by
Bakali, Emine, author.
Format:
El Yazması
Alıntı:
parameters were analyzed by Scanning Electron Microscope (SEM), Atomic Force Microscope (AFM), Everson Etch
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by
Bilgilisoy, Elif, author.
Format:
El Yazması
Alıntı:
layers were analyzed by atomic force microscopy (AFM), scanning electron microscopy (SEM) and Nomarski
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