Search Results for - Narrowed by: İzmir Institute of Technology. Electronics and Communication Engineering. - Diffraction.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/tr_TR/default_tr/default_tr/qf$003dAUTHOR$002509Yazar$002509$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002bElectronics$002band$002bCommunication$002bEngineering.$002509$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002bElectronics$002band$002bCommunication$002bEngineering.$0026qf$003dSUBJECT$002509Konu$002509Diffraction.$002509Diffraction.$0026rm$003dTEZ$002bKOLEKSIYONU0$00257C$00257C$00257C1$00257C$00257C$00257C0$00257C$00257C$00257Ctrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?2024-06-07T19:14:50ZOptical characterization of nanoscale dielectric films on curved surfaces using near field diffraction methodent://SD_ILS/0/SD_ILS:21338952024-06-07T19:14:50Z2024-06-07T19:14:50Zby Ataç, Enes, author.<br/><a href="https://hdl.handle.net/11147/7426">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Optical characterization of dielectric films on curved surfaces using diffraction methodent://SD_ILS/0/SD_ILS:11773282024-06-07T19:14:50Z2024-06-07T19:14:50Zby Ekici, Çağın, author.<br/><a href="http://hdl.handle.net/11147/2755">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>