Search Results for İzmir Institute of Technology. Physics. - Narrowed by: Selamet, Yusuf thesis advisor. - Tez KoleksiyonuSirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/tr_TR/default_tr/default_tr/qu$003d$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002b$002b$002bPhysics.$0026qf$003dAUTHOR$002509Yazar$002509Selamet$00252C$002bYusuf$002b$002b$002bthesis$002badvisor.$002509Selamet$00252C$002bYusuf$002b$002b$002bthesis$002badvisor.$0026qf$003dLOCATION$002509Raf$002bLokasyonu$0025091$00253ATHESIS$002509Tez$002bKoleksiyonu$0026rm$003dTEZ$002bKOLEKSIYONU0$00257C$00257C$00257C1$00257C$00257C$00257C0$00257C$00257C$00257Ctrue$0026te$003dILS$0026ps$003d300?2024-06-20T12:51:27ZDefect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealingent://SD_ILS/0/SD_ILS:9490072024-06-20T12:51:27Z2024-06-20T12:51:27Zby Bakali, Emine, author.<br/><a href="http://hdl.handle.net/11147/4583">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Characterization of GaAs (211) surface for epitaxial buffer growthent://SD_ILS/0/SD_ILS:4478812024-06-20T12:51:27Z2024-06-20T12:51:27Zby Polat, Mustafa, author.<br/><a href="http://hdl.handle.net/11147/4175">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Characterization of defect structure of epitaxial CdTe filmsent://SD_ILS/0/SD_ILS:4681582024-06-20T12:51:27Z2024-06-20T12:51:27Zby Özden, Selin, author.<br/><a href="http://hdl.handle.net/11147/4224">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometryent://SD_ILS/0/SD_ILS:4790192024-06-20T12:51:27Z2024-06-20T12:51:27Zby Günnar, Merve, author.<br/><a href="http://hdl.handle.net/11147/4283">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Characterization of lattice mismatch indüced dislocations on epitaxial CdTe filmsent://SD_ILS/0/SD_ILS:5178782024-06-20T12:51:27Z2024-06-20T12:51:27Zby Bilgilisoy, Elif, author.<br/><a href="http://hdl.handle.net/11147/4326">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>