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Günel, Hacı Yusuf.
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Alıntı:
, LaAlO3 and SrTiO3 substrates were first characterized structurally via x-ray diffraction and scanning
by
Tozan, Şerife.
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Alıntı:
) and x-ray diffraction measurements.Finally, our results were compared to literature and explanied
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by
Algül, Berrin Pınar.
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Alıntı:
Diffraction.Prepared thin film samples were patterned as bicrystal grain boundary Josephson junctions by standard
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