Search Results for - Narrowed by: İzmir Institute of Technology. Physics. - Thin films. SirsiDynix Enterprise https://catalog.iyte.edu.tr/client/tr_TR/default_tr/default_tr/qf$003dAUTHOR$002509Author$002509$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002bPhysics.$002509$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002bPhysics.$0026qf$003dSUBJECT$002509Subject$002509Thin$002bfilms.$002509Thin$002bfilms.$0026rm$003dTEZ$002bKOLEKSIYONU0$00257C$00257C$00257C1$00257C$00257C$00257C0$00257C$00257C$00257Ctrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-05-04T00:03:31Z The growth of vanadium dioxide thin films by magnetron sputtering technique and terahertz wave modulation characteristics ent://SD_ILS/0/SD_ILS:2204282 2024-05-04T00:03:31Z 2024-05-04T00:03:31Z by&#160;Ata, Beng&uuml;, author.<br/><a href="https://hdl.handle.net/11147/11038">Access to Electronic Versiyon</a><br/>Format:&#160;El Yazması<br/> Growth and characterization of ZnSnO thin films on polymers for OLEDs ent://SD_ILS/0/SD_ILS:2134065 2024-05-04T00:03:31Z 2024-05-04T00:03:31Z by&#160;Ekmek&ccedil;ioğlu, Merve, author.<br/><a href="https://hdl.handle.net/11147/7337">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Temperature dependence of resistivity and hall coefficient in Cu2ZnSnS4 absorbers for thin film solar cells ent://SD_ILS/0/SD_ILS:1564019 2024-05-04T00:03:31Z 2024-05-04T00:03:31Z by&#160;Ak&ccedil;a, Fatime G&uuml;lşah, author.<br/><a href="http://hdl.handle.net/11147/6609">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Influence of ni thin flim structural properties over graphene growth by cvd ent://SD_ILS/0/SD_ILS:392564 2024-05-04T00:03:31Z 2024-05-04T00:03:31Z by&#160;&Ouml;z&ccedil;eri, Elif.<br/><a href="http://hdl.handle.net/11147/3566">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Characterization of modified ito anode surfaces with 4 [3-methylphenyl) phenyl) anino] benzoic acid for oled applications ent://SD_ILS/0/SD_ILS:137194 2024-05-04T00:03:31Z 2024-05-04T00:03:31Z by&#160;Yağmurcukardeş, Nesli.<br/><a href="http://hdl.handle.net/11147/3141">Access to Electronic Version.</a><br/>Format:&#160;El Yazması<br/> Growth and characterization of aluminum doped transparent and conductive zinc oxidethin flims ent://SD_ILS/0/SD_ILS:106553 2024-05-04T00:03:31Z 2024-05-04T00:03:31Z by&#160;Ata&ccedil;, Derya.<br/><a href="http://hdl.handle.net/11147/3044">Access to Electronic Version.</a><br/>Format:&#160;El Yazması<br/> Fabrication of Lu doped ybco thin films by pulsed laser deposition technique and their characterization ent://SD_ILS/0/SD_ILS:93080 2024-05-04T00:03:31Z 2024-05-04T00:03:31Z by&#160;Sezer, Bahtiyar Şirvan.<br/><a href="http://hdl.handle.net/11147/4024">Access to Electronic Version.</a><br/>Format:&#160;El Yazması<br/> Production and characterization of HfO2 high-k dielectric layers by sputtering technique ent://SD_ILS/0/SD_ILS:23907 2024-05-04T00:03:31Z 2024-05-04T00:03:31Z by&#160;Cantaş, Ayten.<br/><a href="http://hdl.handle.net/11147/3457">Access to Electronic Version</a><br/>Format:&#160;El Yazması<br/> Fabrication of ybco thin flims by pulsed laser deposiyion technique and their charcterization ent://SD_ILS/0/SD_ILS:90491 2024-05-04T00:03:31Z 2024-05-04T00:03:31Z by&#160;Tozan, Şerife.<br/><a href="http://hdl.handle.net/11147/4012">Access to Electronic Version.</a><br/>Format:&#160;El Yazması<br/> Investigation of magnetic dead layer formation at the interfaces of sputtered Ni80 Fe20 thin films ent://SD_ILS/0/SD_ILS:88032 2024-05-04T00:03:31Z 2024-05-04T00:03:31Z by&#160;Alag&ouml;z, H&uuml;seyin Serhat.<br/><a href="http://hdl.handle.net/11147/3979">Access to Electronic Version.</a><br/>Format:&#160;El Yazması<br/> Applications of transparent conductive indium tin oxide films in automotive and vitrifications industries ent://SD_ILS/0/SD_ILS:98295 2024-05-04T00:03:31Z 2024-05-04T00:03:31Z by&#160;Tuna, &Ouml;cal.<br/><a href="http://hdl.handle.net/11147/4065">Access to Electronic Version.</a><br/>Format:&#160;El Yazması<br/> Electrical surface modification and characterization of metallic thin films using scanning probe microscope (SPM) nanolithography method ent://SD_ILS/0/SD_ILS:98123 2024-05-04T00:03:31Z 2024-05-04T00:03:31Z by&#160;B&uuml;y&uuml;kk&ouml;se, Serkan.<br/><a href="http://hdl.handle.net/11147/4056">Access to Electronic Version.</a><br/>Format:&#160;El Yazması<br/> Pixel array application of high temperature superconducting ybco transition edge infrared bolometers ent://SD_ILS/0/SD_ILS:97025 2024-05-04T00:03:31Z 2024-05-04T00:03:31Z by&#160;Pekerten, Barış.<br/><a href="http://hdl.handle.net/11147/4033">Access to Electronic Version.</a><br/>Format:&#160;El Yazması<br/>