Search Results for Atomic force microscopy.

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Electrical surface modification and characterization of metallic thin films using scanning probe microscope (SPM) nanolithography method

Büyükköse, Serkan.

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Atomic force microscopy.

Interface properties of modified indium tin oxide based organic light emitting diodes withfunctional aromatic molecules

Aydın, Hasan.

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and unmodified ITO surfaces were performed via atomic force microscopy and scanning tunneling

Application of self assembled monolayer technique to imporove hole transport in organic leds

Şeker, Mavişe.

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carried out to investigate if there is any increase in ITO work function. Atomic Force Microscopy (AFM

Temperature dependence of tunneling in intrinsic josephson junctions of high temperature superconductors

Şimşek, Yılmaz.

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vacuum evaporation, photolithography analyzed by Atomic Force Microscopy. We have investigated

Characterization of modified ito anode surfaces with 4 [3-methylphenyl) phenyl) anino] benzoic acid for oled applications

Yağmurcukardeş, Nesli.

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carried out using Quartz Crystal Microbalance (QCM), Atomic Force Microscopy (AFM), Kelvin Probe Force

Reactive ion beam etching and characterization of high-Tc superconductor Bi2212

Köseoğlu, Hasan.

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are Ta/PR and PR./Ta/PR. Their heights and lateral dimensions were analyzed by Atomic Force Microscopy

Fabrication of Mesa structures on superconducting Bi2Sr2CaCu2O8+& single crystals

Kurter, Cihan.

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heights of the mesas were examined with atomic force microscopy.Hysteretic I-V curves with multiple

Influence of ni thin flim structural properties over graphene growth by cvd

Özçeri, Elif.

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Force Microscopy (AFM) techniques, respectively. The thickness and columnar structure of the films were

Structural, compositional and mechanical characterization of plasma nitrided CoCrMo alloy

Okur, Serdal.

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microscopy (SEM), atomic force microscopy (AFM), and glow discharge optical emission spectroscopy (GDOES

10.

Structural And Magnetic Properties os Si(100)/Ta/Co Multilayers For Spintronics Applications

Vahaplar, Kadir

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been studied by X-Ray Diffractometer (XRD), Atomic Force Microscopy (AFM) and Scanning Electron

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