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by
Aydın, Hasan.
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and unmodified ITO surfaces were performed via atomic force microscopy and scanning tunneling
by
Üney, Sinem, author.
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Electron Microscopy (SEM), Atomic Force Microscopy (AFM) and Surface Plasmon Resonance which allows to
by
Uçar Arserim, Dilhun Keriman.
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scanning electron microscopy, atomic force microscopy, X-ray diffractometer, and Fourier transform infrared
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Uç, Merve, author.
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), X-ray Fluorensence Spectrometer (XRF) and Atomic Force Microscopy (AFM) analysis, while their
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Yıldırımkaraman, Öykü, author.
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Electrochemical Impedance Spectroscopy. The morphological properties investigated by Atomic Force Microscopy
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Koca, Nazan, author.
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AFM (Atomic Force Microscopy) and SEM (Scanning Electron Microscopy). The oxygen and water vapor
by
Yağmurcukardeş, Nesli, author.
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Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Kelvin Probe Force Microscopy (KPFM), Raman
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Tüzüner, Şeyda, author.
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composite films was examined by atomic force microscopy (AFM) and scanning electron microscopy (SEM). The
by
Özden, Selin, author.
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Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). The variation of As2O3 and Ga2O3 contents
22.
by
Polatoğlu, İlker.
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force microscopy (AFM) and FTIR analysis show that tyrosinase enzyme was successfully coated on the
by
Şeker, Mavişe.
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carried out to investigate if there is any increase in ITO work function. Atomic Force Microscopy (AFM
by
Şimşek, Yılmaz.
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vacuum evaporation, photolithography analyzed by Atomic Force Microscopy. We have investigated
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