Search Results for İzmir Institute of Technology. Physics - Narrowed by: Atomic force microscopy.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/tr_TR/default_tr/default_tr/qu$003d$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002bPhysics$0026qf$003dSUBJECT$002509Konu$002509Atomic$002bforce$002bmicroscopy.$002509Atomic$002bforce$002bmicroscopy.$0026rm$003dTEZ$002bKOLEKSIYONU0$00257C$00257C$00257C1$00257C$00257C$00257C0$00257C$00257C$00257Ctrue$0026te$003dILS$0026ps$003d300?2024-06-25T16:19:01ZDefect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealingent://SD_ILS/0/SD_ILS:9490072024-06-25T16:19:01Z2024-06-25T16:19:01Zby Bakali, Emine, author.<br/><a href="http://hdl.handle.net/11147/4583">Access to Electronic Versiyon.</a><br/>Format: El Yazması<br/>Electrical surface modification and characterization of metallic thin films using scanning probe microscope (SPM) nanolithography methodent://SD_ILS/0/SD_ILS:981232024-06-25T16:19:01Z2024-06-25T16:19:01Zby Büyükköse, Serkan.<br/><a href="http://hdl.handle.net/11147/4056">Access to Electronic Version.</a><br/>Format: El Yazması<br/>