5 Results
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by 
Yağmurcukardeş, Nesli, author.
Format: 
El Yazması
Alıntı: 
Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Kelvin Probe Force Microscopy (KPFM), Raman
by 
Yanılmaz, Alper, author.
Format: 
El Yazması
Alıntı: 
characterized via Raman Spectroscopy, X-ray photoelectron spectroscopy (XPS), scanning tunneling microscopy