Search Results for İzmir Institute of Technology. Physics - Narrowed by: Atomic force microscopy. SirsiDynix Enterprise https://catalog.iyte.edu.tr/client/tr_TR/default_tr/default_tr/qu$003d$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002bPhysics$0026qf$003dSUBJECT$002509Konu$002509Atomic$002bforce$002bmicroscopy.$002509Atomic$002bforce$002bmicroscopy.$0026rm$003dTEZ$002bKOLEKSIYONU0$00257C$00257C$00257C1$00257C$00257C$00257C0$00257C$00257C$00257Ctrue$0026te$003dILS$0026ps$003d300? 2024-06-25T16:19:01Z Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing ent://SD_ILS/0/SD_ILS:949007 2024-06-25T16:19:01Z 2024-06-25T16:19:01Z by&#160;Bakali, Emine, author.<br/><a href="http://hdl.handle.net/11147/4583">Access to Electronic Versiyon.</a><br/>Format:&#160;El Yazması<br/> Electrical surface modification and characterization of metallic thin films using scanning probe microscope (SPM) nanolithography method ent://SD_ILS/0/SD_ILS:98123 2024-06-25T16:19:01Z 2024-06-25T16:19:01Z by&#160;B&uuml;y&uuml;kk&ouml;se, Serkan.<br/><a href="http://hdl.handle.net/11147/4056">Access to Electronic Version.</a><br/>Format:&#160;El Yazması<br/>