50 sonuç bulundu Arama sonuçlarına abone ol
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Yazdır
by 
Şimşek, Yılmaz.
Format: 
El Yazması
Alıntı: 
vacuum evaporation, photolithography analyzed by Atomic Force Microscopy. We have investigated
by 
Oğuz, Kaan.
Format: 
El Yazması
Alıntı: 
Diffraction (XRD), Atomic Force Microscopy (AFM), and Scanning Electron Microscopy (SEM). Ellipsometry was
by 
Baskan, Öznur, author.
Format: 
El Yazması
Alıntı: 
. Ultrastructural changes were identified on cellular and molecular levels. Atomic force microscopy was used to
by 
Atikler Genç, Gözde.
Format: 
El Yazması
Alıntı: 
particles were monitored through particle size analysis by Dynamic Light Scattering and Atomic Force
by 
Köseoğlu, Hasan.
Format: 
El Yazması
Alıntı: 
are Ta/PR and PR./Ta/PR. Their heights and lateral dimensions were analyzed by Atomic Force Microscopy
by 
Örer, Sabiha.
Format: 
El Yazması
Alıntı: 
optimized with respect to time, crater size, ablation depth and laser energy. Atomic Force Microscopy (AFM
by 
Özdemir, Mehtap.
Format: 
El Yazması
Alıntı: 
height of the mesa were investigated using atomic force microscopy. Tunneling characteristics were
by 
Kurter, Cihan.
Format: 
El Yazması
Alıntı: 
heights of the mesas were examined with atomic force microscopy.Hysteretic I-V curves with multiple
by 
Öztürk, Serdar.
Format: 
El Yazması
Alıntı: 
confirmed by IRspectrum of zinc stearate. Atomic Force Microscopy and Scanning Electron Microscopy images
by 
Özdamar, Burcu, author.
Format: 
El Yazması
Alıntı: 
nanoparticles was performed by dynamic light scattering, atomic force microscopy and infrared spectroscopy. To
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50 sonuç bulundu Arama sonuçlarına abone ol
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