Arama Sonuçları Microelectronics.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qu$003dMicroelectronics.$0026ps$003d300?dt=list2025-07-14T00:16:32ZMicroelectronicsent://SD_ILS/0/SD_ILS:35822025-07-14T00:16:32Z2025-07-14T00:16:32Zby Millman, Jacob, author.<br/>Format: Books<br/>RF microelectronicsent://SD_ILS/0/SD_ILS:22923072025-07-14T00:16:32Z2025-07-14T00:16:32Zby Razavi, Behzad, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780132851824/?ar">https://go.oreilly.com/library-access/library/view/-/9780132851824/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9780132851824/?ar">https://learning.oreilly.com/library/view/~/9780132851824/?ar</a><br/>Format: Electronic Resources<br/>Space microelectronicsent://SD_ILS/0/SD_ILS:22307982025-07-14T00:16:32Z2025-07-14T00:16:32Zby Belous, A. I. (AnatoliÄ Ivanovich), author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5430736">Click to View</a><br/>Format: Electronic Resources<br/>Chemistry in Microelectronics.ent://SD_ILS/0/SD_ILS:12556522025-07-14T00:16:32Z2025-07-14T00:16:32Zby Le Tiec, Yannick.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1138976">Click to View</a><br/>Format: Electronic Resources<br/>Adhesion in Microelectronics.ent://SD_ILS/0/SD_ILS:12756162025-07-14T00:16:32Z2025-07-14T00:16:32Zby Mittal, K. L.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1767917">Click to View</a><br/>Format: Electronic Resources<br/>Mechanics of Microelectronicsent://SD_ILS/0/SD_ILS:5070682025-07-14T00:16:32Z2025-07-14T00:16:32Zby Zhang, G. Q. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-4935-8">http://dx.doi.org/10.1007/1-4020-4935-8</a><br/>Format: Electronic Resources<br/>Materials science in microelectronicsent://SD_ILS/0/SD_ILS:677132025-07-14T00:16:32Z2025-07-14T00:16:32Zby Machlin, E. S.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446400">An electronic book accessible through the World Wide Web; click for information</a>
Publisher description <a href="http://www.loc.gov/catdir/enhancements/fy0629/2005934958-d.html">http://www.loc.gov/catdir/enhancements/fy0629/2005934958-d.html</a><br/>Format: Electronic Resources<br/>Materials science in microelectronicsent://SD_ILS/0/SD_ILS:676362025-07-14T00:16:32Z2025-07-14T00:16:32Zby Machlin, E. S.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446394">An electronic book accessible through the World Wide Web; click for information</a>
Publisher description <a href="http://www.loc.gov/catdir/enhancements/fy0629/2005934958-d.html">http://www.loc.gov/catdir/enhancements/fy0629/2005934958-d.html</a><br/>Format: Electronic Resources<br/>Fundamentals of microelectronics processing.ent://SD_ILS/0/SD_ILS:37672025-07-14T00:16:32Z2025-07-14T00:16:32Zby Lee, Hong H.<br/>Format: Books<br/>Microelectronics : systems and devicesent://SD_ILS/0/SD_ILS:22837592025-07-14T00:16:32Z2025-07-14T00:16:32Zby Bishop, O. N. (Owen Neville)<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780750647236/?ar">https://go.oreilly.com/library-access/library/view/-/9780750647236/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9780750647236/?ar">https://learning.oreilly.com/library/view/~/9780750647236/?ar</a><br/>Format: Electronic Resources<br/>The materials science of microelectronics.ent://SD_ILS/0/SD_ILS:29982025-07-14T00:16:32Z2025-07-14T00:16:32Zby Bachmann, Klaus J.<br/>Format: Books<br/>Microelectronics Failure Analysis Desk Reference.ent://SD_ILS/0/SD_ILS:12879632025-07-14T00:16:32Z2025-07-14T00:16:32Zby Ross, Richard J.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3002453">Click to View</a><br/>Format: Electronic Resources<br/>Microelectronics failure analysis : desk referenceent://SD_ILS/0/SD_ILS:22177842025-07-14T00:16:32Z2025-07-14T00:16:32Zby Gandhi, Tejinder, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5976228">Click to View</a><br/>Format: Electronic Resources<br/>Microelectronics : circuit analysis and designent://SD_ILS/0/SD_ILS:800822025-07-14T00:16:32Z2025-07-14T00:16:32Zby Neamen, Donald A.<br/>Format: Books<br/>Field Emission in Vacuum Microelectronicsent://SD_ILS/0/SD_ILS:5046272025-07-14T00:16:32Z2025-07-14T00:16:32Zby Fursey, George. author.<br/><a href="http://dx.doi.org/10.1007/b139052">http://dx.doi.org/10.1007/b139052</a><br/>Format: Electronic Resources<br/>Nanotechnology for microelectronics and optoelectronicsent://SD_ILS/0/SD_ILS:4758042025-07-14T00:16:32Z2025-07-14T00:16:32Zby Martinez-Duart, J. M.<br/>Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpNMO00002">http://app.knovel.com/web/toc.v/cid:kpNMO00002</a><br/>Format: Electronic Resources<br/>Nanotechnology for microelectronics and photonicsent://SD_ILS/0/SD_ILS:22124572025-07-14T00:16:32Z2025-07-14T00:16:32Zby Martin-Palma, Raul Jose, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4871126">Click to View</a><br/>Format: Electronic Resources<br/>Nano and giga challenges in microelectronicsent://SD_ILS/0/SD_ILS:676522025-07-14T00:16:32Z2025-07-14T00:16:32Zby Greer, Jim.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444514943">An electronic book accessible through the World Wide Web; click for information</a>
Publisher description <a href="http://www.loc.gov/catdir/enhancements/fy0620/2004295065-d.html">http://www.loc.gov/catdir/enhancements/fy0620/2004295065-d.html</a><br/>Format: Electronic Resources<br/>Understanding Microelectronics : A Top-Down Approach.ent://SD_ILS/0/SD_ILS:12363102025-07-14T00:16:32Z2025-07-14T00:16:32Zby Maloberti, Franco.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=819261">Click to View</a><br/>Format: Electronic Resources<br/>PIC microcontrollers an introduction to microelectronicsent://SD_ILS/0/SD_ILS:22054652025-07-14T00:16:32Z2025-07-14T00:16:32Zby Bates, Martin.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=767261">Click to View</a><br/>Format: Electronic Resources<br/>Nanolithography and patterning techniques in microelectronicsent://SD_ILS/0/SD_ILS:4758282025-07-14T00:16:32Z2025-07-14T00:16:32Zby Bucknall, David G.<br/>Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpNPTM000N">http://app.knovel.com/web/toc.v/cid:kpNPTM000N</a><br/>Format: Electronic Resources<br/>Microelectronics From Fundamentals to Applied Designent://SD_ILS/0/SD_ILS:20874252025-07-14T00:16:32Z2025-07-14T00:16:32Zby Di Paolo Emilio, Maurizio. author.<br/><a href="https://doi.org/10.1007/978-3-319-22545-6">https://doi.org/10.1007/978-3-319-22545-6</a><br/>Format: Electronic Resources<br/>Future Trends in Microelectronics : Frontiers and Innovations.ent://SD_ILS/0/SD_ILS:12590002025-07-14T00:16:32Z2025-07-14T00:16:32Zby Luryi, Serge.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1211932">Click to View</a><br/>Format: Electronic Resources<br/>Future trends in microelectronics : Journey into the unknownent://SD_ILS/0/SD_ILS:20609932025-07-14T00:16:32Z2025-07-14T00:16:32Zby Luryi, Serge, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4661483">Click to View</a><br/>Format: Electronic Resources<br/>Exploiting second harmonic generation for microelectronics interface characterizationent://SD_ILS/0/SD_ILS:11773512025-07-14T00:16:32Z2025-07-14T00:16:32Zby Soylu, Gizem, author.<br/><a href="http://hdl.handle.net/11147/2827">Access to Electronic Versiyon.</a><br/>Format: Manuscript<br/>Microelectronics, Electromagnetics and Telecommunications Proceedings of ICMEET 2017ent://SD_ILS/0/SD_ILS:20872792025-07-14T00:16:32Z2025-07-14T00:16:32Zby Anguera, Jaume. editor.<br/><a href="https://doi.org/10.1007/978-981-10-7329-8">https://doi.org/10.1007/978-981-10-7329-8</a><br/>Format: Electronic Resources<br/>Nanotechnology and microelectronics global diffusion, economics and policyent://SD_ILS/0/SD_ILS:22622022025-07-14T00:16:32Z2025-07-14T00:16:32Zby Ekekwe, Ndubuisi, 1973-<br/>Chapter PDFs via platform: <a href="http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-61692-006-7">http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-61692-006-7</a><br/>Format: Electronic Resources<br/>Microelectronics, Electromagnetics and Telecommunications Proceedings of ICMEET 2015ent://SD_ILS/0/SD_ILS:20863642025-07-14T00:16:32Z2025-07-14T00:16:32Zby Satapathy, Suresh Chandra. editor.<br/><a href="https://doi.org/10.1007/978-81-322-2728-1">https://doi.org/10.1007/978-81-322-2728-1</a><br/>Format: Electronic Resources<br/>Future trends in microelectronics : up the nano creekent://SD_ILS/0/SD_ILS:22839642025-07-14T00:16:32Z2025-07-14T00:16:32Zby FTM-5 (2006 : Crete, Greece)<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780470081464/?ar">https://go.oreilly.com/library-access/library/view/-/9780470081464/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9780470081464">https://learning.oreilly.com/library/view/~/9780470081464</a><br/>Format: Electronic Resources<br/>III-V compound semiconductors integration with silicon-based microelectronicsent://SD_ILS/0/SD_ILS:21254552025-07-14T00:16:32Z2025-07-14T00:16:32Zby Li, Tingkai.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=631695">Click to View</a><br/>Format: Electronic Resources<br/>Computational electrodynamics : a gauge approach with applications in microelectronicsent://SD_ILS/0/SD_ILS:22124992025-07-14T00:16:32Z2025-07-14T00:16:32Zby Schoenmaker, Wim, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4874048">Click to View</a><br/>Format: Electronic Resources<br/>PVD for microelectronics sputter deposition applied to semiconductor manufacturingent://SD_ILS/0/SD_ILS:676412025-07-14T00:16:32Z2025-07-14T00:16:32Zby Powell, Ronald A.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/publication?issn=10794050&volume=26">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Future trends in microelectronics : from nanophotonics to sensors and energyent://SD_ILS/0/SD_ILS:22896932025-07-14T00:16:32Z2025-07-14T00:16:32Zby Luryi, Serge, editor.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780470551370/?ar">https://go.oreilly.com/library-access/library/view/-/9780470551370/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9780470551370/?ar">https://learning.oreilly.com/library/view/~/9780470551370/?ar</a><br/>Format: Electronic Resources<br/>Microelectronics, Microsystems and Nanotechnology : Papers Presented of at Mmn 2000.ent://SD_ILS/0/SD_ILS:12713802025-07-14T00:16:32Z2025-07-14T00:16:32Zby Nassiopoulou, Androula G.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1681375">Click to View</a><br/>Format: Electronic Resources<br/>Space Microelectronics. Volume 2 : integrated circuit design for space applicationsent://SD_ILS/0/SD_ILS:22307992025-07-14T00:16:32Z2025-07-14T00:16:32Zby Belous, Anatoly, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5430739">Click to View</a><br/>Format: Electronic Resources<br/>Robust design of microelectronics assemblies against mechanical schock, temperature and moistureent://SD_ILS/0/SD_ILS:20980372025-07-14T00:16:32Z2025-07-14T00:16:32Zby Wong, E- H., author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=2056911">Click to View</a><br/>Format: Electronic Resources<br/>Proceedings of the International Conference on Microelectronics, Computing & Communication Systems MCCS 2015ent://SD_ILS/0/SD_ILS:20880762025-07-14T00:16:32Z2025-07-14T00:16:32Zby Nath, Vijay. editor.<br/><a href="https://doi.org/10.1007/978-981-10-5565-2">https://doi.org/10.1007/978-981-10-5565-2</a><br/>Format: Electronic Resources<br/>Porous Silicon: From Formation to Applications: Optoelectronics, Microelectronics, and Energy Technology Applications, Volume Threeent://SD_ILS/0/SD_ILS:23281792025-07-14T00:16:32Z2025-07-14T00:16:32Zby Korotcenkov, Ghenadii, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781498782555/?ar">https://go.oreilly.com/library-access/library/view/-/9781498782555/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781498782555">https://learning.oreilly.com/library/view/~/9781498782555</a><br/>Format: Electronic Resources<br/>Emerging Topics in Heat and Mass Transfer in Porous Media From Bioengineering and Microelectronics to Nanotechnologyent://SD_ILS/0/SD_ILS:5022062025-07-14T00:16:32Z2025-07-14T00:16:32Zby Vadász, Peter. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-8178-1">http://dx.doi.org/10.1007/978-1-4020-8178-1</a><br/>Format: Electronic Resources<br/>Imaps 2018ent://SD_ILS/0/SD_ILS:22683022025-07-14T00:16:32Z2025-07-14T00:16:32Zby Skwarek, Agata, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5877805">Click to View</a><br/>Format: Electronic Resources<br/>EMPC/IMAPS 2017 Polandent://SD_ILS/0/SD_ILS:22676622025-07-14T00:16:32Z2025-07-14T00:16:32Zby Skwarek, Agata, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5526229">Click to View</a><br/>Format: Electronic Resources<br/>IMAPS-CMPT Poland 2015ent://SD_ILS/0/SD_ILS:22657992025-07-14T00:16:32Z2025-07-14T00:16:32Zby Skwarek, Agata, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4709201">Click to View</a><br/>Format: Electronic Resources<br/>IMAPS-CPMT 2016 Polandent://SD_ILS/0/SD_ILS:22668792025-07-14T00:16:32Z2025-07-14T00:16:32Zby Skwarek, Agata, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5098590">Click to View</a><br/>Format: Electronic Resources<br/>Advanced Gate Stacks for High-Mobility Semiconductorsent://SD_ILS/0/SD_ILS:5123492025-07-14T00:16:32Z2025-07-14T00:16:32Zby Dimoulas, Athanasios. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-71491-0">http://dx.doi.org/10.1007/978-3-540-71491-0</a><br/>Format: Electronic Resources<br/>Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologiesent://SD_ILS/0/SD_ILS:5071312025-07-14T00:16:32Z2025-07-14T00:16:32Zby Henzler, Stephan. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-5081-X">http://dx.doi.org/10.1007/1-4020-5081-X</a><br/>Format: Electronic Resources<br/>High-Dynamic-Range (HDR) Visionent://SD_ILS/0/SD_ILS:5116692025-07-14T00:16:32Z2025-07-14T00:16:32Zby Hoefflinger, Bernd. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-44433-6">http://dx.doi.org/10.1007/978-3-540-44433-6</a><br/>Format: Electronic Resources<br/>Introduction to MOS LSI designent://SD_ILS/0/SD_ILS:52732025-07-14T00:16:32Z2025-07-14T00:16:32Zby Mavor, J.<br/>Format: Books<br/>High Performance Integer Arithmetic Circuit Design on FPGA Architecture, Implementation and Design Automationent://SD_ILS/0/SD_ILS:20874742025-07-14T00:16:32Z2025-07-14T00:16:32Zby Palchaudhuri, Ayan. author.<br/><a href="https://doi.org/10.1007/978-81-322-2520-1">https://doi.org/10.1007/978-81-322-2520-1</a><br/>Format: Electronic Resources<br/>Fundamentals of Bias Temperature Instability in MOS Transistors Characterization Methods, Process and Materials Impact, DC and AC Modelingent://SD_ILS/0/SD_ILS:20864022025-07-14T00:16:32Z2025-07-14T00:16:32Zby Mahapatra, Souvik. editor.<br/><a href="https://doi.org/10.1007/978-81-322-2508-9">https://doi.org/10.1007/978-81-322-2508-9</a><br/>Format: Electronic Resources<br/>Architecture Exploration of FPGA Based Accelerators for BioInformatics Applicationsent://SD_ILS/0/SD_ILS:20883122025-07-14T00:16:32Z2025-07-14T00:16:32Zby Varma, B. Sharat Chandra. author.<br/><a href="https://doi.org/10.1007/978-981-10-0591-6">https://doi.org/10.1007/978-981-10-0591-6</a><br/>Format: Electronic Resources<br/>Microcontrollers in Practiceent://SD_ILS/0/SD_ILS:5094082025-07-14T00:16:32Z2025-07-14T00:16:32Zby Mitescu, Marian. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28308-0">http://dx.doi.org/10.1007/3-540-28308-0</a><br/>Format: Electronic Resources<br/>Low Power VCO Design in CMOSent://SD_ILS/0/SD_ILS:5095622025-07-14T00:16:32Z2025-07-14T00:16:32Zby Tiebout, Marc. author.<br/><a href="http://dx.doi.org/10.1007/3-540-29256-X">http://dx.doi.org/10.1007/3-540-29256-X</a><br/>Format: Electronic Resources<br/>Detection and Signal Processing Technical Realizationent://SD_ILS/0/SD_ILS:5096072025-07-14T00:16:32Z2025-07-14T00:16:32Zby Witteman, Wilhelmus Jacobus. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-29600-3">http://dx.doi.org/10.1007/978-3-540-29600-3</a><br/>Format: Electronic Resources<br/>System-level Test and Validation of Hardware/Software Systemsent://SD_ILS/0/SD_ILS:5084002025-07-14T00:16:32Z2025-07-14T00:16:32Zby Sonza Reorda, Matteo. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-145-8">http://dx.doi.org/10.1007/1-84628-145-8</a><br/>Format: Electronic Resources<br/>Continuous-Time Sigma-Delta A/D Conversion Fundamentals, Performance Limits and Robust Implementationsent://SD_ILS/0/SD_ILS:5094312025-07-14T00:16:32Z2025-07-14T00:16:32Zby Ortmanns, Maurits. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28473-7">http://dx.doi.org/10.1007/3-540-28473-7</a><br/>Format: Electronic Resources<br/>Bonding in Microsystem Technologyent://SD_ILS/0/SD_ILS:5069342025-07-14T00:16:32Z2025-07-14T00:16:32Zby Dziuban, Jan A. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4589-1">http://dx.doi.org/10.1007/1-4020-4589-1</a><br/>Format: Electronic Resources<br/>Highly Sensitive Optical Receiversent://SD_ILS/0/SD_ILS:5096122025-07-14T00:16:32Z2025-07-14T00:16:32Zby Schneider, Kerstin. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-29614-0">http://dx.doi.org/10.1007/978-3-540-29614-0</a><br/>Format: Electronic Resources<br/>Microwave Electronicsent://SD_ILS/0/SD_ILS:20863072025-07-14T00:16:32Z2025-07-14T00:16:32Zby Grigoriev, Andrey D. author.<br/><a href="https://doi.org/10.1007/978-3-319-68891-6">https://doi.org/10.1007/978-3-319-68891-6</a><br/>Format: Electronic Resources<br/>Lattices of Dielectric Resonatorsent://SD_ILS/0/SD_ILS:20875882025-07-14T00:16:32Z2025-07-14T00:16:32Zby Trubin, Alexander. author.<br/><a href="https://doi.org/10.1007/978-3-319-25148-6">https://doi.org/10.1007/978-3-319-25148-6</a><br/>Format: Electronic Resources<br/>Gettering Defects in Semiconductorsent://SD_ILS/0/SD_ILS:5095962025-07-14T00:16:32Z2025-07-14T00:16:32Zby Perevoschikov, Victor A. author.<br/><a href="http://dx.doi.org/10.1007/3-540-29499-6">http://dx.doi.org/10.1007/3-540-29499-6</a><br/>Format: Electronic Resources<br/>High Dielectric Constant Materials VLSI MOSFET Applicationsent://SD_ILS/0/SD_ILS:5088852025-07-14T00:16:32Z2025-07-14T00:16:32Zby Huff, H.R. editor.<br/><a href="http://dx.doi.org/10.1007/b137574">http://dx.doi.org/10.1007/b137574</a><br/>Format: Electronic Resources<br/>Analysis of microelectronic materials and devicesent://SD_ILS/0/SD_ILS:141732025-07-14T00:16:32Z2025-07-14T00:16:32Zby Grasserbauer, Manfred, 1945-<br/>Format: Books<br/>Imaps 2018ent://SD_ILS/0/SD_ILS:22682532025-07-14T00:16:32Z2025-07-14T00:16:32Zby Skwarek, Agata, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5825962">Click to View</a><br/>Format: Electronic Resources<br/>The Swedish microchipping phenomenonent://SD_ILS/0/SD_ILS:22210762025-07-14T00:16:32Z2025-07-14T00:16:32Zby Petersén, Moa, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5889412">Click to View</a><br/>Format: Electronic Resources<br/>Microengineering aerospace systemsent://SD_ILS/0/SD_ILS:4736432025-07-14T00:16:32Z2025-07-14T00:16:32Zby Helvajian, Henry.<br/>Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpMAS00022">http://app.knovel.com/web/toc.v/cid:kpMAS00022</a><br/>Format: Electronic Resources<br/>Mimicking the tumor microenvironment in lab-on-a-chip devicesent://SD_ILS/0/SD_ILS:21339472025-07-14T00:16:32Z2025-07-14T00:16:32Zby Bilgen, Müge, author.<br/><a href="https://hdl.handle.net/11147/7383">Access to Electronic Versiyon.</a><br/>Format: Manuscript<br/>COMMERCIALIZING NANOTECHNOLOGY : a roadmap to taking nanoproducts from laboratory to market.ent://SD_ILS/0/SD_ILS:23270972025-07-14T00:16:32Z2025-07-14T00:16:32Zby QUAZI, HEBAB A.<br/><a href="https://learning.oreilly.com/library/view/~/9780429524349">https://learning.oreilly.com/library/view/~/9780429524349</a>
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<a href="https://learning.oreilly.com/library/view/~/9780429524349/?ar">https://learning.oreilly.com/library/view/~/9780429524349/?ar</a><br/>Format: Electronic Resources<br/>Beam Technologies for Integrated Processing.ent://SD_ILS/0/SD_ILS:13181152025-07-14T00:16:32Z2025-07-14T00:16:32Zby Staff, National Research Council.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3376029">Click to View</a><br/>Format: Electronic Resources<br/>Imaps 2019ent://SD_ILS/0/SD_ILS:22691502025-07-14T00:16:32Z2025-07-14T00:16:32Zby Skwarek, Agata, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=6423601">Click to View</a><br/>Format: Electronic Resources<br/>Photopolymers : photoresist materials, processes, and applicationsent://SD_ILS/0/SD_ILS:23037552025-07-14T00:16:32Z2025-07-14T00:16:32Zby Nakamura, Kenichiro (Chemical engineer), author.<br/><a href="https://learning.oreilly.com/library/view/~/9781466517288/?ar">https://learning.oreilly.com/library/view/~/9781466517288/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781466517288">https://learning.oreilly.com/library/view/~/9781466517288</a><br/>Format: Electronic Resources<br/>Advanced Micro-Device Engineering IV.ent://SD_ILS/0/SD_ILS:12808362025-07-14T00:16:32Z2025-07-14T00:16:32Zby Hosaka, Sumio.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1910523">Click to View</a><br/>Format: Electronic Resources<br/>Silicon Science and Advanced Micro-Device Engineering II : Selected, Peer Reviewed Papers from the 6th International Symposium on Silicon Science and 2nd International Conference on Advanced Micro-device Engineering, December 9-10, 2010, Kiryu City Performing Arts Center, Kiryu, Japan.ent://SD_ILS/0/SD_ILS:12789002025-07-14T00:16:32Z2025-07-14T00:16:32Zby Hanaizumi, Osamu.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1872733">Click to View</a><br/>Format: Electronic Resources<br/>Silicon Science and Advanced Micro-Device Engineering I : Selected, Peer Reviewed Papers from the 5th International Symposium on Silicon Science and the 1st International Conference on Advanced Micro-device Engineering (ISSS & AMDE 2009), Was Held by the International Education and Research Center for Silicon Sc.ent://SD_ILS/0/SD_ILS:12788442025-07-14T00:16:32Z2025-07-14T00:16:32Zby Hanaizumi, Osamu.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1872512">Click to View</a><br/>Format: Electronic Resources<br/>Systematische Mehrlagen-Integration hybrider Hochfrequenzschaltungenent://SD_ILS/0/SD_ILS:22722992025-07-14T00:16:32Z2025-07-14T00:16:32Zby Baras, Torben, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5019710">Click to View</a><br/>Format: Electronic Resources<br/>Inkjetgedruckte Elektronik : Untersuchungen zur einfachen Anwendung des Inkjetdrucks in der Leiterplattentechnikent://SD_ILS/0/SD_ILS:21196092025-07-14T00:16:32Z2025-07-14T00:16:32Zby Rudolph, Ferdinand, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4455681">Click to View</a><br/>Format: Electronic Resources<br/>Introduction to the physics of nanoelectronicsent://SD_ILS/0/SD_ILS:22070702025-07-14T00:16:32Z2025-07-14T00:16:32Zby Tan, Seng Ghee.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1584632">Click to View</a><br/>Format: Electronic Resources<br/>Handbook of thick film technologyent://SD_ILS/0/SD_ILS:81152025-07-14T00:16:32Z2025-07-14T00:16:32Zby Holmes, P. J., author.<br/>Format: Books<br/>Advances in chemical mechanical planarization (CMP)ent://SD_ILS/0/SD_ILS:22094302025-07-14T00:16:32Z2025-07-14T00:16:32Zby Babu, Suryadevara, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4332927">Click to View</a><br/>Format: Electronic Resources<br/>New approaches to image processing based failure analysis of nano-scale ULSI devicesent://SD_ILS/0/SD_ILS:22067522025-07-14T00:16:32Z2025-07-14T00:16:32Zby Zalevsky, Zeev.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1564558">Click to View</a><br/>Format: Electronic Resources<br/>Novel Advances in Microsystems Technologies and Their Applicationsent://SD_ILS/0/SD_ILS:23139242025-07-14T00:16:32Z2025-07-14T00:16:32Zby Francis, Laurent A., editor.<br/><a href="https://learning.oreilly.com/library/view/~/9781466560673/?ar">https://learning.oreilly.com/library/view/~/9781466560673/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781466560673">https://learning.oreilly.com/library/view/~/9781466560673</a><br/>Format: Electronic Resources<br/>Enabling Technologies for MEMS and Nanodevices : Advanced Micro and Nanosystems.ent://SD_ILS/0/SD_ILS:12122902025-07-14T00:16:32Z2025-07-14T00:16:32Zby Baltes, Henry.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=481311">Click to View</a><br/>Format: Electronic Resources<br/>Microsystem designent://SD_ILS/0/SD_ILS:2307622025-07-14T00:16:32Z2025-07-14T00:16:32Zby Senturia, Stephen D., 1940-<br/>EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=78508">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=78508</a><br/>Format: Electronic Resources<br/>Switching power supply design.ent://SD_ILS/0/SD_ILS:32012025-07-14T00:16:32Z2025-07-14T00:16:32Zby Pressman, Abraham I.<br/>Format: Books<br/>Electrokinetics in microfluidicsent://SD_ILS/0/SD_ILS:667542025-07-14T00:16:32Z2025-07-14T00:16:32Zby Li, Dongqing, 1956-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/publication?issn=15734285&volume=2">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Dynamical Systems, Wave-Based Computation and Neuro-Inspired Robotsent://SD_ILS/0/SD_ILS:5025712025-07-14T00:16:32Z2025-07-14T00:16:32Zby Arena, Paolo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-211-78775-5">http://dx.doi.org/10.1007/978-3-211-78775-5</a><br/>Format: Electronic Resources<br/>Nanomechanics of Materials and Structuresent://SD_ILS/0/SD_ILS:5066842025-07-14T00:16:32Z2025-07-14T00:16:32Zby Chuang, T. -J. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-3951-4">http://dx.doi.org/10.1007/1-4020-3951-4</a><br/>Format: Electronic Resources<br/>Atomic Layer Deposition : Principles, Characteristics, and Nanotechnology Applicatons.ent://SD_ILS/0/SD_ILS:12583072025-07-14T00:16:32Z2025-07-14T00:16:32Zby K??ri?inen, Tommi.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1192829">Click to View</a><br/>Format: Electronic Resources<br/>Hermeticity Testing of MEMS and Microelectronic Packages.ent://SD_ILS/0/SD_ILS:12766062025-07-14T00:16:32Z2025-07-14T00:16:32Zby Costello, Suzanne.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1790784">Click to View</a><br/>Format: Electronic Resources<br/>PIC Basic Projects : 30 Projects using PIC BASIC and PIC BASIC PRO.ent://SD_ILS/0/SD_ILS:11891132025-07-14T00:16:32Z2025-07-14T00:16:32Zby Ibrahim, Dogan.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=274701">Click to View</a><br/>Format: Electronic Resources<br/>System-on-chip next generation electronicsent://SD_ILS/0/SD_ILS:4735682025-07-14T00:16:32Z2025-07-14T00:16:32Zby Al-Hashimi, Bashir.<br/>Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpSCNGE001">http://app.knovel.com/web/toc.v/cid:kpSCNGE001</a><br/>Format: Electronic Resources<br/>Plasma Processing of Materials : Scientific Opportunities and Technological Challenges.ent://SD_ILS/0/SD_ILS:13183832025-07-14T00:16:32Z2025-07-14T00:16:32Zby Staff, National Research Council.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3376299">Click to View</a><br/>Format: Electronic Resources<br/>Micro Nano Devices, Structure and Computing Systems III : Selected, Peer Reviewed Papers from the 2014 3rd International Conference on Micro Nano Devices, Structure and Computing Systems (MNDSCS 2014), March 1-2, 2014, Singapore.ent://SD_ILS/0/SD_ILS:12808942025-07-14T00:16:32Z2025-07-14T00:16:32Zby Zhang, Zheng.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1910772">Click to View</a><br/>Format: Electronic Resources<br/>Design and Fabrication of Self-Powered Micro-Harvesters : Rotating and Vibrated Micro-Power Systems.ent://SD_ILS/0/SD_ILS:12703012025-07-14T00:16:32Z2025-07-14T00:16:32Zby Pan, C. T.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1673971">Click to View</a><br/>Format: Electronic Resources<br/>Sputtering Materials for VLSI and Thin Film Device.ent://SD_ILS/0/SD_ILS:12642442025-07-14T00:16:32Z2025-07-14T00:16:32Zby Sarkar, Jaydeep.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1550523">Click to View</a><br/>Format: Electronic Resources<br/>Microchip non-volatile memory products data bookent://SD_ILS/0/SD_ILS:881382025-07-14T00:16:32Z2025-07-14T00:16:32Zby Microchip Technology, Inc.<br/>Format: Books<br/>SiP-system in package design and simulation : MentorGraphics Expedition Enterprise Flow advanced design guideent://SD_ILS/0/SD_ILS:21118062025-07-14T00:16:32Z2025-07-14T00:16:32Zby Li, Suny, 1974- author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4915580">Click to View</a><br/>Format: Electronic Resources<br/>Flexitranstore : Special Session in the 21st International Symposium on High Voltage Engineering (ISH 2019)ent://SD_ILS/0/SD_ILS:22031602025-07-14T00:16:32Z2025-07-14T00:16:32Zby Németh, Bálint<br/><a href="https://library.oapen.org/bitstream/20.500.12657/23298/1/1006857.pdf">DOAB: download the publication</a>
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<a href="https://learning.oreilly.com/library/view/~/9780750656429">https://learning.oreilly.com/library/view/~/9780750656429</a><br/>Format: Electronic Resources<br/>Nanofabrication Principles and Applicationsent://SD_ILS/0/SD_ILS:20836642025-07-14T00:16:32Z2025-07-14T00:16:32Zby Papadopoulos, Christo. author.<br/><a href="https://doi.org/10.1007/978-3-319-31742-7">https://doi.org/10.1007/978-3-319-31742-7</a><br/>Format: Electronic Resources<br/>Quantum, Nano, Micro Technologies and Applied Researches.ent://SD_ILS/0/SD_ILS:12808422025-07-14T00:16:32Z2025-07-14T00:16:32Zby Wang, Yuanzhi.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1910530">Click to View</a><br/>Format: Electronic Resources<br/>Electronic components and processesent://SD_ILS/0/SD_ILS:3044362025-07-14T00:16:32Z2025-07-14T00:16:32Zby Maheshwari, Preeti.<br/>EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=307440">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=307440</a><br/>Format: Electronic Resources<br/>Low-K Nanoporous Interdielectrics : Materials, Thin Film Fabrications, Structures and Properties.ent://SD_ILS/0/SD_ILS:12931962025-07-14T00:16:32Z2025-07-14T00:16:32Zby Ree, Moonhor.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=3019998">Click to View</a><br/>Format: Electronic Resources<br/>Statistical Analysis and Optimization for VLSI: Timing and Powerent://SD_ILS/0/SD_ILS:5045402025-07-14T00:16:32Z2025-07-14T00:16:32Zby Srivastava, Ashish. author.<br/><a href="http://dx.doi.org/10.1007/b137645">http://dx.doi.org/10.1007/b137645</a><br/>Format: Electronic Resources<br/>Spin currentent://SD_ILS/0/SD_ILS:5231332025-07-14T00:16:32Z2025-07-14T00:16:32Zby Maekawa, S. (Sadamichi), 1946-<br/>EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=490085">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=490085</a><br/>Format: Electronic Resources<br/>Digital Logic Design Using Verilog Coding and RTL Synthesisent://SD_ILS/0/SD_ILS:20870932025-07-14T00:16:32Z2025-07-14T00:16:32Zby Taraate, Vaibbhav. author.<br/><a href="https://doi.org/10.1007/978-81-322-2791-5">https://doi.org/10.1007/978-81-322-2791-5</a><br/>Format: Electronic Resources<br/>Languages, Design Methods, and Tools for Electronic System Design Selected Contributions from FDL 2014ent://SD_ILS/0/SD_ILS:20872892025-07-14T00:16:32Z2025-07-14T00:16:32Zby Oppenheimer, Frank. editor.<br/><a href="https://doi.org/10.1007/978-3-319-24457-0">https://doi.org/10.1007/978-3-319-24457-0</a><br/>Format: Electronic Resources<br/>The Handbook of Nanotechnology : Business, Policy, and Intellectual Property Law.ent://SD_ILS/0/SD_ILS:11824312025-07-14T00:16:32Z2025-07-14T00:16:32Zby Miller, John C.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=219050">Click to View</a><br/>Format: Electronic Resources<br/>CMOS Indoor Light Energy Harvesting System for Wireless Sensing Applicationsent://SD_ILS/0/SD_ILS:20883432025-07-14T00:16:32Z2025-07-14T00:16:32Zby Ferreira Carvalho, Carlos Manuel. author.<br/><a href="https://doi.org/10.1007/978-3-319-21617-1">https://doi.org/10.1007/978-3-319-21617-1</a><br/>Format: Electronic Resources<br/>Switching power supplies A to Zent://SD_ILS/0/SD_ILS:22824812025-07-14T00:16:32Z2025-07-14T00:16:32Zby Maniktala, Sanjaya.<br/><a href="https://learning.oreilly.com/library/view/~/9780750679701/?ar">https://learning.oreilly.com/library/view/~/9780750679701/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9780750645836">https://learning.oreilly.com/library/view/~/9780750645836</a><br/>Format: Electronic Resources<br/>Thermal Transport for Applications in Micro/Nanomachiningent://SD_ILS/0/SD_ILS:5029402025-07-14T00:16:32Z2025-07-14T00:16:32Zby Wong, Basil T. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-73607-3">http://dx.doi.org/10.1007/978-3-540-73607-3</a><br/>Format: Electronic Resources<br/>Data Mining and Diagnosing IC Failsent://SD_ILS/0/SD_ILS:5045272025-07-14T00:16:32Z2025-07-14T00:16:32Zby Huisman, Leendert M. author.<br/><a href="http://dx.doi.org/10.1007/b137446">http://dx.doi.org/10.1007/b137446</a><br/>Format: Electronic Resources<br/>Systematic Modeling and Analysis of Telecom Frontends and Their Building Blocksent://SD_ILS/0/SD_ILS:5063802025-07-14T00:16:32Z2025-07-14T00:16:32Zby Vanassche, Piet. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-3174-2">http://dx.doi.org/10.1007/1-4020-3174-2</a><br/>Format: Electronic Resources<br/>Recent Trends in Control and Sensor Systems in Emergency Managementent://SD_ILS/0/SD_ILS:20879872025-07-14T00:16:32Z2025-07-14T00:16:32Zby Szewczyk, Roman. editor.<br/><a href="https://doi.org/10.1007/978-3-319-70452-4">https://doi.org/10.1007/978-3-319-70452-4</a><br/>Format: Electronic Resources<br/>Measurement, Testing and Sensor Technology Fundamentals and Application to Materials and Technical Systemsent://SD_ILS/0/SD_ILS:20835462025-07-14T00:16:32Z2025-07-14T00:16:32Zby Czichos, Horst. author.<br/><a href="https://doi.org/10.1007/978-3-319-76385-9">https://doi.org/10.1007/978-3-319-76385-9</a><br/>Format: Electronic Resources<br/>Inkjet-Configurable Gate Array Towards Application Specific Printed Electronic Circuitsent://SD_ILS/0/SD_ILS:20864092025-07-14T00:16:32Z2025-07-14T00:16:32Zby Mashayekhi, Mohammad. author.<br/><a href="https://doi.org/10.1007/978-3-319-72116-3">https://doi.org/10.1007/978-3-319-72116-3</a><br/>Format: Electronic Resources<br/>Nanoporous Metals for Advanced Energy Technologiesent://SD_ILS/0/SD_ILS:20873622025-07-14T00:16:32Z2025-07-14T00:16:32Zby Ding, Yi. author.<br/><a href="https://doi.org/10.1007/978-3-319-29749-1">https://doi.org/10.1007/978-3-319-29749-1</a><br/>Format: Electronic Resources<br/>Computation and communication technologiesent://SD_ILS/0/SD_ILS:21085862025-07-14T00:16:32Z2025-07-14T00:16:32Zby Senthil, Kumar T., editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5119743">Click to View</a><br/>Format: Electronic Resources<br/>Electronics and communications for scientists and engineersent://SD_ILS/0/SD_ILS:3410542025-07-14T00:16:32Z2025-07-14T00:16:32Zby Plonus, Martin.<br/>EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=199177">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=199177</a><br/>Format: Electronic Resources<br/>Micro and Nanomanufacturingent://SD_ILS/0/SD_ILS:5044922025-07-14T00:16:32Z2025-07-14T00:16:32Zby Jackson, Mark J. author.<br/><a href="http://dx.doi.org/10.1007/b136902">http://dx.doi.org/10.1007/b136902</a><br/>Format: Electronic Resources<br/>Digital electronics : principles, devices and applicationsent://SD_ILS/0/SD_ILS:22838932025-07-14T00:16:32Z2025-07-14T00:16:32Zby Maini, Anil Kumar.<br/><a href="https://learning.oreilly.com/library/view/~/9780470032145">https://learning.oreilly.com/library/view/~/9780470032145</a>
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href="http://dx.doi.org/10.1007/978-0-387-76537-2">http://dx.doi.org/10.1007/978-0-387-76537-2</a><br/>Format: Electronic Resources<br/>How to Gain Gain A Reference Book on Triodes in Audio Pre-Ampsent://SD_ILS/0/SD_ILS:5027612025-07-14T00:16:32Z2025-07-14T00:16:32Zby Vogel, Burkhard. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-69505-9">http://dx.doi.org/10.1007/978-3-540-69505-9</a><br/>Format: Electronic Resources<br/>Wideband Low Noise Amplifiers Exploiting Thermal Noise Cancellationent://SD_ILS/0/SD_ILS:5063842025-07-14T00:16:32Z2025-07-14T00:16:32Zby Bruccoleri, Federico. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-3188-2">http://dx.doi.org/10.1007/1-4020-3188-2</a><br/>Format: Electronic Resources<br/>LNA-ESD Co-Design for Fully Integrated CMOS Wireless Receiversent://SD_ILS/0/SD_ILS:5063852025-07-14T00:16:32Z2025-07-14T00:16:32Zby Leroux, Paul. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-3191-2">http://dx.doi.org/10.1007/1-4020-3191-2</a><br/>Format: Electronic Resources<br/>Circuiti Fondamenti di circuiti per l'Ingegneriaent://SD_ILS/0/SD_ILS:20873692025-07-14T00:16:32Z2025-07-14T00:16:32Zby de Magistris, Massimiliano. author.<br/><a href="https://doi.org/10.1007/978-88-470-5770-8">https://doi.org/10.1007/978-88-470-5770-8</a><br/>Format: Electronic Resources<br/>Symbolic Parallelization of Nested Loop Programsent://SD_ILS/0/SD_ILS:20879402025-07-14T00:16:32Z2025-07-14T00:16:32Zby Tanase, Alexandru-Petru. author.<br/><a href="https://doi.org/10.1007/978-3-319-73909-0">https://doi.org/10.1007/978-3-319-73909-0</a><br/>Format: Electronic Resources<br/>Reversible and Quantum Circuits Optimization and Complexity Analysisent://SD_ILS/0/SD_ILS:20882452025-07-14T00:16:32Z2025-07-14T00:16:32Zby Abdessaied, Nabila. author.<br/><a href="https://doi.org/10.1007/978-3-319-31937-7">https://doi.org/10.1007/978-3-319-31937-7</a><br/>Format: Electronic Resources<br/>Organic Transistor Devices for In Vitro Electrophysiological Applicationsent://SD_ILS/0/SD_ILS:20864032025-07-14T00:16:32Z2025-07-14T00:16:32Zby Spanu, Andrea. author.<br/><a href="https://doi.org/10.1007/978-3-319-28880-2">https://doi.org/10.1007/978-3-319-28880-2</a><br/>Format: Electronic Resources<br/>Automated Validation & Verification of UML/OCL Models Using Satisfiability Solversent://SD_ILS/0/SD_ILS:20872382025-07-14T00:16:32Z2025-07-14T00:16:32Zby Przigoda, Nils. author.<br/><a href="https://doi.org/10.1007/978-3-319-72814-8">https://doi.org/10.1007/978-3-319-72814-8</a><br/>Format: Electronic Resources<br/>Formal System Verification State-of the-Art and Future Trendsent://SD_ILS/0/SD_ILS:20880422025-07-14T00:16:32Z2025-07-14T00:16:32Zby Drechsler, Rolf. editor.<br/><a href="https://doi.org/10.1007/978-3-319-57685-5">https://doi.org/10.1007/978-3-319-57685-5</a><br/>Format: Electronic Resources<br/>Tunneling Field Effect Transistor Technologyent://SD_ILS/0/SD_ILS:20872422025-07-14T00:16:32Z2025-07-14T00:16:32Zby Zhang, Lining. editor.<br/><a href="https://doi.org/10.1007/978-3-319-31653-6">https://doi.org/10.1007/978-3-319-31653-6</a><br/>Format: Electronic Resources<br/>Transformer-Based Design Techniques for Oscillators and Frequency Dividersent://SD_ILS/0/SD_ILS:20882962025-07-14T00:16:32Z2025-07-14T00:16:32Zby Luong, Howard Cam. author.<br/><a href="https://doi.org/10.1007/978-3-319-15874-7">https://doi.org/10.1007/978-3-319-15874-7</a><br/>Format: Electronic Resources<br/>Reliable Software for Unreliable Hardware A Cross Layer Perspectiveent://SD_ILS/0/SD_ILS:20871142025-07-14T00:16:32Z2025-07-14T00:16:32Zby Rehman, Semeen. author.<br/><a href="https://doi.org/10.1007/978-3-319-25772-3">https://doi.org/10.1007/978-3-319-25772-3</a><br/>Format: Electronic Resources<br/>Memristor Technology: Synthesis and Modeling for Sensing and Security Applicationsent://SD_ILS/0/SD_ILS:20878552025-07-14T00:16:32Z2025-07-14T00:16:32Zby Abunahla, Heba. author.<br/><a href="https://doi.org/10.1007/978-3-319-65699-1">https://doi.org/10.1007/978-3-319-65699-1</a><br/>Format: Electronic Resources<br/>Design for Manufacturability with Advanced Lithographyent://SD_ILS/0/SD_ILS:20876462025-07-14T00:16:32Z2025-07-14T00:16:32Zby Yu, Bei. author.<br/><a href="https://doi.org/10.1007/978-3-319-20385-0">https://doi.org/10.1007/978-3-319-20385-0</a><br/>Format: Electronic Resources<br/>ZnO Thin-Film Transistors for Cost-Efficient Flexible Electronicsent://SD_ILS/0/SD_ILS:20876602025-07-14T00:16:32Z2025-07-14T00:16:32Zby Vidor, Fábio Fedrizzi. author.<br/><a href="https://doi.org/10.1007/978-3-319-72556-7">https://doi.org/10.1007/978-3-319-72556-7</a><br/>Format: Electronic Resources<br/>On-chip High-Voltage Generator Design Design Methodology for Charge Pumpsent://SD_ILS/0/SD_ILS:20873352025-07-14T00:16:32Z2025-07-14T00:16:32Zby Tanzawa, Toru. author.<br/><a href="https://doi.org/10.1007/978-3-319-21975-2">https://doi.org/10.1007/978-3-319-21975-2</a><br/>Format: Electronic Resources<br/>Memory Controllers for Mixed-Time-Criticality Systems Architectures, Methodologies and Trade-offsent://SD_ILS/0/SD_ILS:20883892025-07-14T00:16:32Z2025-07-14T00:16:32Zby Goossens, Sven. author.<br/><a href="https://doi.org/10.1007/978-3-319-32094-6">https://doi.org/10.1007/978-3-319-32094-6</a><br/>Format: Electronic Resources<br/>Energy Efficient Embedded Video Processing Systems A Hardware-Software Collaborative Approachent://SD_ILS/0/SD_ILS:20882332025-07-14T00:16:32Z2025-07-14T00:16:32Zby Khan, Muhammad Usman Karim. author.<br/><a href="https://doi.org/10.1007/978-3-319-61455-7">https://doi.org/10.1007/978-3-319-61455-7</a><br/>Format: Electronic Resources<br/>Automated Electronic Filter Design With Emphasis on Distributed Filtersent://SD_ILS/0/SD_ILS:20876022025-07-14T00:16:32Z2025-07-14T00:16:32Zby Banerjee, Amal. author.<br/><a href="https://doi.org/10.1007/978-3-319-61554-7">https://doi.org/10.1007/978-3-319-61554-7</a><br/>Format: Electronic Resources<br/>Timing Performance of Nanometer Digital Circuits Under Process Variationsent://SD_ILS/0/SD_ILS:20867182025-07-14T00:16:32Z2025-07-14T00:16:32Zby Champac, Victor. author.<br/><a href="https://doi.org/10.1007/978-3-319-75465-9">https://doi.org/10.1007/978-3-319-75465-9</a><br/>Format: Electronic Resources<br/>Modern Functional Evaluation Methods for Muscle Strength and Gait Analysisent://SD_ILS/0/SD_ILS:20879632025-07-14T00:16:32Z2025-07-14T00:16:32Zby Ancillao, Andrea. author.<br/><a href="https://doi.org/10.1007/978-3-319-67437-7">https://doi.org/10.1007/978-3-319-67437-7</a><br/>Format: Electronic Resources<br/>Microsystem designent://SD_ILS/0/SD_ILS:21063812025-07-14T00:16:32Z2025-07-14T00:16:32Zby Senturia, Stephen D., 1940- author.<br/><a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=78508">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=78508</a><br/>Format: Electronic Resources<br/>Advanced Techniques for Power, Energy, and Thermal Management for Clustered Manycoresent://SD_ILS/0/SD_ILS:20869002025-07-14T00:16:32Z2025-07-14T00:16:32Zby Pagani, Santiago. author.<br/><a href="https://doi.org/10.1007/978-3-319-77479-4">https://doi.org/10.1007/978-3-319-77479-4</a><br/>Format: Electronic Resources<br/>Machine Learning for Model Order Reductionent://SD_ILS/0/SD_ILS:20878242025-07-14T00:16:32Z2025-07-14T00:16:32Zby Mohamed, Khaled Salah. author.<br/><a href="https://doi.org/10.1007/978-3-319-75714-8">https://doi.org/10.1007/978-3-319-75714-8</a><br/>Format: Electronic Resources<br/>Tantalum and Niobium-Based Capacitors Science, Technology, and Applicationsent://SD_ILS/0/SD_ILS:20879722025-07-14T00:16:32Z2025-07-14T00:16:32Zby Freeman, Yuri. author.<br/><a href="https://doi.org/10.1007/978-3-319-67870-2">https://doi.org/10.1007/978-3-319-67870-2</a><br/>Format: Electronic Resources<br/>Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirementsent://SD_ILS/0/SD_ILS:20863202025-07-14T00:16:32Z2025-07-14T00:16:32Zby Zhuang, Yuming. author.<br/><a href="https://doi.org/10.1007/978-3-319-77718-4">https://doi.org/10.1007/978-3-319-77718-4</a><br/>Format: Electronic Resources<br/>Foundations of Heterogeneous Integration: An Industry-Based, 2.5D/3D Pathfinding and Co-Design Approachent://SD_ILS/0/SD_ILS:20863902025-07-14T00:16:32Z2025-07-14T00:16:32Zby Yazdani, Farhang. author.<br/><a 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High-Speed Integrated CMOS AD Converters for Low-Power Applicationsent://SD_ILS/0/SD_ILS:20877852025-07-14T00:16:32Z2025-07-14T00:16:32Zby Li, Weitao. author.<br/><a href="https://doi.org/10.1007/978-3-319-62012-1">https://doi.org/10.1007/978-3-319-62012-1</a><br/>Format: Electronic Resources<br/>Languages, Design Methods, and Tools for Electronic System Design Selected Contributions from FDL 2016ent://SD_ILS/0/SD_ILS:20868872025-07-14T00:16:32Z2025-07-14T00:16:32Zby Fummi, Franco. editor.<br/><a href="https://doi.org/10.1007/978-3-319-62920-9">https://doi.org/10.1007/978-3-319-62920-9</a><br/>Format: Electronic Resources<br/>MEMS Lorentz Force Magnetometers From Specifications to Productent://SD_ILS/0/SD_ILS:20873962025-07-14T00:16:32Z2025-07-14T00:16:32Zby Buffa, Cesare. author.<br/><a href="https://doi.org/10.1007/978-3-319-59412-5">https://doi.org/10.1007/978-3-319-59412-5</a><br/>Format: Electronic Resources<br/>Feedback in Analog 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System Design Selected Contributions from FDL 2015ent://SD_ILS/0/SD_ILS:20865962025-07-14T00:16:32Z2025-07-14T00:16:32Zby Drechsler, Rolf. editor.<br/><a href="https://doi.org/10.1007/978-3-319-31723-6">https://doi.org/10.1007/978-3-319-31723-6</a><br/>Format: Electronic Resources<br/>IP Cores Design from Specifications to Production Modeling, Verification, Optimization, and Protectionent://SD_ILS/0/SD_ILS:20868312025-07-14T00:16:32Z2025-07-14T00:16:32Zby Mohamed, Khaled Salah. author.<br/><a href="https://doi.org/10.1007/978-3-319-22035-2">https://doi.org/10.1007/978-3-319-22035-2</a><br/>Format: Electronic Resources<br/>Embedded System Design Embedded Systems Foundations of Cyber-Physical Systems, and the Internet of Thingsent://SD_ILS/0/SD_ILS:20879852025-07-14T00:16:32Z2025-07-14T00:16:32Zby Marwedel, Peter. author.<br/><a href="https://doi.org/10.1007/978-3-319-56045-8">https://doi.org/10.1007/978-3-319-56045-8</a><br/>Format: Electronic Resources<br/>Parasitic Substrate Coupling 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