Fourier analysis based testing of finite state machines için kapak resmi
Fourier analysis based testing of finite state machines
Başlık:
Fourier analysis based testing of finite state machines
Yazar:
Takan, Savaş, author.
Yazar Ek Girişi:
Fiziksel Tanımlama:
x, 107 leaves: charts;+ 1 computer laser optical disc.
Özet:
Finite state machine (FSM) is a widely used modeling technique for circuit and software testing. FSM testing is a well-studied topic in the literature and there are several test case generation methods such as W, Wp, UIO, UIOv, DS, HSI and H. Despite the existing methods, there is still a need for alternative techniques with better performance in terms of test suite size, fault detection ratio and test generation time. In this thesis, two new test case generation methods, F and Fw have been proposed. The proposed test generation methods are based on Fourier analysis of Boolean functions. Fourier transformations have been studied extensively in mathematics, computer science and engineering. The proposed F method only tests outputs whereas Fw method also tests the next state with the outputs. In this context, the proposed methods are compared with UIO andWmethods in terms of characteristic, cost, fault detection ratio and effectiveness. The evaluation data are analyzed using T-Test and Hedges’ g. Results show that F and Fw methods outperform the existing methods in terms of the fault detection ratio per test.
Yazar Ek Girişi:
Tek Biçim Eser Adı:
Thesis (Doctoral)--İzmir Institute of Technology: Computer Engineering.

İzmir Institute of Technology: Computer Engineering--Thesis (Doctoral).
Elektronik Erişim:
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