7 sonuç bulundu Arama sonuçlarına abone ol
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Yazdır
by 
Kalkan, Sırrı Batuhan, author.
Format: 
El Yazması
Alıntı: 
passivated with thin SiO2 film grown by Thermal Evaporation and Pulsed Electron Deposition (PED) techniques
by 
Akça, Fatime Gülşah, author.
Format: 
El Yazması
Alıntı: 
films were determined by scanning electron microscopy (SEM). Electrical properties were measured by van
by 
Tozan, Şerife.
Format: 
El Yazması
Alıntı: 
problem by chaning distance between target and substrate, and laser power. Furthermore Electron Dispersive
by 
Ulucan, Savaş.
Format: 
El Yazması
Alıntı: 
were taken.Electron Dispersive X-Ray Spectroscopy (EDX) technique was used to identify the chemical
by 
Aksak, Meral.
Format: 
El Yazması
Alıntı: 
studied systematically by utilizing Fe and Co catalyst thin films and with the help of Raman spectroscopy
by 
Okur, Serdal.
Format: 
El Yazması
Alıntı: 
characterization of the plasma nitrided layers were investigated by X-ray diffraction (XRD), scanning electron
by 
Ekmekçioğlu, Merve, author.
Format: 
El Yazması
Alıntı: 
spectroscopy (EDS), scanning electron microscopy (SEM), Xray diffraction (XRD) and Raman spectroscopy.
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7 sonuç bulundu Arama sonuçlarına abone ol
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