X-RAY SCATTERING -- MATERIALS SCIENCE AND TECHNOLOGIES -- Library of Congress Cataloging-in-Publication Data -- CONTENTS -- PREFACE -- GISAXS - PROBE OF BURIED INTERFACES INMULTI-LAYERED THIN FILMS -- ABSTRACT -- 1. INTRODUCTION -- 2. THEORETICAL DESCRIPTION OF INTERFACES -- 3. GRAZING-INCIDENCE SMALL-ANGLE X-RAY SCATTERING FROMMULTIPLE INTERFACES -- 4. EXPERIMENTAL ASPECTS OF SMALL-ANGLESCATTERING FROM MULTI-LAYERS -- 5. INTERFACE STUDIES OF MULTILAYERED SYSTEM -- 5.1. Interface Properties of Mo/Si Multilayers -- 5.2. Interface Properties and Thermal Stability W/B4C Multi-layers -- 5.3. Vertical Replication Effects in La/B4C Multi-layers -- 5.4. Clusters in Ultrathin Co/C, W/B4C, Mo/B4C Multi-layers -- 5.5. Interface Properties and Thermal Stability Nife/Au/Co/Au Multi-layers -- CONCLUSIONS -- REFERENCES -- IN SITU, REAL-TIME SYNCHROTRONX-RAY SCATTERING -- ABSTRACT -- 1. INTRODUCTION -- 1.1. Detector Considerations -- 1.2. Geometrical Considerations -- 2. NANOPARTICLE FORMATION CELL -- 2.1. Pt Nanoparticles -- 2.2. Pd Nanoparticles -- 2.3. Final Comments -- 3. ELECTROCHEMICAL CELL, WITH HEATING CAPACITY -- 3.1. FeCO3 Corrosion Product Films -- 3.2. ZnO Nanostructured Films -- 3.3. Final Comments -- CONCLUSION -- ACKNOWLEDGMENTS -- REFERENCES -- APPLICATIONS OF X-RAY SCATTERING INEDIBLE LIPID SYSTEMS -- ABSTRACT -- INTRODUCTION -- POLYMORPHISM OF COCOA BUTTER -- POLYMORPHISM OF CUPUASSU -- EFFECT OF SUCROSE ESTERS ON CRYSTALLIZATION -- CONCLUSIONS -- REFERENCES -- SMALL ANGLE X-RAY SCATTERING ANALYSISOF NANOMATERIALS FOR ULTRA LARGE SCALEINTEGRATED CIRCUITS -- ABSTRACT -- 1. INTRODUCTION -- 2. HISTORICAL BACKGROUND -- 3. THEORY OF SMALL ANGLE X-RAY SCATTERING -- 3.1. Form Factor and Structure Factor -- 4. EXPERIMENT -- 5. RESULTS AND DISCUSSION -- 5.1. Sol-Gel Prepared Silica -- 5.2. Porous Silk.

5.2.1. Development of Porous Silktm Structural Model -- CONCLUSION -- REFERENCES -- X-RAY SCATTERING OF BACTERIAL CELL WALLCOMPOUNDS AND THEIR NEUTRALIZATION -- ABSTRACT -- INTRODUCTION -- X-RAY SCATTERING EXPERIMENTS AND ANALYSIS -- STRUCTURAL PREREQUISITES OF ENDOTOXIN ACTIVITY -- AGGREGATE STRUCTURES OF ENDOTOXIN:PEPTIDE COMPLEXES -- ACKNOWLEDGMENTS -- REFERENCES -- DECOMPOSITION OF WAXS DIFFRACTOGRAMSOF SEMICRYSTALLINE POLYMERSBY SIMULATED ANNEALING -- Abstract -- 1. Motivation -- 2. Method -- 3. Application of the Simulated Annealing Method -- 4. Appendix: Source Code -- 4.1. ipp simann.f90 -- 4.2. peaks-alpha -- 4.3. peaks-beta -- 4.4. peaks-gamma -- 4.5. experiment.dat -- 4.6. random.seed -- References -- DEPTH PROFILE ANALYSIS OF SURFACE LAYERSTRUCTURE USING X-RAY DIFFRACTION ANDX-RAY REFLECTIVITY AT SMALL GLANCINGANGLES OF INCIDENCE -- ABSTRACT -- 1. INTRODUCTION -- 2. DEPTH PROFILE ANALYSIS OF SURFACE LAYER USING X-RAYDIFFRACTION AT SMALL GLANCING ANGLE OF INCIDENCE -- 2.1. Experimental of X-Ray Diffraction at Small Glancing Angle of Incidence -- 2.2. Analysis of the Intensity of X-Rays Propagating in the Material -- 2.3. Depth Profiling of Poly-Crystalline Layers Structure -- 2.4. Depth Profiling of the Crystal Grain Size nearby the Surface -- 3. DEPTH PROFILE ANALYSIS OF STRAIN DISTRIBUTION IN SURFACELAYER USING X-RAY DIFFRACTION AT SMALL GLANCINGANGLE OF INCIDENCE -- 3.1. Experimental for the Depth Profile Analysis of Strain Distribution inSurface Layer by X-Ray Diffraction at Small Glancing Angle of Incidence -- 3.2. Depth Profile Analysis of Strain Distribution in Surface Layer -- 4. DEPTH PROFILE ANALYSIS OF SURFACE LAYER USING X-RAYREFLECTIVITY AT SMALL GLANCING ANGLE OF INCIDENCE -- 4.1. X-Ray Reflectivity from a Multilayer with a Flat Surface andFlat Interfaces.

4.2. Previous Calculations of X-Ray Reflectivity When Roughness Exists atthe Surface and Interface -- 4.3. The Refractive Fresnel Coefficient of a Rough Interface inPrevious Calculations -- 4.4. A New Accurate Formula for the Reflectivity from a Multilayer with aRough Surface and Rough Interfaces -- REFERENCES -- SAXS/WAXS CHARACTERIZATION OF SOL-GELDERIVED NANOMATERIALS -- ABSTRACT -- 1. INTRODUCTION -- 1.1. Theoretical Basis of Small-Angle X-Ray Scattering -- 1.2. Theoretical Basis of Wide-Angle X-Ray Scattering -- 2. SAXS/WAXS CHARACTERIZATION OF SOL-GELDERIVED NANOMATERIALS -- 2.1. Sol-Gel Derived Materials -- 2.2.1. SAXS Characterization of Sol-Gel Derived Nanomaterials -- 2.3. WAXS Characterization of Sol-Gel Derived Nanomaterials -- 3. RECENT ADVANCEMENT IN SYNCHROTRON-BASEDSAXS/WAXS -- CONCLUSIONS -- ACKNOWLEDGMENTS -- REFERENCES -- INDEX.