Analysis of cantilevers for high-speed atomic force microscopy
tarafından
 
Brar, Harpreet Singh, author.

Başlık
Analysis of cantilevers for high-speed atomic force microscopy

Yazar
Brar, Harpreet Singh, author.

Yazar Ek Girişi
Brar, Harpreet Singh, author.

Fiziksel Tanımlama
xiv, 47 leaves: illustrarions, charts;+ 1 computer laser optical disc.

Özet
In life sciences, High-Speed Atomic Force Microscopy (HS-AFM) is now widely accepted as a dynamic event visualizer for numerous biological samples such as live cells, membrane lipids, ATP-proteins, enzymatic reactions, DNA-protein interactions, etc. HSAFM’s unique ability to observe surface topography of the samples with height data and with a resolution of up-to a single atom makes it a prominent tool in Nano measurements. HS-AFM Imaging technique’s speed and response is limited by various factors including cantilever probes, operating environment, scanning techniques etc. Cantilevers are indispensable and integral part of HS-AFM Systems, thereby necessitating their own critical evaluations. Therefore, evaluation of various parameters like resonance frequency, stiffness and Q-factor of cantilevers is an active area of research. The simulated research work mimics the experimental conditions of HS-AFM operation in air and liquid environment. The damping mechanisms such as viscous and acoustic damping of the medium, squeeze film damping, and damping due to viscoelasticity of the material are included in the finite element simulations. High frequency soft cantilevers suitable for HS-AFM with the stiffness of ~1 N/m and with the first flexural eigenmode resonance frequency of ~1.5 MHz (in liquid) and ~5 MHz (in air) are studied. Numerous small rectangular and modified cantilevers of Silicon and Polymer (SU-8) materials with the length of ~5 to 10 μm, width of ~1 to 2.5 μm and thickness of ~0.1 to 0.6 μm are analyzed. Our aim in this research is to identify appropriate cantilever geometries and materials for HS-AFM applications.

Konu Başlığı
Electrical engineering.
 
Atomic force microscopy.
 
Frequency response (Electrical engineering).

Yazar Ek Girişi
Balantekin, Müjdat,

Tüzel Kişi Ek Girişi
İzmir Institute of Technology. Electronics and Communication Engineering.

Tek Biçim Eser Adı
Thesis (Master)--İzmir Institute of Technology: Electronics and Communication Engineering.
 
İzmir Institute of Technology: Electronics and Communication Engineering--Thesis (Master).

Elektronik Erişim
Access to Electronic Versiyon.


LibraryMateryal TürüDemirbaş NumarasıYer NumarasıDurumu/İade Tarihi
IYTE LibraryTezT001783TK146 .B822 2018Tez Koleksiyonu