Search Results for İzmir Institute of Technology. Physics. - Narrowed by: Thin films.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/tr_TR/default_tr/default_tr/qu$003d$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002b$002b$002bPhysics.$0026qf$003dSUBJECT$002509Konu$002509Thin$002bfilms.$002509Thin$002bfilms.$0026rm$003dTEZ$002bKOLEKSIYONU0$00257C$00257C$00257C1$00257C$00257C$00257C0$00257C$00257C$00257Ctrue$0026te$003dILS$0026ps$003d300?2024-09-24T21:15:26ZThe growth of vanadium dioxide thin films by magnetron sputtering technique and terahertz wave modulation characteristicsent://SD_ILS/0/SD_ILS:22042822024-09-24T21:15:26Z2024-09-24T21:15:26Zby Ata, Bengü, author.<br/><a href="https://hdl.handle.net/11147/11038">Access to Electronic Versiyon</a><br/>Format: El Yazması<br/>Pixel array application of high temperature superconducting ybco transition edge infrared bolometersent://SD_ILS/0/SD_ILS:970252024-09-24T21:15:26Z2024-09-24T21:15:26Zby Pekerten, Barış.<br/><a href="http://hdl.handle.net/11147/4033">Access to Electronic Version.</a><br/>Format: El Yazması<br/>Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealingent://SD_ILS/0/SD_ILS:9490072024-09-24T21:15:26Z2024-09-24T21:15:26Zby Bakali, Emine, author.<br/><a href="http://hdl.handle.net/11147/4583">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Fabrication of Lu doped ybco thin films by pulsed laser deposition technique and their characterizationent://SD_ILS/0/SD_ILS:930802024-09-24T21:15:26Z2024-09-24T21:15:26Zby Sezer, Bahtiyar Şirvan.<br/><a href="http://hdl.handle.net/11147/4024">Access to Electronic Version.</a><br/>Format: El Yazması<br/>Fabrication of ybco thin flims by pulsed laser deposiyion technique and their charcterizationent://SD_ILS/0/SD_ILS:904912024-09-24T21:15:26Z2024-09-24T21:15:26Zby Tozan, Şerife.<br/><a href="http://hdl.handle.net/11147/4012">Access to Electronic Version.</a><br/>Format: El Yazması<br/>Growth and characterization of aluminum doped transparent and conductive zinc oxidethin flimsent://SD_ILS/0/SD_ILS:1065532024-09-24T21:15:26Z2024-09-24T21:15:26Zby Ataç, Derya.<br/><a href="http://hdl.handle.net/11147/3044">Access to Electronic Version.</a><br/>Format: El Yazması<br/>Electrical surface modification and characterization of metallic thin films using scanning probe microscope (SPM) nanolithography methodent://SD_ILS/0/SD_ILS:981232024-09-24T21:15:26Z2024-09-24T21:15:26Zby Büyükköse, Serkan.<br/><a href="http://hdl.handle.net/11147/4056">Access to Electronic Version.</a><br/>Format: El Yazması<br/>Investigation of magnetic dead layer formation at the interfaces of sputtered Ni80 Fe20 thin filmsent://SD_ILS/0/SD_ILS:880322024-09-24T21:15:26Z2024-09-24T21:15:26Zby Alagöz, Hüseyin Serhat.<br/><a href="http://hdl.handle.net/11147/3979">Access to Electronic Version.</a><br/>Format: El Yazması<br/>Characterization of modified ito anode surfaces with 4 [3-methylphenyl) phenyl) anino] benzoic acid for oled applicationsent://SD_ILS/0/SD_ILS:1371942024-09-24T21:15:26Z2024-09-24T21:15:26Zby Yağmurcukardeş, Nesli.<br/><a href="http://hdl.handle.net/11147/3141">Access to Electronic Version.</a><br/>Format: El Yazması<br/>Applications of transparent conductive indium tin oxide films in automotive and vitrifications industriesent://SD_ILS/0/SD_ILS:982952024-09-24T21:15:26Z2024-09-24T21:15:26Zby Tuna, Öcal.<br/><a href="http://hdl.handle.net/11147/4065">Access to Electronic Version.</a><br/>Format: El Yazması<br/>Characterization of vanadium oxide thin films grown by magnetron sputtering techniqueent://SD_ILS/0/SD_ILS:9490092024-09-24T21:15:26Z2024-09-24T21:15:26Zby Yüce, Hürriyet, author.<br/><a href="http://hdl.handle.net/11147/4585">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Influence of ni thin flim structural properties over graphene growth by cvdent://SD_ILS/0/SD_ILS:3925642024-09-24T21:15:26Z2024-09-24T21:15:26Zby Özçeri, Elif.<br/><a href="http://hdl.handle.net/11147/3566">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Production and characterization of HfO2 high-k dielectric layers by sputtering techniqueent://SD_ILS/0/SD_ILS:239072024-09-24T21:15:26Z2024-09-24T21:15:26Zby Cantaş, Ayten.<br/><a href="http://hdl.handle.net/11147/3457">Access to Electronic Version</a><br/>Format: El Yazması<br/>Temperature dependence of resistivity and hall coefficient in Cu2ZnSnS4 absorbers for thin film solar cellsent://SD_ILS/0/SD_ILS:15640192024-09-24T21:15:26Z2024-09-24T21:15:26Zby Akça, Fatime Gülşah, author.<br/><a href="http://hdl.handle.net/11147/6609">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Growth of Cu2ZnSnS4 absorber layer on flexible metallic substrates for thin film solar cell applicationsent://SD_ILS/0/SD_ILS:4682822024-09-24T21:15:26Z2024-09-24T21:15:26Zby Yazıcı, Şebnem, author.<br/><a href="http://hdl.handle.net/11147/4246">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Growth and characterization of ZnSnO thin films on polymers for OLEDsent://SD_ILS/0/SD_ILS:21340652024-09-24T21:15:26Z2024-09-24T21:15:26Zby Ekmekçioğlu, Merve, author.<br/><a href="https://hdl.handle.net/11147/7337">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>