Arama Sonu&ccedil;ları Computer software testing. SirsiDynix Enterprise https://catalog.iyte.edu.tr/client/en_US/default/default/qu$003dComputer$002bsoftware$002btesting.$0026ps$003d300?dt=list 2025-06-16T03:02:49Z Mobile testing : an ASTQB-BCS foundation guide ent://SD_ILS/0/SD_ILS:2317537 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Black, Rex, 1964- author.<br/><a href="https://learning.oreilly.com/library/view/~/9781780174044/?ar">https://learning.oreilly.com/library/view/~/9781780174044/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781780174044/?ar">https://go.oreilly.com/library-access/library/view/-/9781780174044/?ar</a><br/>Format:&#160;Electronic Resources<br/> Software testing : an ISTQB-BCS certified tester foundation guide ent://SD_ILS/0/SD_ILS:2321609 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Hambling, Brian, 1946- editor.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781780174921/?ar">https://go.oreilly.com/library-access/library/view/-/9781780174921/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781780174921/?ar">https://learning.oreilly.com/library/view/~/9781780174921/?ar</a><br/>Format:&#160;Electronic Resources<br/> Software testing : an ISTQB-BCS certified tester foundation guide ent://SD_ILS/0/SD_ILS:2307765 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Hambling, Brian, 1946- editor.<br/><a href="https://learning.oreilly.com/library/view/~/9781780172996">https://learning.oreilly.com/library/view/~/9781780172996</a> <a href="https://learning.oreilly.com/library/view/~/9781780172996/?ar">https://learning.oreilly.com/library/view/~/9781780172996/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781780172996/?ar">https://go.oreilly.com/library-access/library/view/-/9781780172996/?ar</a><br/>Format:&#160;Electronic Resources<br/> Fundamentals of Software Testing. ent://SD_ILS/0/SD_ILS:1253947 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Hom&Atilde;s̈, Bernard.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1120766">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Practical model-based testing a tools approach ent://SD_ILS/0/SD_ILS:64161 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Utting, Mark.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123725011">An electronic book accessible through the World Wide Web; click for information</a> Table of contents only <a href="http://www.loc.gov/catdir/toc/ecip073/2006034511.html">http://www.loc.gov/catdir/toc/ecip073/2006034511.html</a> Publisher description <a href="http://www.loc.gov/catdir/enhancements/fy0702/2006034511-d.html">http://www.loc.gov/catdir/enhancements/fy0702/2006034511-d.html</a><br/>Format:&#160;Electronic Resources<br/> Penetration Testing with Perl. ent://SD_ILS/0/SD_ILS:1281046 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Berdeaux, Douglas.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1912005">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Implementing automated software testing : how to lower costs while raising quality ent://SD_ILS/0/SD_ILS:2286091 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Dustin, Elfriede.<br/><a href="https://learning.oreilly.com/library/view/~/9780321619600/?ar">https://learning.oreilly.com/library/view/~/9780321619600/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9780321619600/?ar">https://go.oreilly.com/library-access/library/view/-/9780321619600/?ar</a><br/>Format:&#160;Electronic Resources<br/> Practical Model-Based Testing : A Tools Approach. ent://SD_ILS/0/SD_ILS:1190088 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Utting, Mark.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=282069">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Designing and Implementing Test Automation Frameworks with QTP. ent://SD_ILS/0/SD_ILS:1263420 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Bhargava, Ashish.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1477488">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Pragmatic software testing : becoming an effective and efficient test professional ent://SD_ILS/0/SD_ILS:2284760 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Black, Rex, 1964-<br/><a href="https://learning.oreilly.com/library/view/~/9780470127902">https://learning.oreilly.com/library/view/~/9780470127902</a> <a href="https://go.oreilly.com/library-access/library/view/-/9780470127902/?ar">https://go.oreilly.com/library-access/library/view/-/9780470127902/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9780470127902/?ar">https://learning.oreilly.com/library/view/~/9780470127902/?ar</a><br/>Format:&#160;Electronic Resources<br/> Learn API testing : norms, practices, and guidelines for building effective test automation ent://SD_ILS/0/SD_ILS:2333818 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Jain, Jagdeep, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781484281420">https://learning.oreilly.com/library/view/~/9781484281420</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781484281420/?ar">https://go.oreilly.com/library-access/library/view/-/9781484281420/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781484281420/?ar">https://learning.oreilly.com/library/view/~/9781484281420/?ar</a><br/>Format:&#160;Electronic Resources<br/> How we test software at Microsoft ent://SD_ILS/0/SD_ILS:2285808 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Page, Alan.<br/><a href="https://learning.oreilly.com/library/view/~/9780735624252/?ar">https://learning.oreilly.com/library/view/~/9780735624252/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9780735624252/?ar">https://go.oreilly.com/library-access/library/view/-/9780735624252/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9780735624252">https://learning.oreilly.com/library/view/~/9780735624252</a><br/>Format:&#160;Electronic Resources<br/> Testing object oriented systems: models patterns and tools ent://SD_ILS/0/SD_ILS:11401 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Binder, Robert V.<br/>Format:&#160;Books<br/> Software reliability: measurement, prediction, application ent://SD_ILS/0/SD_ILS:2145 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Musa, John D.<br/>Format:&#160;Books<br/> Practical test design : selection of traditional and automated test design techniques ent://SD_ILS/0/SD_ILS:2273697 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Forg&aacute;cs, I., author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5892550">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Agile testing foundations : an ISTQB Foundation level Agile tester guide ent://SD_ILS/0/SD_ILS:2272095 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Black, Rex, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4836286">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Test driven development in Ruby : a practical introduction to TDD using problem and solution domain analysis ent://SD_ILS/0/SD_ILS:2346309 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Paranj, Bala, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4822971">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Testing with JUnit : master high-quality software development driven by unit tests ent://SD_ILS/0/SD_ILS:2271286 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Appel, Frank, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3564809">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Software testing : principles and practices ent://SD_ILS/0/SD_ILS:478811 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Chauhan, Naresh, author.<br/>Knovel <a href="http://app.knovel.com/hotlink/toc/id:kpSTPP0002/software-testing-principles">http://app.knovel.com/hotlink/toc/id:kpSTPP0002/software-testing-principles</a><br/>Format:&#160;Electronic Resources<br/> Software testing : concepts and operations ent://SD_ILS/0/SD_ILS:2279964 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Mili, Ali, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=7104400">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Basiswissen modellbasierter Test : Aus- und Weiterbildung zum ISTQB Foundation Level - Certified Model-Based Tester ent://SD_ILS/0/SD_ILS:2312698 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Winter, Mario, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781492019275/?ar">https://learning.oreilly.com/library/view/~/9781492019275/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781492019275/?ar">https://go.oreilly.com/library-access/library/view/-/9781492019275/?ar</a><br/>Format:&#160;Electronic Resources<br/> Mastering mobile test automation : master the full range of mobile automation and testing techniques to develop customized mobile automation solutions ent://SD_ILS/0/SD_ILS:2238357 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Louis, Feroz Pearl, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=2050743">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Software testing : a craftsman's approach ent://SD_ILS/0/SD_ILS:2305703 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Jorgensen, Paul, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781466560680/?ar">https://go.oreilly.com/library-access/library/view/-/9781466560680/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781466560680/?ar">https://learning.oreilly.com/library/view/~/9781466560680/?ar</a><br/>Format:&#160;Electronic Resources<br/> Advances in computers. Volume 89 ent://SD_ILS/0/SD_ILS:2301431 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Memon, Atif M.<br/><a href="https://learning.oreilly.com/library/view/~/9780124080942/?ar">https://learning.oreilly.com/library/view/~/9780124080942/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9780124080942/?ar">https://go.oreilly.com/library-access/library/view/-/9780124080942/?ar</a><br/>Format:&#160;Electronic Resources<br/> Praxiswissen Softwaretest : Testmanagement : Aus- und Weiterbildung zum Certified Tester ent://SD_ILS/0/SD_ILS:2297870 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Spillner, Andreas.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781457170935/?ar">https://go.oreilly.com/library-access/library/view/-/9781457170935/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781457170935/?ar">https://learning.oreilly.com/library/view/~/9781457170935/?ar</a><br/>Format:&#160;Electronic Resources<br/> Exploratory software testing ent://SD_ILS/0/SD_ILS:2288247 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Whittaker, James A., 1965-<br/><a href="https://learning.oreilly.com/library/view/~/9780321647863/?ar">https://learning.oreilly.com/library/view/~/9780321647863/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9780321647863/?ar">https://go.oreilly.com/library-access/library/view/-/9780321647863/?ar</a><br/>Format:&#160;Electronic Resources<br/> Basiswissen Testautomatisierung : Konzepte, Methoden und Techniken. ent://SD_ILS/0/SD_ILS:2295117 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Seidl, Richard.<br/><a href="https://learning.oreilly.com/library/view/~/9781457170652/?ar">https://learning.oreilly.com/library/view/~/9781457170652/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781457170652/?ar">https://go.oreilly.com/library-access/library/view/-/9781457170652/?ar</a><br/>Format:&#160;Electronic Resources<br/> The art of software testing ent://SD_ILS/0/SD_ILS:2343477 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Myers, Glenford J., 1946-<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=697721">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Software testing : principles and practices ent://SD_ILS/0/SD_ILS:2287838 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Desikan, Srinivasan.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9788177581218/?ar">https://go.oreilly.com/library-access/library/view/-/9788177581218/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9788177581218/?ar">https://learning.oreilly.com/library/view/~/9788177581218/?ar</a><br/>Format:&#160;Electronic Resources<br/> Agile testing essentials : LiveLessons ent://SD_ILS/0/SD_ILS:2313228 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Crispin, Lisa, on-screen presenter.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780134683287/?ar">https://go.oreilly.com/library-access/library/view/-/9780134683287/?ar</a> <a href="https://learning.oreilly.com/videos/~/9780134683287/?ar">https://learning.oreilly.com/videos/~/9780134683287/?ar</a><br/>Format:&#160;Electronic Resources<br/> Mockito for spring : learn all you need to know about the spring framework and how to unit test your projects with mockito ent://SD_ILS/0/SD_ILS:1386693 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Acharya, Sujoy, author.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1969464">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Open source fuzzing tools ent://SD_ILS/0/SD_ILS:2285085 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Evron, Gadi.<br/><a href="https://learning.oreilly.com/library/view/~/9781597491952/?ar">https://learning.oreilly.com/library/view/~/9781597491952/?ar</a> <a 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href="https://learning.oreilly.com/library/view/~/9781098108120">https://learning.oreilly.com/library/view/~/9781098108120</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781098108120/?ar">https://go.oreilly.com/library-access/library/view/-/9781098108120/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781098108120/?ar">https://learning.oreilly.com/library/view/~/9781098108120/?ar</a><br/>Format:&#160;Electronic Resources<br/> Testdaten und Testdatenmanagement : Vorgehen, Methoden und Praxis ent://SD_ILS/0/SD_ILS:2315695 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Albrecht-Z&ouml;lch, Janet, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781492066057">https://learning.oreilly.com/library/view/~/9781492066057</a> <a href="https://learning.oreilly.com/library/view/~/9781492066057/?ar">https://learning.oreilly.com/library/view/~/9781492066057/?ar</a> <a 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href="https://go.oreilly.com/library-access/library/view/-/9780133749571/?ar">https://go.oreilly.com/library-access/library/view/-/9780133749571/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9780133749571/?ar">https://learning.oreilly.com/library/view/~/9780133749571/?ar</a><br/>Format:&#160;Electronic Resources<br/> Software testing foundations : a study guide for the certified tester exam ent://SD_ILS/0/SD_ILS:2302920 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Spillner, Andreas.<br/><a href="https://learning.oreilly.com/library/view/~/9781492001454/?ar">https://learning.oreilly.com/library/view/~/9781492001454/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781492001454/?ar">https://go.oreilly.com/library-access/library/view/-/9781492001454/?ar</a><br/>Format:&#160;Electronic Resources<br/> Foundations of software testing : fundamental algorithms and techniques ent://SD_ILS/0/SD_ILS:2304162 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Mathur, Aditya.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9788131794760/?ar">https://go.oreilly.com/library-access/library/view/-/9788131794760/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9788131794760/?ar">https://learning.oreilly.com/library/view/~/9788131794760/?ar</a><br/>Format:&#160;Electronic Resources<br/> Managing the testing process : practical tools and techniques for managing software and hardware testing ent://SD_ILS/0/SD_ILS:2289455 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Black, Rex, 1964-<br/><a href="https://learning.oreilly.com/library/view/~/9781118074015/?ar">https://learning.oreilly.com/library/view/~/9781118074015/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781118074015/?ar">https://go.oreilly.com/library-access/library/view/-/9781118074015/?ar</a><br/>Format:&#160;Electronic Resources<br/> Software testing ent://SD_ILS/0/SD_ILS:2283368 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z 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href="https://go.oreilly.com/library-access/library/view/-/9780137036455/?ar">https://go.oreilly.com/library-access/library/view/-/9780137036455/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9780137036455">https://learning.oreilly.com/library/view/~/9780137036455</a> <a href="https://learning.oreilly.com/library/view/~/9780137036455/?ar">https://learning.oreilly.com/library/view/~/9780137036455/?ar</a><br/>Format:&#160;Electronic Resources<br/> Design driven testing : test smarter, not harder ent://SD_ILS/0/SD_ILS:2290756 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Stephens, Matt.<br/><a href="https://learning.oreilly.com/library/view/~/9781430229438/?ar">https://learning.oreilly.com/library/view/~/9781430229438/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781430229438/?ar">https://go.oreilly.com/library-access/library/view/-/9781430229438/?ar</a> <a 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view.</a><br/>Format:&#160;Books<br/> Introduction to software testing ent://SD_ILS/0/SD_ILS:107405 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Ammann, Paul, 1961- author.<br/>Table of contents only <a href="http://www.loc.gov/catdir/enhancements/fy0803/2007035077-t.html">http://www.loc.gov/catdir/enhancements/fy0803/2007035077-t.html</a> Publisher description <a href="http://www.loc.gov/catdir/enhancements/fy0803/2007035077-d.html">http://www.loc.gov/catdir/enhancements/fy0803/2007035077-d.html</a><br/>Format:&#160;Books<br/> How to break Web software : functional and security testing of Web applications and Web services ent://SD_ILS/0/SD_ILS:2286432 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Andrews, Mike.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780321657497/?ar">https://go.oreilly.com/library-access/library/view/-/9780321657497/?ar</a> <a 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href="https://go.oreilly.com/library-access/library/view/-/0596006896/?ar">https://go.oreilly.com/library-access/library/view/-/0596006896/?ar</a> <a href="https://learning.oreilly.com/library/view/~/0596006896/?ar">https://learning.oreilly.com/library/view/~/0596006896/?ar</a> <a href="https://learning.oreilly.com/library/view/~/0596006896">https://learning.oreilly.com/library/view/~/0596006896</a><br/>Format:&#160;Electronic Resources<br/> Managing the testing process : practical tools and techniques for managing hardware and software testing ent://SD_ILS/0/SD_ILS:2280945 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Black, Rex, 1964-<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780471223986/?ar">https://go.oreilly.com/library-access/library/view/-/9780471223986/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9780471223986/?ar">https://learning.oreilly.com/library/view/~/9780471223986/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9780471223986">https://learning.oreilly.com/library/view/~/9780471223986</a><br/>Format:&#160;Electronic Resources<br/> Lessons learned in software testing : a context-driven approach ent://SD_ILS/0/SD_ILS:2292810 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Kaner, Cem.<br/><a href="https://learning.oreilly.com/library/view/~/9780471081128">https://learning.oreilly.com/library/view/~/9780471081128</a> <a href="https://go.oreilly.com/library-access/library/view/-/9780471081128/?ar">https://go.oreilly.com/library-access/library/view/-/9780471081128/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9780471081128/?ar">https://learning.oreilly.com/library/view/~/9780471081128/?ar</a><br/>Format:&#160;Electronic Resources<br/> Property-based testing with PropEr, Erlang, and Elixir : find bugs before your users do ent://SD_ILS/0/SD_ILS:2318698 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;H&eacute;bert, Fred, 1988- author.<br/><a href="https://learning.oreilly.com/library/view/~/9781680506556">https://learning.oreilly.com/library/view/~/9781680506556</a> <a href="https://learning.oreilly.com/library/view/~/9781680506556/?ar">https://learning.oreilly.com/library/view/~/9781680506556/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781680506556/?ar">https://go.oreilly.com/library-access/library/view/-/9781680506556/?ar</a><br/>Format:&#160;Electronic Resources<br/> Test driven development in Ruby : a practical introduction to TDD using problem and solution domain analysis ent://SD_ILS/0/SD_ILS:2312848 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Paranj, Bala, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781484226384">https://learning.oreilly.com/library/view/~/9781484226384</a> <a href="https://learning.oreilly.com/library/view/~/9781484226384/?ar">https://learning.oreilly.com/library/view/~/9781484226384/?ar</a> <a 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2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Copeland, Lee.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=227688">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Effectiveness of using clustering for test case prioritization ent://SD_ILS/0/SD_ILS:2133867 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;G&uuml;nel, Can, author.<br/><a href="https://hdl.handle.net/11147/7480">Access to Electronic Versiyon.</a><br/>Format:&#160;Manuscript<br/> Test case generation from cause effect graphs ent://SD_ILS/0/SD_ILS:1352279 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Kavzak Ufuktepe, Deniz, author.<br/><a href="http://hdl.handle.net/11147/5704">Access to Electronic Versiyon.</a><br/>Format:&#160;Manuscript<br/> Software Testing for Conventional and Logic Programming. ent://SD_ILS/0/SD_ILS:1298625 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Jack, Oliver.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3040672">Click to View</a><br/>Format:&#160;Electronic Resources<br/> A model-based test generation approach for agile software product lines ent://SD_ILS/0/SD_ILS:2146421 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;&Ouml;zt&uuml;rk, Dilek, author.<br/><a href="https://hdl.handle.net/11147/10818">Access to Electronic Versiyon.</a><br/>Format:&#160;Manuscript<br/> Mutation analysis of specification-based contracts in software testing ent://SD_ILS/0/SD_ILS:2204899 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Khalilov, Abbas, author.<br/><a href="https://hdl.handle.net/11147/11152">Access to Electronic Versiyon.</a><br/>Format:&#160;Manuscript<br/> Unit testing in Java how tests drive the code ent://SD_ILS/0/SD_ILS:65969 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Link, Johannes.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781558608689">An electronic book accessible through the 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2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Hutcheson, Marnie L.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=243712">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Arquillian Testing Guide. ent://SD_ILS/0/SD_ILS:1255744 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Ament, John.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1142884">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Software Testing using Visual Studio 2012. ent://SD_ILS/0/SD_ILS:1259807 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Subashni, S.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1236050">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Software Testing with Visual Studio Team System 2008. ent://SD_ILS/0/SD_ILS:1246854 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Kumar, N Satheesh.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=979958">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Software Testing using Visual Studio 2010. ent://SD_ILS/0/SD_ILS:1245960 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Kumar, N. 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Vol. 1 : guide to the ISTQB advanced certification as an advanced technical test analyst ent://SD_ILS/0/SD_ILS:2309797 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Black, Rex, 1964- author.<br/><a href="https://learning.oreilly.com/library/view/~/9781457189517/?ar">https://learning.oreilly.com/library/view/~/9781457189517/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781457189517/?ar">https://go.oreilly.com/library-access/library/view/-/9781457189517/?ar</a><br/>Format:&#160;Electronic Resources<br/> Robot Framework Test Automation. ent://SD_ILS/0/SD_ILS:2300743 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Bisht, Sumit.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781783283033/?ar">https://go.oreilly.com/library-access/library/view/-/9781783283033/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781783283033/?ar">https://learning.oreilly.com/library/view/~/9781783283033/?ar</a> <a 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by&#160;Sharma, Mukesh (Software testing engineer), author.<br/><a href="https://www.taylorfrancis.com/books/9781315378008">Click here to view.</a><br/>Format:&#160;Books<br/> Just Enough Software Test Automation. ent://SD_ILS/0/SD_ILS:2317932 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Mosley, Daniel J., author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/0130084689/?ar">https://go.oreilly.com/library-access/library/view/-/0130084689/?ar</a> <a href="https://learning.oreilly.com/library/view/~/0130084689">https://learning.oreilly.com/library/view/~/0130084689</a> <a href="https://learning.oreilly.com/library/view/~/0130084689/?ar">https://learning.oreilly.com/library/view/~/0130084689/?ar</a><br/>Format:&#160;Electronic Resources<br/> Selenium WebDriver recipes in C# ent://SD_ILS/0/SD_ILS:2309709 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Zhan, Zhimin, author.<br/><a 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View</a><br/>Format:&#160;Electronic Resources<br/> TestComplete Cookbook. ent://SD_ILS/0/SD_ILS:1264126 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Alpaev, Gennadiy.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1531992">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Software-Test f&uuml;r Embedded Systems : ein Praxishandbuch f&uuml;r Entwickler, Tester und technische Projektleiter ent://SD_ILS/0/SD_ILS:2314594 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Gr&uuml;nfelder, Stephan, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781492063902/?ar">https://learning.oreilly.com/library/view/~/9781492063902/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781492063902/?ar">https://go.oreilly.com/library-access/library/view/-/9781492063902/?ar</a><br/>Format:&#160;Electronic Resources<br/> Software testing as a service ent://SD_ILS/0/SD_ILS:2323625 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z 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J.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781484251942/?ar">https://go.oreilly.com/library-access/library/view/-/9781484251942/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781484251942/?ar">https://learning.oreilly.com/library/view/~/9781484251942/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781484251942">https://learning.oreilly.com/library/view/~/9781484251942</a><br/>Format:&#160;Electronic Resources<br/> Basiswissen Automotive Softwaretest ent://SD_ILS/0/SD_ILS:2326236 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Bongard, Ralf.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781098124687/?ar">https://go.oreilly.com/library-access/library/view/-/9781098124687/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781098124687/?ar">https://learning.oreilly.com/library/view/~/9781098124687/?ar</a> <a 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href="https://learning.oreilly.com/library/view/~/9781492018742/?ar">https://learning.oreilly.com/library/view/~/9781492018742/?ar</a><br/>Format:&#160;Electronic Resources<br/> The software test engineer's handbook : a study guide for the ISTQB test analyst and technical test analyst advanced level certificates 2012 ent://SD_ILS/0/SD_ILS:2303803 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Bath, Graham, 1954-<br/><a href="https://learning.oreilly.com/library/view/~/9781492014706/?ar">https://learning.oreilly.com/library/view/~/9781492014706/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781492014706/?ar">https://go.oreilly.com/library-access/library/view/-/9781492014706/?ar</a><br/>Format:&#160;Electronic Resources<br/> Software testing : an ISTQB-ISEB foundation guide ent://SD_ILS/0/SD_ILS:2294614 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Hambling, Brian, 1946-<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781906124762/?ar">https://go.oreilly.com/library-access/library/view/-/9781906124762/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781906124762/?ar">https://learning.oreilly.com/library/view/~/9781906124762/?ar</a><br/>Format:&#160;Electronic Resources<br/> Performance testing : an ISTQB certified tester foundation level specialist certification review ent://SD_ILS/0/SD_ILS:2330089 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Yorkston, Keith, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781484272558">https://learning.oreilly.com/library/view/~/9781484272558</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781484272558/?ar">https://go.oreilly.com/library-access/library/view/-/9781484272558/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781484272558/?ar">https://learning.oreilly.com/library/view/~/9781484272558/?ar</a><br/>Format:&#160;Electronic Resources<br/> Improving the test process : implementing improvement and change--a study guide for the ISTQB expert level module ent://SD_ILS/0/SD_ILS:2301858 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Bath, Graham, 1954-<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781492001300/?ar">https://go.oreilly.com/library-access/library/view/-/9781492001300/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781492001300/?ar">https://learning.oreilly.com/library/view/~/9781492001300/?ar</a><br/>Format:&#160;Electronic Resources<br/> Software testing : an ISEB intermediate certificate ent://SD_ILS/0/SD_ILS:2317694 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Hambling, Brian.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781906124137/?ar">https://go.oreilly.com/library-access/library/view/-/9781906124137/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781906124137/?ar">https://learning.oreilly.com/library/view/~/9781906124137/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781906124137">https://learning.oreilly.com/library/view/~/9781906124137</a><br/>Format:&#160;Electronic Resources<br/> Basiswissen Sicherheitstests : Aus- und Weiterbildung zum ISTQB Advanced Level Specialist-Certified Security Tester ent://SD_ILS/0/SD_ILS:2321169 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Simon, Frank, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781492072171">https://learning.oreilly.com/library/view/~/9781492072171</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781492072171/?ar">https://go.oreilly.com/library-access/library/view/-/9781492072171/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781492072171/?ar">https://learning.oreilly.com/library/view/~/9781492072171/?ar</a><br/>Format:&#160;Electronic Resources<br/> Agile testing foundations : an ISTQB Foundation level agile tester guide ent://SD_ILS/0/SD_ILS:2313775 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Black, Rex, 1964- editor.<br/><a href="https://learning.oreilly.com/library/view/~/9781780173368">https://learning.oreilly.com/library/view/~/9781780173368</a> <a href="https://learning.oreilly.com/library/view/~/9781780173368/?ar">https://learning.oreilly.com/library/view/~/9781780173368/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781780173368/?ar">https://go.oreilly.com/library-access/library/view/-/9781780173368/?ar</a><br/>Format:&#160;Electronic Resources<br/> Model-based testing essentials : guide to the ISTQB certified model-based tester foundation level ent://SD_ILS/0/SD_ILS:2308804 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Kramer, Anne (Software engineer), author.<br/><a href="https://learning.oreilly.com/library/view/~/9781119130017/?ar">https://learning.oreilly.com/library/view/~/9781119130017/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781119130017/?ar">https://go.oreilly.com/library-access/library/view/-/9781119130017/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781119130017">https://learning.oreilly.com/library/view/~/9781119130017</a><br/>Format:&#160;Electronic Resources<br/> Software testing an ISTQB-ISEB foundation guide ent://SD_ILS/0/SD_ILS:476344 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Hambling, Brian.<br/>Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpSTAISTQ1">http://app.knovel.com/web/toc.v/cid:kpSTAISTQ1</a><br/>Format:&#160;Electronic Resources<br/> Integrated approach to web performance testing a practitioner's guide ent://SD_ILS/0/SD_ILS:2261635 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Subraya, B. M., 1954-<br/>Chapter PDFs via platform: <a href="http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-59140-785-0">http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-59140-785-0</a><br/>Format:&#160;Electronic Resources<br/> Verification, validation and testing in software engineering ent://SD_ILS/0/SD_ILS:2262022 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Dasso, Aristides, 1943-<br/>Chapter PDFs via platform: <a href="http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-59140-851-2">http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-59140-851-2</a><br/>Format:&#160;Electronic Resources<br/> Mobile testing : an ASTQB-BCS foundation guide ent://SD_ILS/0/SD_ILS:2375089 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Black, Rex, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5614299">Click to View</a><br/>Format:&#160;Electronic Resources<br/> SDET/Test architect essentials : road to full stack QA ent://SD_ILS/0/SD_ILS:2323250 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Shetty, Rahul, author.<br/><a href="https://learning.oreilly.com/videos/~/9781838987558/?ar">https://learning.oreilly.com/videos/~/9781838987558/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781838987558/?ar">https://go.oreilly.com/library-access/library/view/-/9781838987558/?ar</a><br/>Format:&#160;Electronic Resources<br/> Java testing with Spock ent://SD_ILS/0/SD_ILS:2310432 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Kapelonis, Konstantinos, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781617292538">https://learning.oreilly.com/library/view/~/9781617292538</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781617292538/?ar">https://go.oreilly.com/library-access/library/view/-/9781617292538/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781617292538/?ar">https://learning.oreilly.com/library/view/~/9781617292538/?ar</a><br/>Format:&#160;Electronic Resources<br/> Software testing practice : test management : a study guide for the certified tester exam : advanced level, ISTQB compliant ent://SD_ILS/0/SD_ILS:2294557 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Spillner, Andreas.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781457165948/?ar">https://go.oreilly.com/library-access/library/view/-/9781457165948/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781457165948/?ar">https://learning.oreilly.com/library/view/~/9781457165948/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781457165948">https://learning.oreilly.com/library/view/~/9781457165948</a><br/>Format:&#160;Electronic Resources<br/> Performance testing with Jmeter : test web applications using Apache JMeter with practical, hands-on examples ent://SD_ILS/0/SD_ILS:2208621 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Erinle, Bayo, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=2037689">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Jasmine JavaScript testing : test your JavaScript applications efficiently using Jasmine and React.js ent://SD_ILS/0/SD_ILS:2208622 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Ragonha, Paulo, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=2037691">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Performance Testing With JMeter 2.9. ent://SD_ILS/0/SD_ILS:1259806 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Erinle, Bayo.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1236049">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Observability engineering : achieving production excellence ent://SD_ILS/0/SD_ILS:2332997 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Majors, Charity, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781492076438">https://learning.oreilly.com/library/view/~/9781492076438</a> <a href="https://learning.oreilly.com/library/view/~/9781492076438/?ar">https://learning.oreilly.com/library/view/~/9781492076438/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781492076438/?ar">https://go.oreilly.com/library-access/library/view/-/9781492076438/?ar</a><br/>Format:&#160;Electronic Resources<br/> TEST DRIVEN DEVELOPMENT WITH C++ a simple guide to writing bug-free agile code ent://SD_ILS/0/SD_ILS:2334917 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Tanner, Abdul Wahid, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781803242002">https://learning.oreilly.com/library/view/~/9781803242002</a> <a href="https://learning.oreilly.com/library/view/~/9781803242002/?ar">https://learning.oreilly.com/library/view/~/9781803242002/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781803242002/?ar">https://go.oreilly.com/library-access/library/view/-/9781803242002/?ar</a><br/>Format:&#160;Electronic Resources<br/> Guide to Advanced Software Testing. ent://SD_ILS/0/SD_ILS:1207754 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Mette Jonassen Hass, Anne.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=456922">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Solving software problems ent://SD_ILS/0/SD_ILS:2217304 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Faust, Daniel R., author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5851879">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Pytest quick start guide : write better Python code with simple and maintainable tests ent://SD_ILS/0/SD_ILS:2267610 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Oliveira, Bruno, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5504834">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Embedded systems and software validation ent://SD_ILS/0/SD_ILS:476333 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Roychoudhury, Abhik.<br/>Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpESSV0009/viewerType:toc/">http://app.knovel.com/web/toc.v/cid:kpESSV0009/viewerType:toc/</a><br/>Format:&#160;Electronic Resources<br/> XUnit test patterns : refactoring test code ent://SD_ILS/0/SD_ILS:2283435 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Meszaros, Gerard.<br/><a href="https://learning.oreilly.com/library/view/~/9780131495050/?ar">https://learning.oreilly.com/library/view/~/9780131495050/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9780131495050/?ar">https://go.oreilly.com/library-access/library/view/-/9780131495050/?ar</a><br/>Format:&#160;Electronic Resources<br/> Test-Driven Development with Mockito. ent://SD_ILS/0/SD_ILS:1264919 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Acharya, Sujoy.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1569496">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Continuous enterprise development in Java ent://SD_ILS/0/SD_ILS:2302790 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Rubinger, Andrew Lee.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781449332082/?ar">https://go.oreilly.com/library-access/library/view/-/9781449332082/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781449332082">https://learning.oreilly.com/library/view/~/9781449332082</a> <a href="https://learning.oreilly.com/library/view/~/9781449332082/?ar">https://learning.oreilly.com/library/view/~/9781449332082/?ar</a><br/>Format:&#160;Electronic Resources<br/> Test Driven Development : By Example. ent://SD_ILS/0/SD_ILS:2317900 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Beck, Kent, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/0321146530/?ar">https://go.oreilly.com/library-access/library/view/-/0321146530/?ar</a> <a href="https://learning.oreilly.com/library/view/~/0321146530/?ar">https://learning.oreilly.com/library/view/~/0321146530/?ar</a> <a href="https://learning.oreilly.com/library/view/~/0321146530">https://learning.oreilly.com/library/view/~/0321146530</a><br/>Format:&#160;Electronic Resources<br/> Embedded systems and software validation ent://SD_ILS/0/SD_ILS:2324764 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Roychoudhury, Abhik. (uri) http://id.loc.gov/authorities/names/n2009016159 (uri) http://viaf.org/viaf/sourceID/LC%7cn2009016159<br/><a href="https://learning.oreilly.com/library/view/~/9780080921259">https://learning.oreilly.com/library/view/~/9780080921259</a> <a href="https://go.oreilly.com/library-access/library/view/-/9780080921259/?ar">https://go.oreilly.com/library-access/library/view/-/9780080921259/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9780080921259/?ar">https://learning.oreilly.com/library/view/~/9780080921259/?ar</a><br/>Format:&#160;Electronic Resources<br/> Testing and Quality Assurance for Component-Based Software. ent://SD_ILS/0/SD_ILS:1183348 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Gao, Jerry.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=227638">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Jenkins Continuous Integration Cookbook. ent://SD_ILS/0/SD_ILS:1282178 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Berg, Alan Mark.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1953232">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Developer testing : building quality into software ent://SD_ILS/0/SD_ILS:2311391 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Tarlinder, Alexander, author.<br/><a href="https://learning.oreilly.com/library/view/~/9780134291109/?ar">https://learning.oreilly.com/library/view/~/9780134291109/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9780134291109/?ar">https://go.oreilly.com/library-access/library/view/-/9780134291109/?ar</a><br/>Format:&#160;Electronic Resources<br/> Agile automation and unified funtional testing ent://SD_ILS/0/SD_ILS:2314311 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Gupta Rajeev, author.<br/><a href="https://learning.oreilly.com/library/view/~/9789332578944/?ar">https://learning.oreilly.com/library/view/~/9789332578944/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9789332578944/?ar">https://go.oreilly.com/library-access/library/view/-/9789332578944/?ar</a><br/>Format:&#160;Electronic Resources<br/> JavaScript unit testing : a hands-on approach to JS testing and automation ent://SD_ILS/0/SD_ILS:2309343 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Trostler, Mark Ethan, speaker.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781771374569/?ar">https://go.oreilly.com/library-access/library/view/-/9781771374569/?ar</a> <a href="https://learning.oreilly.com/videos/~/9781771374569/?ar">https://learning.oreilly.com/videos/~/9781771374569/?ar</a><br/>Format:&#160;Electronic Resources<br/> Lean enterprise : adopting continous delivery, devops, and lean startup at scale ent://SD_ILS/0/SD_ILS:2305393 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Humble, Jez, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781491946527/?ar">https://go.oreilly.com/library-access/library/view/-/9781491946527/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781491946527/?ar">https://learning.oreilly.com/library/view/~/9781491946527/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781491946527">https://learning.oreilly.com/library/view/~/9781491946527</a><br/>Format:&#160;Electronic Resources<br/> Lean enterprise : Mit agilen Methoden zum innovativen Unternehmen ent://SD_ILS/0/SD_ILS:2315679 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Humble, Jez, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781492066903/?ar">https://go.oreilly.com/library-access/library/view/-/9781492066903/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781492066903/?ar">https://learning.oreilly.com/library/view/~/9781492066903/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781492066903">https://learning.oreilly.com/library/view/~/9781492066903</a><br/>Format:&#160;Electronic Resources<br/> Software Error Detection through Testing and Analysis. ent://SD_ILS/0/SD_ILS:1207612 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Huang, J. C.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=456102">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Jenkins bootcamp : quick introduction to the Jenkins Continuous Integration server for beginners and focusing on Windows systems ent://SD_ILS/0/SD_ILS:2312695 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Taylor, Jason, speaker.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781787124134/?ar">https://go.oreilly.com/library-access/library/view/-/9781787124134/?ar</a> <a href="https://learning.oreilly.com/videos/~/9781787124134/?ar">https://learning.oreilly.com/videos/~/9781787124134/?ar</a><br/>Format:&#160;Electronic Resources<br/> Observability for developers : how to get from here to there ent://SD_ILS/0/SD_ILS:2322687 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Yen, Christine, on-screen presenter.<br/><a 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2025-06-16T03:02:49Z by&#160;Last, Mark.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1679479">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Software testing and continuous quality improvement ent://SD_ILS/0/SD_ILS:2287350 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Lewis, William E.<br/><a href="https://learning.oreilly.com/library/view/~/9781351722209/?ar">https://learning.oreilly.com/library/view/~/9781351722209/?ar</a> <a href="https://go.oreilly.com/library-access/library/view/-/9781351722209/?ar">https://go.oreilly.com/library-access/library/view/-/9781351722209/?ar</a><br/>Format:&#160;Electronic Resources<br/> Python testing with Pytest : simple, rapid, effective, and scalable ent://SD_ILS/0/SD_ILS:2314788 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Okken, Brian, author<br/><a href="https://learning.oreilly.com/library/view/~/9781680502848">https://learning.oreilly.com/library/view/~/9781680502848</a> <a 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Adam Leon, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781780175782/?ar">https://go.oreilly.com/library-access/library/view/-/9781780175782/?ar</a> <a href="https://learning.oreilly.com/library/view/~/9781780175782">https://learning.oreilly.com/library/view/~/9781780175782</a> <a href="https://learning.oreilly.com/library/view/~/9781780175782/?ar">https://learning.oreilly.com/library/view/~/9781780175782/?ar</a><br/>Format:&#160;Electronic Resources<br/> Composite Filament Winding. ent://SD_ILS/0/SD_ILS:1287965 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Peters, S.T.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3002455">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Placement Preparation. ent://SD_ILS/0/SD_ILS:1199021 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Parthasarathy, S.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=358036">Click to 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finite state machines ent://SD_ILS/0/SD_ILS:2134017 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Takan, Savaş, author.<br/><a href="https://hdl.handle.net/11147/7488">Access to Electronic Versiyon.</a><br/>Format:&#160;Manuscript<br/> Analysis of intrusion prevention methods ent://SD_ILS/0/SD_ILS:47461 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Semerci, Hakan.<br/><a href="http://hdl.handle.net/11147/3695">Access to Electronic Version.</a><br/>Format:&#160;Manuscript<br/> Practical Strategies for Living with Dyslexia. ent://SD_ILS/0/SD_ILS:1290767 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Chivers, Maria.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3015864">Click to View</a><br/>Format:&#160;Electronic Resources<br/> 5G Wireless Systems Simulation and Evaluation Techniques ent://SD_ILS/0/SD_ILS:2087313 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Yang, Yang. author.<br/><a href="https://doi.org/10.1007/978-3-319-61869-2">https://doi.org/10.1007/978-3-319-61869-2</a><br/>Format:&#160;Electronic Resources<br/> Survey Automation : Report and Workshop Proceedings. ent://SD_ILS/0/SD_ILS:1317878 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Council, National Research.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3375791">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Accidental Systems Librarian. ent://SD_ILS/0/SD_ILS:1311030 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Engard, Nicole C.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3316164">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Graph Theory, Combinatorics and Algorithms Interdisciplinary Applications ent://SD_ILS/0/SD_ILS:504341 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Golumbic, Martin Charles. editor.<br/><a href="http://dx.doi.org/10.1007/b106672">http://dx.doi.org/10.1007/b106672</a><br/>Format:&#160;Electronic Resources<br/> Embedded Software and Systems Second International Conference, ICESS 2005, Xi&rsquo;an, China, December 16-18, 2005. 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Proceedings ent://SD_ILS/0/SD_ILS:510452 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Maziero, Carlos Alberto. editor.<br/><a href="http://dx.doi.org/10.1007/11572329">http://dx.doi.org/10.1007/11572329</a><br/>Format:&#160;Electronic Resources<br/> Big Data Technologies and Applications 8th International Conference, BDTA 2017, Gwangju, South Korea, November 23&ndash;24, 2017, Proceedings ent://SD_ILS/0/SD_ILS:2084123 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Jung, Jason J. editor.<br/><a href="https://doi.org/10.1007/978-3-319-98752-1">https://doi.org/10.1007/978-3-319-98752-1</a><br/>Format:&#160;Electronic Resources<br/> Computer Performance Engineering 15th European Workshop, EPEW 2018, Paris, France, October 29-30, 2018, Proceedings ent://SD_ILS/0/SD_ILS:2085400 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Bakhshi, Rena. editor.<br/><a href="https://doi.org/10.1007/978-3-030-02227-3">https://doi.org/10.1007/978-3-030-02227-3</a><br/>Format:&#160;Electronic Resources<br/> System engineering management ent://SD_ILS/0/SD_ILS:2059599 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Blanchard, Benjamin S., author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4413733">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Software Systems Safety. ent://SD_ILS/0/SD_ILS:1284126 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Grumberg, O.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=2033821">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Software Engineering Research, Management and Applications ent://SD_ILS/0/SD_ILS:502810 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Lee, Roger. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-70561-1">http://dx.doi.org/10.1007/978-3-540-70561-1</a><br/>Format:&#160;Electronic Resources<br/> Maya Plugin Power. ent://SD_ILS/0/SD_ILS:1304829 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Smith, Mark Jennings.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3136088">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Climbing and Walking Robots Proceedings of the 8th International Conference on Climbing and Walking Robots and the Support Technologies for Mobile Machines (CLAWAR 2005) ent://SD_ILS/0/SD_ILS:508869 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Tokhi, M. O. editor.<br/><a href="http://dx.doi.org/10.1007/3-540-26415-9">http://dx.doi.org/10.1007/3-540-26415-9</a><br/>Format:&#160;Electronic Resources<br/> Guide to Discrete Mathematics An Accessible Introduction to the History, Theory, Logic and Applications ent://SD_ILS/0/SD_ILS:2084526 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;O'Regan, Gerard. author.<br/><a href="https://doi.org/10.1007/978-3-319-44561-8">https://doi.org/10.1007/978-3-319-44561-8</a><br/>Format:&#160;Electronic Resources<br/> Internet of Things with the Arduino Y&uacute;n. ent://SD_ILS/0/SD_ILS:1272111 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Schwartz, Marco.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1688637">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Engineering Dependable Software Systems. ent://SD_ILS/0/SD_ILS:1263377 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Broy, M.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1477301">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Programming Interviews Exposed : Secrets to Landing Your Next Job. ent://SD_ILS/0/SD_ILS:1239630 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Gigu&egrave;re, Eric.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=861686">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Formal Methods for Industrial Critical Systems 12th International Workshop, FMICS 2007, Berlin, Germany, July 1-2, 2007, Revised Selected Papers ent://SD_ILS/0/SD_ILS:503548 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Leue, Stefan. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-79707-4">http://dx.doi.org/10.1007/978-3-540-79707-4</a><br/>Format:&#160;Electronic Resources<br/> Distributed and Parallel Systems In Focus: Desktop Grid Computing ent://SD_ILS/0/SD_ILS:501994 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Kacsuk, P&eacute;ter. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-79448-8">http://dx.doi.org/10.1007/978-0-387-79448-8</a><br/>Format:&#160;Electronic Resources<br/> Arduino Home Automation Projects. ent://SD_ILS/0/SD_ILS:1274524 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Schwartz, Marco.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1747751">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Trends in Computer Aided Innovation Second IFIP Working Conference on Computer Aided Innovation, October 8&ndash;9 2007, Michigan, USA ent://SD_ILS/0/SD_ILS:506055 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Le&oacute;n-Rovira, Noel. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-75456-7">http://dx.doi.org/10.1007/978-0-387-75456-7</a><br/>Format:&#160;Electronic Resources<br/> Art of Teaching Spanish : Second Language Acquisition from Research to Praxis. ent://SD_ILS/0/SD_ILS:1216480 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Salaberry, Rafael.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=547770">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Advances in Structures Analysis : Special Topic Volume with Invited Peer Reviewed Papers Only. ent://SD_ILS/0/SD_ILS:1278868 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Karama, Moussa.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1872616">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Software engineering effective teaching and learning approaches and practices ent://SD_ILS/0/SD_ILS:2261931 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Ellis, Heidi J. C.<br/>Chapter PDFs via platform: <a href="http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60566-102-5">http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60566-102-5</a><br/>Format:&#160;Electronic Resources<br/> New Trends in Software Methodologies, Tools and Techniques. ent://SD_ILS/0/SD_ILS:1252892 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Fujita, H.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1109526">Click to View</a><br/>Format:&#160;Electronic Resources<br/> A Brief History of Computing ent://SD_ILS/0/SD_ILS:502485 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;O&rsquo;Regan, Gerard. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-84800-084-1">http://dx.doi.org/10.1007/978-1-84800-084-1</a><br/>Format:&#160;Electronic Resources<br/> Hardware and Software, Verification and Testing Second International Haifa Verification Conference, HVC 2006, Haifa, Israel, October 23-26, 2006. Revised Selected Papers ent://SD_ILS/0/SD_ILS:512239 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Bin, Eyal. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-70889-6">http://dx.doi.org/10.1007/978-3-540-70889-6</a><br/>Format:&#160;Electronic Resources<br/> Electronic Postage Systems Technology, Security, Economics ent://SD_ILS/0/SD_ILS:505571 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Bleumer, Gerrit. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-44606-6">http://dx.doi.org/10.1007/978-0-387-44606-6</a><br/>Format:&#160;Electronic Resources<br/> Artificial Immune Systems 6th International Conference, ICARIS 2007, Santos, Brazil, August 26-29, 2007. Proceedings ent://SD_ILS/0/SD_ILS:512736 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Castro, Leandro Nunes. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-73922-7">http://dx.doi.org/10.1007/978-3-540-73922-7</a><br/>Format:&#160;Electronic Resources<br/> Selected papers from the 16thInternational Conference on Electronical machines ICEM. ent://SD_ILS/0/SD_ILS:1187176 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Wiak, S.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=267424">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Component-Oriented Programming. ent://SD_ILS/0/SD_ILS:1183545 2025-06-16T03:02:49Z 2025-06-16T03:02:49Z by&#160;Wang, Andy Ju An.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=228466">Click to View</a><br/>Format:&#160;Electronic Resources<br/>