Search Results for Scanning electron microscopy.

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İncel, Anıl, author.

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), scanning electron microscopy (SEM) were used to characterize the topographic and morphologic properties of

Demirkol, İrem, author.

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by X-ray diffraction (XRD) and surface morphologies of coated pellets by scanning electron

Tokkan, Melike, author.

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Spectroscopy was used to clearly understand the phase structure of polymer. Scanning electron microscopy was

Gül, Dilek, author.

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, X-ray Diffraction (XRD), X-ray Fluorescence (XRF), Scanning Electron Microscopy (SEM), Thermogravimetric

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