Search Results for - Narrowed by: İzmir Institute of Technology. Electronics and Communication Engineering. - Atomic force microscopy.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/tr_TR/default_tr/default_tr/qf$003dAUTHOR$002509Yazar$002509$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002b$002bElectronics$002band$002bCommunication$002bEngineering.$002509$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002b$002bElectronics$002band$002bCommunication$002bEngineering.$0026qf$003dSUBJECT$002509Konu$002509Atomic$002bforce$002bmicroscopy.$002509Atomic$002bforce$002bmicroscopy.$0026rm$003dTEZ$002bKOLEKSIYONU0$00257C$00257C$00257C1$00257C$00257C$00257C0$00257C$00257C$00257Ctrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?2024-06-21T14:55:07ZNonlinear controller design for high speed dynamic atomic force microscope systement://SD_ILS/0/SD_ILS:21029702024-06-21T14:55:07Z2024-06-21T14:55:07Zby Coşar, Alper, author.<br/><a href="https://hdl.handle.net/11147/7212">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Analysis of cantilevers for high-speed atomic force microscopyent://SD_ILS/0/SD_ILS:20756722024-06-21T14:55:07Z2024-06-21T14:55:07Zby Brar, Harpreet Singh, author.<br/><a href="http://hdl.handle.net/11147/7010">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>