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Meriç, Ece, author
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El Yazması
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X-Ray Diffraction (XRD) spectroscopies. Scanning electron microscopy (SEM) was used to investigate the
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Kurtuldu, Seher Hazal, author.
Format:
El Yazması
Alıntı:
diffraction (XRD), scanning electron microscopy (SEM), spectrophotometry and Raman spectroscopy. Structural
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