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Applied Scanning Probe Methods IV Industrial Applications

Bhushan, Bharat. editor.

http://dx.doi.org/10.1007/b138289

Format:

Elektronik Kaynak

Alıntı:

NanoScience and Technology,

Applied Scanning Probe Methods VII Biomimetics and Industrial Applications

Bhushan, Bharat. editor.

http://dx.doi.org/10.1007/11785705

Format:

Elektronik Kaynak

Alıntı:

NanoScience and Technology,

Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques

Bhushan, Bharat. editor.

http://dx.doi.org/10.1007/978-3-540-37316-2

Format:

Elektronik Kaynak

Alıntı:

NanoScience and Technology,

Applied Scanning Probe Methods III Characterization

Bhushan, Bharat. editor.

http://dx.doi.org/10.1007/b138285

Format:

Elektronik Kaynak

Alıntı:

NanoScience and Technology,

Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques

Bhushan, Bharat. editor.

http://dx.doi.org/10.1007/b139097

Format:

Elektronik Kaynak

Alıntı:

NanoScience and Technology,

Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques

Bhushan, Bharat. editor.

http://dx.doi.org/10.1007/978-3-540-74080-3

Format:

Elektronik Kaynak

Alıntı:

Microscopy for Sub-50-nm Microelectronics Technology Nodes -- Near Field Probes: From Optical Fibers to

Applied Scanning Probe Methods X Biomimetics and Industrial Applications

Bhushan, Bharat. editor.

http://dx.doi.org/10.1007/978-3-540-74085-8

Format:

Elektronik Kaynak

Alıntı:

Charges Stored in Condensed Matter and Its Application to Memory Technology -- Applications of Scanning

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