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by
Brar, Harpreet Singh, author.
Format:
El Yazması
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Analysis of cantilevers for high-speed atomic force microscopy / Brar, Harpreet Singh, author.
2.
by
Yetgin, Senem.
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El Yazması
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Dna adsorption on sılıca, alumına and hydroxyapatite and imaging of dna by atomic force microscopy/
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3.
by
Yelken Özek, Gülnihal.
Format:
El Yazması
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Estimation of the surface charge distribution of solids in liquids by using atomic force microscopy/
by
Coşar, Alper, author.
Format:
El Yazması
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Atomic force microscopy.
by
Yıldırım, Koray, author.
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El Yazması
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Atomic force microscopy.
by
Gül, Semra.
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El Yazması
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Atomic force microscopy
by
Güler, Ayşe.
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El Yazması
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Atomic force microscopy.
by
Bölükçü, Elif Şeniz.
Format:
El Yazması
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Atomic force microscopy.
by
Büyükköse, Serkan.
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El Yazması
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Atomic force microscopy.
by
Bakali, Emine, author.
Format:
El Yazması
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Atomic force microscopy.
by
Özkendir, Dilce, author.
Format:
El Yazması
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Atomic force microscopy.
by
Yavaş, Begüm, author.
Format:
El Yazması
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Atomic force microscopy.
by
Aydın, Hasan.
Format:
El Yazması
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and unmodified ITO surfaces were performed via atomic force microscopy and scanning tunneling
by
Üney, Sinem, author.
Format:
El Yazması
Alıntı:
Electron Microscopy (SEM), Atomic Force Microscopy (AFM) and Surface Plasmon Resonance which allows to
by
Uçar Arserim, Dilhun Keriman.
Format:
El Yazması
Alıntı:
scanning electron microscopy, atomic force microscopy, X-ray diffractometer, and Fourier transform infrared
by
Yıldırımkaraman, Öykü, author.
Format:
El Yazması
Alıntı:
Electrochemical Impedance Spectroscopy. The morphological properties investigated by Atomic Force Microscopy
by
Uç, Merve, author.
Format:
El Yazması
Alıntı:
), X-ray Fluorensence Spectrometer (XRF) and Atomic Force Microscopy (AFM) analysis, while their
by
Koca, Nazan, author.
Format:
El Yazması
Alıntı:
AFM (Atomic Force Microscopy) and SEM (Scanning Electron Microscopy). The oxygen and water vapor
by
Yağmurcukardeş, Nesli, author.
Format:
El Yazması
Alıntı:
Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Kelvin Probe Force Microscopy (KPFM), Raman
by
İncel, Anıl, author.
Format:
El Yazması
Alıntı:
drop tower system which was specficically designed for this research. Atomic force microscopy (AFM
by
Tüzüner, Şeyda, author.
Format:
El Yazması
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composite films was examined by atomic force microscopy (AFM) and scanning electron microscopy (SEM). The
by
Özden, Selin, author.
Format:
El Yazması
Alıntı:
Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). The variation of As2O3 and Ga2O3 contents
23.
by
Polatoğlu, İlker.
Format:
El Yazması
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force microscopy (AFM) and FTIR analysis show that tyrosinase enzyme was successfully coated on the
by
Şeker, Mavişe.
Format:
El Yazması
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carried out to investigate if there is any increase in ITO work function. Atomic Force Microscopy (AFM
by
Şimşek, Yılmaz.
Format:
El Yazması
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vacuum evaporation, photolithography analyzed by Atomic Force Microscopy. We have investigated
by
Oğuz, Kaan.
Format:
El Yazması
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Diffraction (XRD), Atomic Force Microscopy (AFM), and Scanning Electron Microscopy (SEM). Ellipsometry was
by
Baskan, Öznur, author.
Format:
El Yazması
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. Ultrastructural changes were identified on cellular and molecular levels. Atomic force microscopy was used to
by
Demiray, Levent, author.
Format:
El Yazması
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identified on cellular and molecular levels. To characterize alterations in cell surface, Atomic force
by
Yağmurcukardeş, Nesli.
Format:
El Yazması
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carried out using Quartz Crystal Microbalance (QCM), Atomic Force Microscopy (AFM), Kelvin Probe Force
by
Atikler Genç, Gözde.
Format:
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particles were monitored through particle size analysis by Dynamic Light Scattering and Atomic Force
by
Köseoğlu, Hasan.
Format:
El Yazması
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are Ta/PR and PR./Ta/PR. Their heights and lateral dimensions were analyzed by Atomic Force Microscopy
by
Örer, Sabiha.
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optimized with respect to time, crater size, ablation depth and laser energy. Atomic Force Microscopy (AFM
by
Özdemir, Mehtap.
Format:
El Yazması
Alıntı:
height of the mesa were investigated using atomic force microscopy. Tunneling characteristics were
by
Öztürk, Serdar.
Format:
El Yazması
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confirmed by IRspectrum of zinc stearate. Atomic Force Microscopy and Scanning Electron Microscopy images
by
Kurter, Cihan.
Format:
El Yazması
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heights of the mesas were examined with atomic force microscopy.Hysteretic I-V curves with multiple
36.
by
Kurt, Metin, author.
Format:
El Yazması
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fabrication, the exact thickness of the crystal were obtained using atomic force microscopy. Then, the samples
by
Günnar, Merve, author.
Format:
El Yazması
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over the film surface. Characterization results were compared to those obtained by atomic force
by
Özdamar, Burcu, author.
Format:
El Yazması
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nanoparticles was performed by dynamic light scattering, atomic force microscopy and infrared spectroscopy. To
by
Özçeri, Elif.
Format:
El Yazması
Alıntı:
Force Microscopy (AFM) techniques, respectively. The thickness and columnar structure of the films were
by
Okur, Serdal.
Format:
El Yazması
Alıntı:
microscopy (SEM), atomic force microscopy (AFM), and glow discharge optical emission spectroscopy (GDOES
by
Vahaplar, Kadir
Format:
El Yazması
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been studied by X-Ray Diffractometer (XRD), Atomic Force Microscopy (AFM) and Scanning Electron
by
Urkaç Sokullu, Şadiye Emel.
Format:
El Yazması
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), Differential Scanning Calorimetry (DSC), X-Ray Diffraction (XRD) Analysis, Atomic Force Microscopy (AFM
by
Tomak, Aysel, author.
Format:
El Yazması
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UV-Vis/NIR spectroscopy, scanning electron microscopy (SEM), atomic force microscopy (AFM), inductively
by
Keskin, Yasemin, author.
Format:
El Yazması
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were done with Atomic Force Microscopy. The experimental results showed that single layer graphene on
by
Seziş, Ümmügülsüm, author.
Format:
El Yazması
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. The surface topography was studied using atomic force microscopy (AFM). The findings show the
by
Özpirin, Merve, author.
Format:
El Yazması
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(FTIR), Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM) and Contact Angle measurements
by
Bilgilisoy, Elif, author.
Format:
El Yazması
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layers were analyzed by atomic force microscopy (AFM), scanning electron microscopy (SEM) and Nomarski
by
Molva, Çelenk, author.
Format:
El Yazması
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changes using scanning electron and atomic force microscopy. The results of this study clearly showed that
by
Ocak, Yılmaz.
Format:
El Yazması
Alıntı:
X-ray diffraction (XRD), atomic force microscopy (AFM) and scanning transmission electron microscopy
by
Çağlar, Özlem
Format:
El Yazması
Alıntı:
studied by X-ray diffraction (XRD), atomic force microscopy (AFM) and scanning electron microscope (SEM
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