45 sonuç bulundu Arama sonuçlarına abone ol
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Yazdır
by 
Yılmaz, Teyfik, author.
Format: 
El Yazması
Alıntı: 
Atomic emission spectroscopy
by 
Tütüncü, Büşra Buse
Format: 
El Yazması
Alıntı: 
absorption and emission spectroscopy, high-performance liquid chromatography, and inductively coupled plasma
by 
Kaya, Beraat Umur, author.
Format: 
El Yazması
Alıntı: 
crucial. Unlike the detection methods of atomic absorption spectroscopy, atomic emission spectroscopy, and
by 
Bakali, Emine, author.
Format: 
El Yazması
Alıntı: 
parameters were analyzed by Scanning Electron Microscope (SEM), Atomic Force Microscope (AFM), Everson Etch
by 
Mendirek, Gizem, author.
Format: 
El Yazması
Alıntı: 
. Scanning Tunneling Spectroscopy (STS) was used to provide information about the local density of states of
by 
Cebeci, Miray, author.
Format: 
El Yazması
Alıntı: 
detecting cadmium have been used, including atomic absorption and emission spectroscopy and inductively
by 
Yıldırımkaraman, Öykü, author.
Format: 
El Yazması
Alıntı: 
Electrochemical Impedance Spectroscopy. The morphological properties investigated by Atomic Force Microscopy
by 
Uç, Merve, author.
Format: 
El Yazması
Alıntı: 
anticorrosive properties are determined by Electrochemical Impedance Spectroscopy (EIS). The results indicate
by 
Yağmurcukardeş, Nesli, author.
Format: 
El Yazması
Alıntı: 
Spectroscopy, Quartz Crystal Microbalance (QCM) and amperometric measurements were used for the investigation
by 
Çetintaş, Ceyla, author.
Format: 
El Yazması
Alıntı: 
absorption spectroscopy, atomic emission spectroscopy and inductively coupled plasma spectrometry. However
by 
Cantürk, Ceren, author.
Format: 
El Yazması
Alıntı: 
metal ions can be achieved by classical spectroscopic methods such as atomic absorption and atomic
by 
Özden, Selin, author.
Format: 
El Yazması
Alıntı: 
on undoped 625≤25 μm thick GaAs(211)B wafers. The surfaces of GaAs wafers were investigated by Atomic
by 
Yıldırım, Koray, author.
Format: 
El Yazması
Alıntı: 
Dispersive Spectroscopy(EDX), Electrochemical Impedance Spectroscopy(EIS), Direct Current(DC) Polarization
by 
Yavaş, Begüm, author.
Format: 
El Yazması
Alıntı: 
films were analyzed by atomic force microscopy and Nomarski microscopy. Vibrational phonon modes
by 
Deliismail, Özgün, author.
Format: 
El Yazması
Alıntı: 
Infrared, Induced Coupled Plasma Atomic Emmision Spectroscopy, and Thermal Gravimetric Analyzer. It was
by 
Örer, Sabiha.
Format: 
El Yazması
Alıntı: 
Laser Induced Breakdown Spectroscopy, LIBS, is a versatile atomic emission spectrometric technique
by 
Akbalı, Barış, author.
Format: 
El Yazması
Alıntı: 
Raman spectroscopy is powerful method to understand atomic vibrations that give information about
by 
Karakuş, Erman, author.
Format: 
El Yazması
Alıntı: 
as atomic absorption and atomic emission spectroscopy and inductively-coupled plasma spectrometry
by 
Günnar, Merve, author.
Format: 
El Yazması
Alıntı: 
microscopy (AFM), Nomarski microscopy, Fourier transformation infrared spectroscopy (FTIR) and X-ray
by 
Yazıcı, Şebnem, author.
Format: 
El Yazması
Alıntı: 
transmis-sion, and optical band gap have been determined to characterize CZTS thin films. Raman spectroscopy and
by 
Özdamar, Burcu, author.
Format: 
El Yazması
Alıntı: 
nanoparticles was performed by dynamic light scattering, atomic force microscopy and infrared spectroscopy. To
by 
Aras, Nadir.
Format: 
El Yazması
Alıntı: 
Laser-Induced Breakdown Spectroscopy (LIBS) is an optical atomic emission spectroscopic technique
by 
Okur, Serdal.
Format: 
El Yazması
Alıntı: 
microscopy (SEM), atomic force microscopy (AFM), and glow discharge optical emission spectroscopy (GDOES
by 
Topçuoğlu, Özge.
Format: 
El Yazması
Alıntı: 
spectroscopy, thermal gravimetry, differential scanning calorimetry (DSC) and atomic force microscope
by 
Tomak, Aysel, author.
Format: 
El Yazması
Alıntı: 
UV-Vis/NIR spectroscopy, scanning electron microscopy (SEM), atomic force microscopy (AFM), inductively
by 
Keskin, Yasemin, author.
Format: 
El Yazması
Alıntı: 
obtained too. Number of layers were determined by Raman Spectroscopy. Nanotribological characterizations
by 
Seziş, Ümmügülsüm, author.
Format: 
El Yazması
Alıntı: 
investigated using attenuated total reflection-Fourier transform infrared (ATR-FTIR) spectroscopy, specular
by 
Özpirin, Merve, author.
Format: 
El Yazması
Alıntı: 
coatings was evaluated using a variety of analytical tools such as Fourier Transform Infrared Spectroscopy
by 
Bilgilisoy, Elif, author.
Format: 
El Yazması
Alıntı: 
layers were analyzed by atomic force microscopy (AFM), scanning electron microscopy (SEM) and Nomarski
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