by
Büyükköse, Serkan.
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Scanning probe microscopy.
by
Aydın, Hasan.
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Alıntı:
taken via spreading resistance microscopy and scanning tunneling microscopy. Moreover, in order to
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by
Yağmurcukardeş, Nesli, author.
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Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Kelvin Probe Force Microscopy (KPFM), Raman
by
Yanılmaz, Alper, author.
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Alıntı:
characterized via Raman Spectroscopy, X-ray photoelectron spectroscopy (XPS), scanning tunneling microscopy
by
Gül, Semra.
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Alıntı:
Probe Microscopy (SPM) lithography that uses a nanometer sharpened tip has demonstrated outstanding
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