Investigation of the silicon nitride coating thickness on silicon wafer substrates for enhanced sensitivity in dried nano-droplet analysis by laser induced breakdown spectroscopy için kapak resmi
Investigation of the silicon nitride coating thickness on silicon wafer substrates for enhanced sensitivity in dried nano-droplet analysis by laser induced breakdown spectroscopy
Başlık:
Investigation of the silicon nitride coating thickness on silicon wafer substrates for enhanced sensitivity in dried nano-droplet analysis by laser induced breakdown spectroscopy
Yazar:
Durkan Kaplan, Dilara, author.
Fiziksel Tanımlama:
xiii, 72 leaves: charts;+ 1 computer laser optical disc
Özet:
Laser Induced Breakdown Spectroscopy (LIBS) is an atomic emission spectroscopic technique that uses laser beam to generate plasma for detection. Also, LIBS is a fast and non-destructive methodology with the advantage of no sample preparation requirement and easy usage. Surface Enhanced LIBS (SENLIBS) is recently developed version of the LIBS technique that uses some kinds of surface materials for supporting liquids and for the enhancement of LIBS signal intensity. It has been previously shown that silicon nitride coated silicon wafer substrates have some properties to enhance LIBS signal of several metal solutions by dried-droplet analysis methodology. Within the scope of this thesis study, silicon wafers coated with silicon nitride of several thicknesses were utilized for investigating the effect of coating thickness on sensitivity of the LIBS technique for liquids analysis. Heavy metals above a certain concentration have a significant negative impact on the environment and human health. In this context, the chromium, copper and lead metal liquid samples was loaded on 75 nm, 300 nm, 450 nm and 1000 nm silicon nitride coated wafers and dried, then analyzed by LIBS. As a result of this study, it was seen that the 1000 nm coating increased the LIBS signal intensity at the highest degree. The LOD value of the chromium element was improved as 0.56 pg, the lead element as 0.7 pg, and the copper element as 0.42 pg with 1000 nm Si3N4 coated wafers.
Yazar Ek Girişi:
Tek Biçim Eser Adı:
Thesis (Master)--İzmir Institute of Technology:Chemistry.

İzmir Institute of Technology: Chemistry --Thesis (Master).
Elektronik Erişim:
Access to Electronic Versiyon.
Ayırtma: Copies: