Search Results for İzmir Institute of Technology. Physics. - Narrowed by: Raman spectroscopy.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/tr_TR/default_tr/default_tr/qu$003d$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002b$002b$002bPhysics.$0026qf$003dSUBJECT$002509Konu$002509Raman$002bspectroscopy.$002509Raman$002bspectroscopy.$0026rm$003dTEZ$002bKOLEKSIYONU0$00257C$00257C$00257C1$00257C$00257C$00257C0$00257C$00257C$00257Ctrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?2024-06-19T22:12:08ZDefect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealingent://SD_ILS/0/SD_ILS:9490072024-06-19T22:12:08Z2024-06-19T22:12:08Zby Bakali, Emine, author.<br/><a href="http://hdl.handle.net/11147/4583">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Characterization of defect structure of epitaxial CdTe filmsent://SD_ILS/0/SD_ILS:4681582024-06-19T22:12:08Z2024-06-19T22:12:08Zby Özden, Selin, author.<br/><a href="http://hdl.handle.net/11147/4224">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Monitoring the diffusion and degradation characteristics of crystals via Raman spectroscopyent://SD_ILS/0/SD_ILS:20754262024-06-19T22:12:08Z2024-06-19T22:12:08Zby Akbalı, Barış, author.<br/><a href="http://hdl.handle.net/11147/6985">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Influence of ni thin flim structural properties over graphene growth by cvdent://SD_ILS/0/SD_ILS:3925642024-06-19T22:12:08Z2024-06-19T22:12:08Zby Özçeri, Elif.<br/><a href="http://hdl.handle.net/11147/3566">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>