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Gül, Semra.
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Atomic force microscopy
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Tüzüner, Şeyda, author.
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composite films was examined by atomic force microscopy (AFM) and scanning electron microscopy (SEM). The
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Urkaç Sokullu, Şadiye Emel.
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), Differential Scanning Calorimetry (DSC), X-Ray Diffraction (XRD) Analysis, Atomic Force Microscopy (AFM
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Tomak, Aysel, author.
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UV-Vis/NIR spectroscopy, scanning electron microscopy (SEM), atomic force microscopy (AFM), inductively
by
Keskin, Yasemin, author.
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were done with Atomic Force Microscopy. The experimental results showed that single layer graphene on
by
Seziş, Ümmügülsüm, author.
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. The surface topography was studied using atomic force microscopy (AFM). The findings show the
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