by
Tozan, Şerife.
Format:
El Yazması
Alıntı:
) and x-ray diffraction measurements.Finally, our results were compared to literature and explanied
View Other Search Results
by
Algül, Berrin Pınar.
Format:
El Yazması
Alıntı:
Diffraction.Prepared thin film samples were patterned as bicrystal grain boundary Josephson junctions by standard
View Other Search Results
Arama Sonuçlarını Sınırlandır
Daraltılmış: