Search Results for - Narrowed by: Atomic force microscopy. - İzmir Institute of Technology. Electronics and Communication Engineering.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/tr_TR/default_tr/default_tr/qf$003dSUBJECT$002509Subject$002509Atomic$002bforce$002bmicroscopy.$002509Atomic$002bforce$002bmicroscopy.$0026qf$003dAUTHOR$002509Author$002509$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002b$002bElectronics$002band$002bCommunication$002bEngineering.$002509$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002b$002bElectronics$002band$002bCommunication$002bEngineering.$0026rm$003dTEZ$002bKOLEKSIYONU0$00257C$00257C$00257C1$00257C$00257C$00257C0$00257C$00257C$00257Ctrue$0026te$003dILS$0026ps$003d300?2024-05-02T03:09:18ZAnalysis of cantilevers for high-speed atomic force microscopyent://SD_ILS/0/SD_ILS:20756722024-05-02T03:09:18Z2024-05-02T03:09:18Zby Brar, Harpreet Singh, author.<br/><a href="http://hdl.handle.net/11147/7010">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Nonlinear controller design for high speed dynamic atomic force microscope systement://SD_ILS/0/SD_ILS:21029702024-05-02T03:09:18Z2024-05-02T03:09:18Zby Coşar, Alper, author.<br/><a href="https://hdl.handle.net/11147/7212">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>