Joint reconstruction of surface geometry and reflection properties by using image based methods için kapak resmi
Joint reconstruction of surface geometry and reflection properties by using image based methods
Başlık:
Joint reconstruction of surface geometry and reflection properties by using image based methods
Yazar:
Ozan, Şükrü, author.
Yazar Ek Girişi:
Fiziksel Tanımlama:
xvii, 118 leaves: color illustraltions.+ 1 computer laser optical disc.
Özet:
In this thesis, we aim to capture realistic geometrical descriptions of real world scenes and objects with a special effort to characterize reflection properties. After a brief review of the stereo imaging literature, we show our contributions to enhance stereo matching performance by identifying and eliminating specular surface reflections. The identification of specular reflection can be done both passively and actively. We use dichromatic-based methods to identify and eliminate specular reflections passively. We utilize polarization imaging methods to do the same job actively. In this work we also study structured light based methods that can give better reconstruction results compared to stereo imaging methods. We propose three laser scanners equipped with a pair of line lasers and a method to calibrate these systems. Another convenient way to obtain good surface reconstruction results using structured light is to use projectors that can be used as a light source that project complicated patterns. We show our results from a digital camera-projector-based scanning system as well. This system can robustly generate a very dense reconstruction of surfaces. We also use the projector based scanning system to determine the surface reflection properties. Using high dynamic range imaging (HDRI) techniques makes it possible for us to estimate scene radiance values. Since we can determine the incoming and outgoing light directions, we are able to measure bidirectional reflectance distribution function (BRDF) values from reconstructed surface points for corresponding directions. If the sample surface have not only diffuse reflection components but also a sufficient amount of specular highlights, it is possible to approximate BRDF corresponding to a surface by fitting an analytical BRDF model to the measured data. In our work we preferred to use Phong BRDF model. Finally, we present results with rendered synthetic images where the parameter values of the Phong model were estimated using scans of real objects.
Yazar Ek Girişi:
Tek Biçim Eser Adı:
Thesis (Doctoral)--İzmir Institute of Technology: Electronics and Communication Engineering.

İzmir Institute of Technology:Electronics and Communication Engineering.--Thesis (Doctoral).
Elektronik Erişim:
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