Search Results for - Narrowed by: Atomic force microscopy. - İzmir Institute of Technology. Electronics and Communication Engineering. SirsiDynix Enterprise https://catalog.iyte.edu.tr/client/tr_TR/default_tr/default_tr/qf$003dSUBJECT$002509Subject$002509Atomic$002bforce$002bmicroscopy.$002509Atomic$002bforce$002bmicroscopy.$0026qf$003dAUTHOR$002509Author$002509$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002b$002bElectronics$002band$002bCommunication$002bEngineering.$002509$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002b$002bElectronics$002band$002bCommunication$002bEngineering.$0026rm$003dTEZ$002bKOLEKSIYONU0$00257C$00257C$00257C1$00257C$00257C$00257C0$00257C$00257C$00257Ctrue$0026te$003dILS$0026ps$003d300? 2024-05-02T03:09:18Z Analysis of cantilevers for high-speed atomic force microscopy ent://SD_ILS/0/SD_ILS:2075672 2024-05-02T03:09:18Z 2024-05-02T03:09:18Z by&#160;Brar, Harpreet Singh, author.<br/><a href="http://hdl.handle.net/11147/7010">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Nonlinear controller design for high speed dynamic atomic force microscope system ent://SD_ILS/0/SD_ILS:2102970 2024-05-02T03:09:18Z 2024-05-02T03:09:18Z by&#160;Coşar, Alper, author.<br/><a href="https://hdl.handle.net/11147/7212">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/>