by
Kızıltepe, Esin, author.
Format:
El Yazması
Alıntı:
by means of Scanning Electron Microscopy (SEM) and X-Ray Diffraction (XRD). The PE and PP were
by
Budak Ünaler, Meral.
Format:
El Yazması
Alıntı:
, Incised-Sgraffito, Incised and Champlevé, were analyzed by Scanning Electron Microscope (SEM-EDX), X-Ray Diffraction
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by
Bozkurt, Emrah.
Format:
El Yazması
Alıntı:
hexadecyltrimethylammonium chloride (HTAC) surfactants. X-ray diffraction of silicates with and without surface treatment
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