Towards a Synergistic Combination of Research and Practice in Software Engineeringent://SD_ILS/0/SD_ILS:20878972025-06-16T03:02:49Z2025-06-16T03:02:49Zby Kosiuczenko, Piotr. editor.<br/><a href="https://doi.org/10.1007/978-3-319-65208-5">https://doi.org/10.1007/978-3-319-65208-5</a><br/>Format: Electronic Resources<br/>Fourier analysis based testing of finite state machinesent://SD_ILS/0/SD_ILS:21340172025-06-16T03:02:49Z2025-06-16T03:02:49Zby Takan, Savaş, author.<br/><a href="https://hdl.handle.net/11147/7488">Access to Electronic Versiyon.</a><br/>Format: Manuscript<br/>Analysis of intrusion prevention methodsent://SD_ILS/0/SD_ILS:474612025-06-16T03:02:49Z2025-06-16T03:02:49Zby Semerci, Hakan.<br/><a href="http://hdl.handle.net/11147/3695">Access to Electronic Version.</a><br/>Format: Manuscript<br/>Practical Strategies for Living with Dyslexia.ent://SD_ILS/0/SD_ILS:12907672025-06-16T03:02:49Z2025-06-16T03:02:49Zby Chivers, Maria.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3015864">Click to View</a><br/>Format: Electronic Resources<br/>5G Wireless Systems Simulation and Evaluation Techniquesent://SD_ILS/0/SD_ILS:20873132025-06-16T03:02:49Z2025-06-16T03:02:49Zby Yang, Yang. author.<br/><a href="https://doi.org/10.1007/978-3-319-61869-2">https://doi.org/10.1007/978-3-319-61869-2</a><br/>Format: Electronic Resources<br/>Survey Automation : Report and Workshop Proceedings.ent://SD_ILS/0/SD_ILS:13178782025-06-16T03:02:49Z2025-06-16T03:02:49Zby Council, National Research.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3375791">Click to View</a><br/>Format: Electronic Resources<br/>Accidental Systems Librarian.ent://SD_ILS/0/SD_ILS:13110302025-06-16T03:02:49Z2025-06-16T03:02:49Zby Engard, Nicole C.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3316164">Click to View</a><br/>Format: Electronic Resources<br/>Graph Theory, Combinatorics and Algorithms Interdisciplinary Applicationsent://SD_ILS/0/SD_ILS:5043412025-06-16T03:02:49Z2025-06-16T03:02:49Zby Golumbic, Martin Charles. editor.<br/><a href="http://dx.doi.org/10.1007/b106672">http://dx.doi.org/10.1007/b106672</a><br/>Format: Electronic Resources<br/>Embedded Software and Systems Second International Conference, ICESS 2005, Xi’an, China, December 16-18, 2005. Proceedingsent://SD_ILS/0/SD_ILS:5105712025-06-16T03:02:49Z2025-06-16T03:02:49Zby Yang, Laurence T. editor.<br/><a href="http://dx.doi.org/10.1007/11599555">http://dx.doi.org/10.1007/11599555</a><br/>Format: Electronic Resources<br/>Dependable Computing Second Latin-American Symposium, LADC 2005, Salvador, Brazil, October 25-28, 2005. Proceedingsent://SD_ILS/0/SD_ILS:5104522025-06-16T03:02:49Z2025-06-16T03:02:49Zby Maziero, Carlos Alberto. editor.<br/><a href="http://dx.doi.org/10.1007/11572329">http://dx.doi.org/10.1007/11572329</a><br/>Format: Electronic Resources<br/>Big Data Technologies and Applications 8th International Conference, BDTA 2017, Gwangju, South Korea, November 23–24, 2017, Proceedingsent://SD_ILS/0/SD_ILS:20841232025-06-16T03:02:49Z2025-06-16T03:02:49Zby Jung, Jason J. editor.<br/><a href="https://doi.org/10.1007/978-3-319-98752-1">https://doi.org/10.1007/978-3-319-98752-1</a><br/>Format: Electronic Resources<br/>Computer Performance Engineering 15th European Workshop, EPEW 2018, Paris, France, October 29-30, 2018, Proceedingsent://SD_ILS/0/SD_ILS:20854002025-06-16T03:02:49Z2025-06-16T03:02:49Zby Bakhshi, Rena. editor.<br/><a href="https://doi.org/10.1007/978-3-030-02227-3">https://doi.org/10.1007/978-3-030-02227-3</a><br/>Format: Electronic Resources<br/>System engineering managementent://SD_ILS/0/SD_ILS:20595992025-06-16T03:02:49Z2025-06-16T03:02:49Zby Blanchard, Benjamin S., author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4413733">Click to View</a><br/>Format: Electronic Resources<br/>Software Systems Safety.ent://SD_ILS/0/SD_ILS:12841262025-06-16T03:02:49Z2025-06-16T03:02:49Zby Grumberg, O.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=2033821">Click to View</a><br/>Format: Electronic Resources<br/>Software Engineering Research, Management and Applicationsent://SD_ILS/0/SD_ILS:5028102025-06-16T03:02:49Z2025-06-16T03:02:49Zby Lee, Roger. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-70561-1">http://dx.doi.org/10.1007/978-3-540-70561-1</a><br/>Format: Electronic Resources<br/>Maya Plugin Power.ent://SD_ILS/0/SD_ILS:13048292025-06-16T03:02:49Z2025-06-16T03:02:49Zby Smith, Mark Jennings.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3136088">Click to View</a><br/>Format: Electronic Resources<br/>Climbing and Walking Robots Proceedings of the 8th International Conference on Climbing and Walking Robots and the Support Technologies for Mobile Machines (CLAWAR 2005)ent://SD_ILS/0/SD_ILS:5088692025-06-16T03:02:49Z2025-06-16T03:02:49Zby Tokhi, M. O. editor.<br/><a href="http://dx.doi.org/10.1007/3-540-26415-9">http://dx.doi.org/10.1007/3-540-26415-9</a><br/>Format: Electronic Resources<br/>Guide to Discrete Mathematics An Accessible Introduction to the History, Theory, Logic and Applicationsent://SD_ILS/0/SD_ILS:20845262025-06-16T03:02:49Z2025-06-16T03:02:49Zby O'Regan, Gerard. author.<br/><a href="https://doi.org/10.1007/978-3-319-44561-8">https://doi.org/10.1007/978-3-319-44561-8</a><br/>Format: Electronic Resources<br/>Internet of Things with the Arduino Yún.ent://SD_ILS/0/SD_ILS:12721112025-06-16T03:02:49Z2025-06-16T03:02:49Zby Schwartz, Marco.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1688637">Click to View</a><br/>Format: Electronic Resources<br/>Engineering Dependable Software Systems.ent://SD_ILS/0/SD_ILS:12633772025-06-16T03:02:49Z2025-06-16T03:02:49Zby Broy, M.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1477301">Click to View</a><br/>Format: Electronic Resources<br/>Programming Interviews Exposed : Secrets to Landing Your Next Job.ent://SD_ILS/0/SD_ILS:12396302025-06-16T03:02:49Z2025-06-16T03:02:49Zby Giguère, Eric.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=861686">Click to View</a><br/>Format: Electronic Resources<br/>Formal Methods for Industrial Critical Systems 12th International Workshop, FMICS 2007, Berlin, Germany, July 1-2, 2007, Revised Selected Papersent://SD_ILS/0/SD_ILS:5035482025-06-16T03:02:49Z2025-06-16T03:02:49Zby Leue, Stefan. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-79707-4">http://dx.doi.org/10.1007/978-3-540-79707-4</a><br/>Format: Electronic Resources<br/>Distributed and Parallel Systems In Focus: Desktop Grid Computingent://SD_ILS/0/SD_ILS:5019942025-06-16T03:02:49Z2025-06-16T03:02:49Zby Kacsuk, Péter. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-79448-8">http://dx.doi.org/10.1007/978-0-387-79448-8</a><br/>Format: Electronic Resources<br/>Arduino Home Automation Projects.ent://SD_ILS/0/SD_ILS:12745242025-06-16T03:02:49Z2025-06-16T03:02:49Zby Schwartz, Marco.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1747751">Click to View</a><br/>Format: Electronic Resources<br/>Trends in Computer Aided Innovation Second IFIP Working Conference on Computer Aided Innovation, October 8–9 2007, Michigan, USAent://SD_ILS/0/SD_ILS:5060552025-06-16T03:02:49Z2025-06-16T03:02:49Zby León-Rovira, Noel. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-75456-7">http://dx.doi.org/10.1007/978-0-387-75456-7</a><br/>Format: Electronic Resources<br/>Art of Teaching Spanish : Second Language Acquisition from Research to Praxis.ent://SD_ILS/0/SD_ILS:12164802025-06-16T03:02:49Z2025-06-16T03:02:49Zby Salaberry, Rafael.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=547770">Click to View</a><br/>Format: Electronic Resources<br/>Advances in Structures Analysis : Special Topic Volume with Invited Peer Reviewed Papers Only.ent://SD_ILS/0/SD_ILS:12788682025-06-16T03:02:49Z2025-06-16T03:02:49Zby Karama, Moussa.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1872616">Click to View</a><br/>Format: Electronic Resources<br/>Software engineering effective teaching and learning approaches and practicesent://SD_ILS/0/SD_ILS:22619312025-06-16T03:02:49Z2025-06-16T03:02:49Zby Ellis, Heidi J. C.<br/>Chapter PDFs via platform: <a href="http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60566-102-5">http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60566-102-5</a><br/>Format: Electronic Resources<br/>New Trends in Software Methodologies, Tools and Techniques.ent://SD_ILS/0/SD_ILS:12528922025-06-16T03:02:49Z2025-06-16T03:02:49Zby Fujita, H.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1109526">Click to View</a><br/>Format: Electronic Resources<br/>A Brief History of Computingent://SD_ILS/0/SD_ILS:5024852025-06-16T03:02:49Z2025-06-16T03:02:49Zby O’Regan, Gerard. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-84800-084-1">http://dx.doi.org/10.1007/978-1-84800-084-1</a><br/>Format: Electronic Resources<br/>Hardware and Software, Verification and Testing Second International Haifa Verification Conference, HVC 2006, Haifa, Israel, October 23-26, 2006. Revised Selected Papersent://SD_ILS/0/SD_ILS:5122392025-06-16T03:02:49Z2025-06-16T03:02:49Zby Bin, Eyal. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-70889-6">http://dx.doi.org/10.1007/978-3-540-70889-6</a><br/>Format: Electronic Resources<br/>Electronic Postage Systems Technology, Security, Economicsent://SD_ILS/0/SD_ILS:5055712025-06-16T03:02:49Z2025-06-16T03:02:49Zby Bleumer, Gerrit. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-44606-6">http://dx.doi.org/10.1007/978-0-387-44606-6</a><br/>Format: Electronic Resources<br/>Artificial Immune Systems 6th International Conference, ICARIS 2007, Santos, Brazil, August 26-29, 2007. Proceedingsent://SD_ILS/0/SD_ILS:5127362025-06-16T03:02:49Z2025-06-16T03:02:49Zby Castro, Leandro Nunes. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-73922-7">http://dx.doi.org/10.1007/978-3-540-73922-7</a><br/>Format: Electronic Resources<br/>Selected papers from the 16thInternational Conference on Electronical machines ICEM.ent://SD_ILS/0/SD_ILS:11871762025-06-16T03:02:49Z2025-06-16T03:02:49Zby Wiak, S.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=267424">Click to View</a><br/>Format: Electronic Resources<br/>Component-Oriented Programming.ent://SD_ILS/0/SD_ILS:11835452025-06-16T03:02:49Z2025-06-16T03:02:49Zby Wang, Andy Ju An.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=228466">Click to View</a><br/>Format: Electronic Resources<br/>