Search Results for - Narrowed by: Atomic force microscopy. SirsiDynix Enterprise https://catalog.iyte.edu.tr/client/tr_TR/default_tr/default_tr/qf$003dSUBJECT$002509Subject$002509Atomic$002bforce$002bmicroscopy.$002509Atomic$002bforce$002bmicroscopy.$0026rm$003dTEZ$002bKOLEKSIYONU0$00257C$00257C$00257C1$00257C$00257C$00257C0$00257C$00257C$00257Ctrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-04-25T11:24:20Z Effect of aging electrolyte and organic coating type on the corrosion mechanism of tinplate ent://SD_ILS/0/SD_ILS:2140700 2024-04-25T11:24:20Z 2024-04-25T11:24:20Z by&#160;Yıldırım, Koray, author.<br/><a href="https://hdl.handle.net/11147/9623">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Analysis of cantilevers for high-speed atomic force microscopy ent://SD_ILS/0/SD_ILS:2075672 2024-04-25T11:24:20Z 2024-04-25T11:24:20Z by&#160;Brar, Harpreet Singh, author.<br/><a href="http://hdl.handle.net/11147/7010">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Nonlinear controller design for high speed dynamic atomic force microscope system ent://SD_ILS/0/SD_ILS:2102970 2024-04-25T11:24:20Z 2024-04-25T11:24:20Z by&#160;Coşar, Alper, author.<br/><a href="https://hdl.handle.net/11147/7212">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Self-organized network of silicon oxide on epitaxial graphene ent://SD_ILS/0/SD_ILS:1563918 2024-04-25T11:24:20Z 2024-04-25T11:24:20Z by&#160;&Ouml;zkendir, Dilce, author.<br/><a href="http://hdl.handle.net/11147/6565">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Molecular beam epitaxial growth of ZnSe on (211)B GaAs ent://SD_ILS/0/SD_ILS:1563999 2024-04-25T11:24:20Z 2024-04-25T11:24:20Z by&#160;Yavaş, Beg&uuml;m, author.<br/><a href="http://hdl.handle.net/11147/6624">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing ent://SD_ILS/0/SD_ILS:949007 2024-04-25T11:24:20Z 2024-04-25T11:24:20Z by&#160;Bakali, Emine, author.<br/><a href="http://hdl.handle.net/11147/4583">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Dna adsorption on sılıca, alumına and hydroxyapatite and imaging of dna by atomic force microscopy ent://SD_ILS/0/SD_ILS:409056 2024-04-25T11:24:20Z 2024-04-25T11:24:20Z by&#160;Yetgin, Senem.<br/><a href="http://hdl.handle.net/11147/2956">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Design and characterization of shell structure of microbubbles used in ultrasound imaging ent://SD_ILS/0/SD_ILS:367628 2024-04-25T11:24:20Z 2024-04-25T11:24:20Z by&#160;B&ouml;l&uuml;k&ccedil;&uuml;, Elif Şeniz.<br/><a href="http://hdl.handle.net/11147/3539">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Determining charge distribution of metal oxide surfaces with afm using colloid probe technique ent://SD_ILS/0/SD_ILS:367375 2024-04-25T11:24:20Z 2024-04-25T11:24:20Z by&#160;G&uuml;ler, Ayşe.<br/><a href="http://hdl.handle.net/11147/3528">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Estimation of the surface charge distribution of solids in liquids by using atomic force microscopy ent://SD_ILS/0/SD_ILS:129367 2024-04-25T11:24:20Z 2024-04-25T11:24:20Z by&#160;Yelken &Ouml;zek, G&uuml;lnihal.<br/><a href="http://hdl.handle.net/11147/2893">Access to Electronic Version.</a><br/>Format:&#160;El Yazması<br/> Electrical surface modification and characterization of metallic thin films using scanning probe microscope (SPM) nanolithography method ent://SD_ILS/0/SD_ILS:98123 2024-04-25T11:24:20Z 2024-04-25T11:24:20Z by&#160;B&uuml;y&uuml;kk&ouml;se, Serkan.<br/><a href="http://hdl.handle.net/11147/4056">Access to Electronic Version.</a><br/>Format:&#160;El Yazması<br/>