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by
Oğuz, Kaan.
Format:
El Yazması
Alıntı:
Diffraction (XRD), Atomic Force Microscopy (AFM), and Scanning Electron Microscopy (SEM). Ellipsometry was
by
Akkaşoğlu, Oğuz, author.
Format:
El Yazması
Alıntı:
X-ray diffraction method. Microstructural analysis and average grain size determination was performed by
by
Bıyıklı, Ozan, author.
Format:
El Yazması
Alıntı:
), X-Ray diffraction (XRD), and current-voltage measurement. Furthermore, n-i-p devices with the FTO/c-TiO2
by
Serkir, Sevgi, author.
Format:
El Yazması
Alıntı:
micro-structures of samples were analysed by scanning electron microscopy and the X-ray diffraction techniques. The
by
Uyanık, Zemzem, author.
Format:
El Yazması
Alıntı:
films have been characterized as a function of annealing temperature by X-ray diffraction (XRD
by
Meriç, Ece, author
Format:
El Yazması
Alıntı:
X-Ray Diffraction (XRD) spectroscopies. Scanning electron microscopy (SEM) was used to investigate the
by
Şerifaki, Kerem, author.
Format:
El Yazması
Alıntı:
Microscope coupled with XRay Energy Dispersive System (SEM-EDS), X-ray diffraction analyses (XRD), Fourier
by
Budak Ünaler, Meral.
Format:
El Yazması
Alıntı:
, Incised-Sgraffito, Incised and Champlevé, were analyzed by Scanning Electron Microscope (SEM-EDX), X-Ray Diffraction
by
Akın, Osman.
Format:
El Yazması
Alıntı:
experiments are exploited to ensure existence of the transient grating and its diffraction capability. Finally
by
Demir, Serap.
Format:
El Yazması
Alıntı:
renderings underlying the painting layers were established. In the analyses, X-Ray diffraction (XRD
by
Şen, Didem.
Format:
El Yazması
Alıntı:
, Fourier Transform Infrared Spektroscopy (FTIR), X-Ray Diffraction (XRD), Scanning Electron Microscope (SEM
by
Kepenekci, Özlem.
Format:
El Yazması
Alıntı:
were used to identify morphology and crystalline nature such as X-ray Diffraction, Scanning and
76 sonuç bulundu
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