62 Results
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by 
Tatlıdil, Duygu, author.
Format: 
El Yazması
Alıntı: 
Electron paramagnetic resonance spectroscopy.
by 
Eltepe, Hüdal Emre.
Format: 
El Yazması
Alıntı: 
X-Ray diffraction, Fourier Transform Infrared Spectroscopy (FTIR), Scanning Electron Microscopy (SEM
by 
Kalkan, Sırrı Batuhan, author.
Format: 
El Yazması
Alıntı: 
passivated with thin SiO2 film grown by Thermal Evaporation and Pulsed Electron Deposition (PED) techniques
by 
Tetik, İlkin, author.
Format: 
El Yazması
Alıntı: 
infrared spectroscopy (FTIR), Scanning electron microscopy (SEM), contact angle were used for
by 
Bakali, Emine, author.
Format: 
El Yazması
Alıntı: 
parameters were analyzed by Scanning Electron Microscope (SEM), Atomic Force Microscope (AFM), Everson Etch
by 
Cihan, Esra, author.
Format: 
El Yazması
Alıntı: 
Transform Infrared Spectroscopy (FTIR), Scanning Electron Microscope (SEM), Scanning Transmission Microscope
by 
Şenöz, Ceylan
Format: 
El Yazması
Alıntı: 
between the crucible and the frit was investigated by Scanning Electron Microscopy (SEM, Philips XL-30S
by 
Çapkın, İrem Yaren, author.
Format: 
El Yazması
Alıntı: 
pharmaceutical blister types with SEM-EDS (Scanning electron microscopy- Energy dispersive X-ray spectroscopy
by 
Tunca Taşkıran, Senagül, author.
Format: 
El Yazması
Alıntı: 
properties of the composites were investigated. Samples were characterized by using Scanning Electron
by 
Önen, Rabia, author.
Format: 
El Yazması
Alıntı: 
Electron Microscopy with Energy Dispersive Spectroscopy (SEM/EDS). As a result of the study, it was found