Search Results for - Narrowed by: English - Atomic force microscopy.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/tr_TR/default_tr/default_tr/qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dSUBJECT$002509Subject$002509Atomic$002bforce$002bmicroscopy.$002509Atomic$002bforce$002bmicroscopy.$0026rm$003dTEZ$002bKOLEKSIYONU0$00257C$00257C$00257C1$00257C$00257C$00257C0$00257C$00257C$00257Ctrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?2024-09-24T00:59:20ZEffect of aging electrolyte and organic coating type on the corrosion mechanism of tinplateent://SD_ILS/0/SD_ILS:21407002024-09-24T00:59:20Z2024-09-24T00:59:20Zby Yıldırım, Koray, author.<br/><a href="https://hdl.handle.net/11147/9623">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Analysis of cantilevers for high-speed atomic force microscopyent://SD_ILS/0/SD_ILS:20756722024-09-24T00:59:20Z2024-09-24T00:59:20Zby Brar, Harpreet Singh, author.<br/><a href="http://hdl.handle.net/11147/7010">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Nonlinear controller design for high speed dynamic atomic force microscope systement://SD_ILS/0/SD_ILS:21029702024-09-24T00:59:20Z2024-09-24T00:59:20Zby Coşar, Alper, author.<br/><a href="https://hdl.handle.net/11147/7212">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Molecular beam epitaxial growth of ZnSe on (211)B GaAsent://SD_ILS/0/SD_ILS:15639992024-09-24T00:59:20Z2024-09-24T00:59:20Zby Yavaş, Begüm, author.<br/><a href="http://hdl.handle.net/11147/6624">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Self-organized network of silicon oxide on epitaxial grapheneent://SD_ILS/0/SD_ILS:15639182024-09-24T00:59:20Z2024-09-24T00:59:20Zby Özkendir, Dilce, author.<br/><a href="http://hdl.handle.net/11147/6565">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealingent://SD_ILS/0/SD_ILS:9490072024-09-24T00:59:20Z2024-09-24T00:59:20Zby Bakali, Emine, author.<br/><a href="http://hdl.handle.net/11147/4583">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Dna adsorption on sılıca, alumına and hydroxyapatite and imaging of dna by atomic force microscopyent://SD_ILS/0/SD_ILS:4090562024-09-24T00:59:20Z2024-09-24T00:59:20Zby Yetgin, Senem.<br/><a href="http://hdl.handle.net/11147/2956">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Design and characterization of shell structure of microbubbles used in ultrasound imagingent://SD_ILS/0/SD_ILS:3676282024-09-24T00:59:20Z2024-09-24T00:59:20Zby Bölükçü, Elif Şeniz.<br/><a href="http://hdl.handle.net/11147/3539">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Determining charge distribution of metal oxide surfaces with afm using colloid probe techniqueent://SD_ILS/0/SD_ILS:3673752024-09-24T00:59:20Z2024-09-24T00:59:20Zby Güler, Ayşe.<br/><a href="http://hdl.handle.net/11147/3528">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Estimation of the surface charge distribution of solids in liquids by using atomic force microscopyent://SD_ILS/0/SD_ILS:1293672024-09-24T00:59:20Z2024-09-24T00:59:20Zby Yelken Özek, Gülnihal.<br/><a href="http://hdl.handle.net/11147/2893">Access to Electronic Version.</a><br/>Format: El Yazması<br/>Electrical surface modification and characterization of metallic thin films using scanning probe microscope (SPM) nanolithography methodent://SD_ILS/0/SD_ILS:981232024-09-24T00:59:20Z2024-09-24T00:59:20Zby Büyükköse, Serkan.<br/><a href="http://hdl.handle.net/11147/4056">Access to Electronic Version.</a><br/>Format: El Yazması<br/>