This thesis presents the effect of sulfurization temperature on Cu2ZnSnS4 (CZTS) thin films on flexible titanium (Ti) foil substrates. The CZTS films was produced by using a two-stage method. In the first step, the metallic precursor layers Cu/Sn/Zn/Substrate were deposited on Ti foil substrate by using DC magnetron sputtering method. In the second step, the deposited metal precursors were sulfurized in a graphite box under Argon (Ar) ambient inside a tubular furnace under a definite temperature. To understand the effects of temperature on the formation of the CZTS structure several analyses were performed. Our samples, each with a different sulfurization temperature; ranging from 530 to 580 oC, were carried out and the structural properties of the absorber layer was determined. XRD measurements showed a sharp and intense peak coming from the (112) planes which was a strong evidence for good crystallinity. The intensity of (112) plane became a sharp and intense with increasing sulfurization temperature. Raman spectroscopy of the sulfurized thin films revealed that, the kesterite structure CZTS thin film were obtained with increasing sulfurization temperature. Electron Dispersive Spectroscopy (EDS) was also used for the compositional analysis of the thin films. EDS analysis showed that the films were grown with a Cu-poor Zn-rich composition. From these analyses we conclude that no interface formation occurred between the substrate and the CZTS thin films, hence, a buffer layer was not required. It was also seen that Ti foil was suitable as substrate for the growth of CZTS thin films with desired properties. We also conclude that the sulfurization temperature plays a crucial role for producing good quality CZTS thin films on Ti foil substrate.